Testing device for performing a test on a liquid crystal display and a method of driving the testing device
A testing device for performing a high-voltage test on a liquid crystal display is provided. The testing device includes a voltage converting unit, an input connector, and a power supplier. The voltage converting unit includes a plurality of resistors between an output terminal and a ground terminal. The input connector includes a terminal connected to one node of the plurality of resistors. The power supplier includes a switching unit to output a ground voltage to the terminal when power is applied from an external power source.
1. A testing device for generating a high voltage stress test on a liquid crystal display (LCD), the testing device comprising:
a voltage converting unit including a plurality of resistors between an output terminal and a ground terminal;
an input connector including an input terminal, wherein one end of the input terminal is connected to one node of the plurality of resistors; and
a power supplier including a switching unit,
wherein the switching unit outputs a ground voltage to the input terminal when power is applied from an external power source, and then the output terminal of the voltage converting unit outputs a high-voltage stress (HVS) test on the LCD.
2. The testing device according to claim 1 , wherein the switching unit is an analog switch.
3. The testing device according to claim 1 , wherein the voltage converting unit is a DC/DC converter.
4. The testing device according to claim 1 , wherein the power supplier further comprises a supply connector configured to be connected to the external power source and for transferring the power from the external power source to the switching unit.
5. The testing device according to claim 1 , wherein the power supplier further comprises a contact connector configured to be connected to the input connector and for transferring the ground voltage through the terminal of the input connector to the node of the plurality of resistors.
6. The testing device according to claim 1 , wherein the plurality of resistors comprises a first resistor, a second resistor, and a third resistor, and the terminal is connected to a node between the second resistor and the third resistor.
7. The testing device according to claim 6 , wherein the first end of the first resistor is connected to the output terminal and the second end of the first resistor is connected to the first end of the second resistor, and wherein the first end of the third resistor is connected to the second end of the second resistor and the second end of the third resistor is connected to the ground terminal.
8. The testing device according to claim 7 , wherein the voltage converter applies a feedback voltage across a node between the first and second resisters.
9. The testing device according to claim 1 , wherein the input connector is a 40 pin connector.
10. The testing device according to claim 4 , wherein the supply connector is a 30 pin connector.
11. A liquid crystal display (LCD) comprising:
a LCD panel having a plurality of data and gate lines;
a data driver outputting a data signal to the data lines;
a gate driver outputting a gate signal to the gate lines;
a voltage converting unit supplying a gate-on and gate-off voltage to the gate driver and including a plurality of resistors between an output terminal and a ground terminal; and
an input connector including a terminal, wherein one end of the terminal is connected to one node of the plurality of resistors and the other end of the terminal is configured to receive a ground voltage from an external power source.
12. The LCD according to claim 11 , wherein the voltage converting unit is a DC/DC converter.
13. The LCD according to claim 11 , wherein the plurality of resistors comprises a first resistor, a second resistor, and a third resistor, and the terminal is connected to a node between the second resistor and the third resistor.
14. The LCD according to claim 13 , wherein the first end of the first resistor is connected to the output terminal and the second end of the first resistor is connected to the first end of the second resistor, and wherein the first end of the third resistor is connected to the second end of the second resistor and the second end of the third resistor is connected to the ground terminal.
15. The LCD according to claim 14 , wherein the voltage converter applies a feedback voltage across a node between the first and second resisters.
16. The LCD according to claim 11 , wherein the input connector is a 40 pin connector.
17. A method of driving a testing device to provide a high-voltage stress (HVS) test on a liquid crystal display (LCD), the method comprising:
inputting power to a switching unit of a power supplier, wherein the testing device further includes an input connector and a voltage converting unit;
outputting a ground voltage from the switching unit through an input terminal of the input connector to a node of a plurality of resistors of the voltage converting unit between an output terminal and a ground terminal; and
outputting a high-voltage from the output terminal of the voltage converting unit to perform the high-voltage stress (HVS) test on the LCD.
18. The method according to claim 17 , wherein the plurality of resistors comprises a first resistor, a second resistor, and a third resistor, and the terminal is connected to a node between the second resistor and the third resistor.
19. The method according to claim 18 , wherein the first end of the first resistor is connected to the output terminal and the second end of the first resistor is connected to the first end of the second resistor, and wherein the first end of the third resistor is connected to the second end of the second resistor and the second end of the third resistor is connected to the ground terminal.
20. The method according to claim 19 further comprises applying a feedback voltage in the voltage converter across a node between the first and second resisters.