IP Library Granted Patent US 7,786,723
Granted Patent B2
US 7,786,723 · App. 12/193,722 · Granted Aug 31, 2010

Test stage for a carrier having printhead integrated circuitry thereon

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,786,723
App. No.
12/193,722
Granted
Aug 31, 2010
Kind
B2
Abstract

This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carrier. A clamping mechanism is arranged on the fixture. The clamping mechanism has at least one clamp assembly for clamping the carrier to the test stage. A controller controls operation of the clamping mechanism.

Claims (15)

1. A tester system for testing operation of printhead integrated circuits, the tester system comprising:

(A) a plurality of printhead integrated circuits mounted on a carrier; and

(B) a test stage comprising:

a support structure;

a fixture arranged on the support structure and configured to receive and locate the carrier;

a clamping mechanism arranged on the fixture, the clamping mechanism having at least one clamp assembly, said carrier being releasably clamped to the test stage;

a controller for controlling operation of the clamping mechanism; and

a test probe assembly connected to said controller, said test probe assembly having a plurality of test probe contacts for connection with complementary contacts of said printhead integrated circuits,

wherein said test probe assembly provides diagnostic printhead test signals for testing said printhead integrated circuits.

2. The tester system of claim 1 , wherein the fixture includes a base member and dowel pins extending from the base member to facilitate location of the carrier on the fixture, the dowel pins shaped and dimensioned for being received in complementary apertures defined by the carrier.

3. The tester system of claim 2 , wherein the base member is elongate and the clamping mechanism includes two opposing clamp assemblies located on respective ends of the base member.

4. The tester system of claim 3 , wherein each clamp assembly includes a piston and cylinder arrangement mounted on the base member, and a clamp plate pivotally mounted on the base member to be pivoted into and out of a clamping position with the piston and cylinder arrangement.

5. The tester system of claim 4 , wherein each clamp plate defines a clamp finger configured to overlie the carrier when the clamp plate is pivoted into the clamping position.

6. The tester system of claim 4 , wherein each clamp assembly includes a pneumatic coupling for coupling the piston and cylinder arrangement to a pressurized gas supply in order to actuate the clamp assembly.

7. The tester system of claim 6 , in which the controller is in the form of a programmable logic controller (PLC) configured to control the pressurized gas supply and thus operation of the piston and cylinder arrangements.

Assignments (3)
CHANGE OF NAME Recorded Jun 25, 2014
From: ZAMTEC LIMITED
To: MEMJET TECHNOLOGY LIMITED
Reel/Frame 033244/0276 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2012
From: SILVERBROOK RESEARCH PTY. LIMITED AND CLAMATE PTY LIMITED
To: ZAMTEC LIMITED
Reel/Frame 028498/0912 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 19, 2008
From: BURKE, DAVID OLIVER; SLEIPEN, STEPHEN JOHN; WASZCZUK, JAN; THARION, JOSEPH
To: SILVERBROOK RESEARCH PTY LTD
Reel/Frame 021405/0225 →