Method for characterizing x-ray detector materials using a Raman microscope
View Patent ↗An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
1. A method for performing spectroscopy of a sample using a microspectrometer, wherein spectroscopy is performed across a desired analysis range of the sample and wherein a size of the desired analysis range exceeds at least one of a size and travel capability of a stage of the microspectrometer, the method comprising the step of:
controlling movement of a supplemental stage coupled to the microspectrometer to position an extended optical path of the microspectrometer over a point in the desired analysis range, wherein the sample is supported by the supplemental stage and wherein the movement of the sample enables spectral analysis of the sample at the point, including the step of extending an optical reach of the microspectrometer to provide the extended optical path by coupling an extender device to a microscope of the microspectrometer; and
controlling the microspectrometer to emit at least one laser pulse onto the point of the sample on the optical path and to perform spectral analysis of scatter wavelengths received in response to the laser pulse via the optical path.
2. The method of claim 1 wherein the step of controlling movement of the supplemental stage is performed in response to input at a user interface of the microspectrometer.
3. The method of claim 1 wherein the step of controlling movement of the supplemental stage is performed in response to manual movement of control logic associated with the stage, wherein a cable couples the control logic of the stage to the supplemental stage.
4. The method of claim 1 wherein the step of controlling movement of the supplemental stage controls movement of the stage in at least one of the x, y and z directions.
5. The method of claim 1 wherein the sample is an oversized sample having a size which exceeds the travel capabilities of the stage in at least one of an x or y dimension.
6. The method of claim 1 wherein the sample is a mammography panel.
7. The method of claim 1 further wherein the extender comprises a proximal orifice for transferring light between the microscope and the extended optical path and a distal orifice for transferring light between the optical path and the sample.
8. The method of claim 1 further including the steps of:
in response to spectral analysis indicating that the point comprises a defect, controlling the microspectrometer to irradiate the defect.
9. A method for repairing a defect in an oversized sample using a microspectrometer, wherein: the oversized sample exceeds a travel capability of a stage of the microspectrometer in at least one dimension, the oversized sample is positioned in a supplemental stage proximate to the microspectrometer and an optical reach of the microspectrometer is extended to dispose an extended optical path of the microspectrometer over the supplemental stage, the method including the step of:
extending the optical reach of the microspectrometer to provide the extended optical path by coupling an extender device to a microscope of the microspectrometer;
controlling movement of the supplemental stage to position the extended optical path of the microspectrometer over a defect in the sample; and
controlling the microspectrometer to irradiate the defect via the extended optical path.
10. The method of claim 9 wherein the step of controlling movement of the supplemental stage is performed in response to input at a user interface of the microspectrometer.
11. The method of claim 9 wherein the step of controlling movement of the supplemental stage is performed in response to manual movement of control logic associated with the stage, wherein a cable couples the control logic of the stage to the supplemental stage.
12. The method of claim 9 wherein the step of controlling movement of the supplemental stage controls movement of the stage in at least one of the x, y and z directions.
13. The method of claim 9 wherein the sample is a mammography panel.
14. The method of claim 9 wherein the extender comprises a proximal orifice for transferring light between the microscope and the extended optical path and a distal orifice for transferring light between the optical path and the sample.