IP Library Granted Patent US 7,826,196
Granted Patent B2
US 7,826,196 · App. 12/161,901 · Granted Nov 2, 2010

Ceramic laminated device and method for manufacturing same

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Quick Facts
Patent No.
US 7,826,196
App. No.
12/161,901
Granted
Nov 2, 2010
Kind
B2
Abstract

The present invention relates to a ceramic laminated device including a dielectric ceramic and an Ag electrode. In a dielectric ceramic that can be sintered at low temperatures and has a high dielectric constant and Q value, reactivity between the ceramic and Ag during sintering is suppressed low and segregation of specific elements in the proximity of the electrode is controlled. Thus, a filter having a high Q value and low loss is produced stably. For this purpose, in a ceramic laminated body including at least a ceramic and a Si-containing glass, a ratio of A/B, i.e. a ratio of a Si element concentration (A) within a range at a distance of 5 μm or smaller from the Ag electrode to a Si element concentration (B) within a range at a distance larger than 5 μm from the Ag electrode, is set equal to or smaller than 2.

Claims (17)

1. A ceramic laminated device made by sintering a ceramic laminated body including at least a ceramic and a Si-containing glass, the ceramic laminated device comprising:

an internal electrode including Ag,

wherein a ratio of A/B, i.e. a ratio of a Si element concentration (A) within a range at a distance of 5 μm or smaller from the internal electrode to a Si element concentration (B) within a range at a distance larger than 5 μm from the internal electrode, is equal to or smaller than 2.

2. The ceramic laminated device of claim 1 , wherein at least one layer of the internal electrode having a thickness equal to or larger than 15 μm after sintering is included therein.

3. The ceramic laminated device of claim 2 , wherein at least one layer of the internal electrode having a thickness equal to or smaller than 10 μm after sintering is included therein.

4. The ceramic laminated device of claim 1 , wherein ZnO is included in the glass.

5. The ceramic laminated device of claim 1 , wherein the glass is Si-alkali earth metal-La—O-based.

6. The ceramic laminated device of claim 1 , wherein the ceramic includes Ba, a rare-earth element, Ti, Bi, and O.

7. A method for manufacturing the ceramic laminated device of claim 1 , wherein an oxygen concentration during sintering of the ceramic laminated device is equal to or smaller than 10 vol %.

8. A ceramic laminated device made by sintering a ceramic laminated body including at least a ceramic, a Si-containing glass, and ZnO, the ceramic laminated device comprising:

an internal electrode including Ag,

wherein a ratio of C/D, i.e. a ratio of a Zn element concentration (C) within a range at a distance of 5 μm or smaller from the internal electrode to a Zn element concentration (D) within a range at a distance larger than 5 μm from the internal electrode, is equal to or smaller than 4.

9. The ceramic laminated device of claim 8 , wherein at least one layer of the internal electrode having a thickness equal to or larger than 15 μm after sintering is included therein.

10. The ceramic laminated device of claim 8 , wherein ZnO is included in the glass.

11. The ceramic laminated device of claim 8 , wherein the glass is Si-alkali earth metal-La—O-based.

12. The ceramic laminated device of claim 8 , wherein the ceramic includes Ba, a rare-earth element, Ti, Bi, and O.

13. A method for manufacturing the ceramic laminated device of claim 8 , wherein an oxygen concentration during sintering of the ceramic laminated device is equal to or smaller than 10 vol %.

Assignments (2)
CHANGE OF NAME Recorded Mar 6, 2009
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 022363/0306 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2008
From: SAITO, RYUICHI; SHIGENO, KOICHI; KAGATA, HIROSHI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 021551/0323 →