IP Library Granted Patent US 7,672,350
Granted Patent B2
US 7,672,350 · App. 12/164,923 · Granted Mar 2, 2010

Method and device for using optical feedback to overcome bandwidth limitations caused by relaxation oscillation in vertical cavity surface emitting lasers (VCSELs)

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Quick Facts
Patent No.
US 7,672,350
App. No.
12/164,923
Granted
Mar 2, 2010
Kind
B2
Abstract

A semiconductor device is provided that includes an optical feedback structure that is monolithically integrated with a VCSEL device and which extends the speed of the VCSEL device beyond the speed to which it would otherwise be limited due to relaxation oscillation. The optical feedback structure does not rely on light emissions from the VCSEL substrate material to produce optical feedback. Consequently, extension of the bandwidth of the semiconductor device through the use of optical feedback is not limited by the absorption threshold wavelength of the substrate material. Furthermore, because the optical feedback structure does not include the substrate, the ability to use optical feedback to extend the bandwidth of the device is independent of the precision with which the substrate thickness can be controlled.

Claims (34)

1. A semiconductor device comprising:

a vertical cavity surface emitting laser (VCSEL) device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having a maximum modulation bandwidth; and

an optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the optical feedback structure is between the substrate and the VCSEL device such that the first DBR is adjacent the optical spacer and the third DBR is adjacent the substrate, and wherein at least a portion of the light that passes through the first DBR into the optical spacer is encountered by the third DBR, the third DBR reflecting substantially all of the light encountered thereby, and wherein the laser light emitted from the semiconductor device is light that passes through the second DBR moving in a direction away from the active channel.

2. The semiconductor device of claim 1 , wherein the optical feedback provided by the optical feedback structure to the VCSEL device creates optical cavity coupling between the active and passive cavities that operates to increase the maximum modulation bandwidth of the light emitted from the semiconductor device.

3. The semiconductor device of claim 2 , wherein the optical cavity coupling between the active and passive cavities causes the laser light emitted from the semiconductor device to have at least two light modes.

4. The semiconductor device of claim 3 , wherein the two light modes correspond to two respective resonant frequencies, the two respective resonant frequencies being separated by a frequency difference amount that is controlled at least in part by constructing the first DBR of a particular number of DBR pairs, the particular number of DBR pairs being pre-selected to achieve the frequency different amount.

5. The semiconductor device of claim 4 , wherein the one or more of the first, second and third DBRs are formed by an epitaxial growth process.

6. The semiconductor device of claim 4 , wherein one or more of the first, second and third DBRs are formed by a deposition process.

7. The semiconductor device of claim 1 , wherein the optical feedback provided by the optical feedback structure to the VCSEL device has a phase and amplitude that are controlled to cause a Fabrey-Perot (FP) resonant mode wavelength of the VCSEL device to be positively detuned relative to a reflectivity maximum wavelength of the VCSEL device by a selected amount, the detuning of the FP resonant mode wavelength operating to increase the maximum modulation bandwidth of the light emitted from the semiconductor device.

8. The semiconductor device of claim 7 , wherein the detuning amount is controlled at least in part by providing the optical spacer with a particular thickness, the particular thickness of the optical spacer being pre-selected to achieve the detuning amount.

9. The semiconductor device of claim 8 , wherein the optical spacer is formed by an epitaxial growth process.

10. A method for increasing an maximum modulation bandwidth of laser light emitted from a semiconductor device, the method comprising:

forming a vertical cavity surface emitting laser (VCSEL) device in a semiconductor device, the VCSEL device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having an maximum modulation bandwidth; and

forming an optical feedback structure in the semiconductor device, the optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the step of forming the optical feedback structure is performed before the step of forming the VCSEL device is performed such that the optical feedback structure is between the substrate and the VCSEL device, the first DBR being adjacent the optical spacer and the third DBR being adjacent the substrate, and wherein at least a portion of the light that passes through the first DBR into the optical spacer is encountered by the third DBR, the third DBR reflecting substantially all of the light encountered thereby, and wherein the laser light emitted from the semiconductor device is light that passes through the second DBR moving in a direction away from the active channel.

11. The method of claim 10 , wherein the optical feedback provided by the optical feedback structure to the VCSEL device creates optical cavity coupling between the active and passive cavities that operates to increase the maximum modulation bandwidth of the light emitted from the semiconductor device.

12. The method of claim 11 , wherein the optical cavity coupling between the active and passive cavities causes the laser light emitted from the semiconductor device to have at least two light modes.

13. The method of claim 12 , wherein the two light modes correspond to two respective resonant frequencies, the two respective resonant frequencies being separated by a frequency difference amount that is controlled at least in part by constructing the first DBR of a particular number of DBR pairs, the particular number of DBR pairs being pre-selected to achieve the frequency different amount.

14. The method of claim 13 , wherein the one or more of the first, second and third DBRs are formed by an epitaxial growth process.

15. The method of claim 13 , wherein one or more of the first, second and third DBRs are formed by a deposition process.

16. The method of claim 10 , wherein the optical feedback provided by the optical feedback structure to the VCSEL device has a phase and amplitude that are controlled to cause a Fabrey-Perot (FP) resonant mode wavelength of the VCSEL device to be positively detuned by a selected amount relative to a reflectivity maximum wavelength of the VCSEL device, the detuning of the FP resonant mode wavelength operating to increase the maximum modulation bandwidth of the light emitted from the semiconductor device.

17. The method of claim 16 , wherein the detuning amount is controlled at least in part by providing the optical spacer with a particular thickness, the particular thickness of the optical spacer being pre-selected to achieve the detuning amount.

18. The method of claim 17 , wherein the optical spacer is formed by an epitaxial growth process.

19. A semiconductor device comprising:

a vertical cavity surface emitting laser (VCSEL) device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having a maximum modulation bandwidth; and

an optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the VCSEL device is between the optical feedback structure and the substrate such that the second DBR is adjacent the substrate and the first DBR is adjacent the optical spacer, and wherein at least a portion of the light that passes through the first DBR into the optical spacer is encountered by the third DBR, the third DBR passing at least a portion of the light encountered thereby and reflecting at least a portion of the light encountered thereby, and wherein the laser light emitted from the semiconductor device is light that passes through the third DBR moving in a direction away from the passive channel.

20. A semiconductor device comprising:

a vertical cavity surface emitting laser (VCSEL) device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having a maximum modulation bandwidth; and

an optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the optical feedback provided by the optical feedback structure to the VCSEL device creates optical cavity coupling between the active and passive cavities that operates to increase the maximum modulation bandwidth of the light emitted from the semiconductor device, and wherein the optical cavity coupling between the active and passive cavities causes the laser light emitted from the semiconductor device to have at least two light modes.

21. A method for increasing an maximum modulation bandwidth of laser light emitted from a semiconductor device, the method comprising:

forming a vertical cavity surface emitting laser (VCSEL) device in a semiconductor device, the VCSEL device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having an maximum modulation bandwidth; and

forming an optical feedback structure in the semiconductor device, the optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the step of forming the optical feedback structure is performed after the step of forming the VCSEL device is performed such that the VCSEL device is between the optical feedback structure and the substrate, the second DBR being adjacent the substrate and the first DBR being adjacent the optical spacer, and wherein at least a portion of the light that passes through the first DBR into the optical spacer is encountered by the third DBR, the third DBR passing at least a portion of the light encountered thereby and reflecting at least a portion of the light encountered thereby, and wherein the laser light emitted from the semiconductor device is light that passes through the third DBR moving in a direction away from the passive channel.

22. A method for increasing an maximum modulation bandwidth of laser light emitted from a semiconductor device, the method comprising:

forming a vertical cavity surface emitting laser (VCSEL) device in a semiconductor device, the VCSEL device comprising at least a first distributed Bragg reflector (DBR), a second DBR, a multi-quantum well (MQW) and current confinement region, and a substrate, the MQW and current confinement region being between the first and second DBRs and providing an active cavity in the semiconductor device in which electrons are converted into photons to produce light, at least some of the light produced in the active cavity being emitted as laser light from the semiconductor device, the laser light emitted from the semiconductor device having an maximum modulation bandwidth; and

forming an optical feedback structure in the semiconductor device, the optical feedback structure comprising at least a third DBR and an optical spacer, the optical spacer being between the first DBR and the third DBR, the optical spacer providing a passive cavity in the semiconductor device, and wherein at least some of the light that is produced in the active cavity passes through the first DBR into the optical spacer of the optical feedback structure, the optical feedback structure providing optical feedback to the VCSEL device that results in an increase in the maximum modulation bandwidth of the light emitted from the semiconductor device, wherein the optical feedback provided by the optical feedback structure to the VCSEL device creates optical cavity coupling between the active and passive cavities that operates to increase the maximum modulation bandwidth of the light emitted from the semiconductor device, and wherein the optical cavity coupling between the active and passive cavities causes the laser light emitted from the semiconductor device to have at least two light modes.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2020
From: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
To: BROADCOM INTERNATIONAL PTE. LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED AT REEL: 047195 FRAME: 0827. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Nov 5, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047924/0571 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
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PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
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To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
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PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
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MERGER Recorded May 7, 2013
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To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
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