INSPECTION SYSTEM AND METHOD
An inspection system is provided. The inspection system includes at least one source configured to emit a beam of radiation onto an object. The inspection system also includes at least two area detectors having different characteristics configured to receive a reflected beam of radiation from the object and output a plurality of image data streams corresponding to the different characteristics, wherein the at least two area detectors disposed in at least one of a cascaded arrangement or separated by a pre-determined distance along a direction parallel or perpendicular to a scan direction of the object.
1 . An inspection system, comprising:
at least one source configured to emit a beam of radiation onto an object; and
at least two area detectors having different characteristics configured to receive a transmitted beam of radiation from the object and output a plurality of image data streams corresponding to the different characteristics, the at least two area detectors disposed in at least one of a cascaded arrangement or separated by a predetermined distance along a direction parallel or perpendicular to a scan direction of the object.
2 . The inspection system of claim 1 , comprising a processing circuitry configured to:
receive the plurality of image data streams; and
overlay the image data streams to produce a perfectly registered image.
3 . The system of claim 1 , wherein the source comprises an X-ray source a gamma source, or a neutron source.
4 . The system of claim 1 , wherein the area detectors comprise a flat panel detector.
5 . The system of claim 1 , wherein the area detectors comprise at least one of silicon diode, a scintillator, a ceramic, crystal, or needle based scintillator, a photoconductor, or a combination thereof.
6 . The system of claim 5 , wherein the scintillator comprises glass, ceramic, crystalline or polycrystalline material.
7 . The system of claim 6 , wherein the crystalline material comprises a needle based crystalline material.
8 . The system of claim 7 , wherein the needle based crystalline material comprises cesium iodide.
9 . The system of claim 5 , wherein the photoconductor comprises cadmium telluride.
10 . The system of claim 1 , wherein the area detectors comprise an amorphous silicon detector.
11 . The system of claim 1 , wherein the different characteristics comprise an electronic gain, energy detection efficiency, particle type detection, or spatial resolution.
12 . The system of claim 1 , comprising at least one filter disposed before the at least two detectors, the at least one filter configured to allow radiation corresponding to a pre-determined wavelength range.
13 . The system of claim 1 , wherein the area detectors comprise neutron detectors or X-ray detectors.
14 . The system of claim 2 , wherein the processing circuitry employs a shift and add algorithm to overlay the image data streams.
15 . The imaging system of claim 1 , wherein the object comprises luggage, a human being, or a cargo container.
16 . A method for manufacturing an inspection system, comprising:
providing at least one source configured to emit a beam of radiation onto an object; and
providing at least two area detectors having different characteristics configured to receive a reflected beam of radiation from the object and output a plurality of image data streams corresponding to the different characteristics, the at least two area detectors disposed in at least one of a cascaded arrangement or separated by a pre-determined distance along a direction parallel or perpendicular to a scan direction of the object.
17 . The method of claim 16 , comprising providing a processing circuitry configured to:
receive the plurality of image data streams; and
overlay the image data streams to produce a perfectly registered image.
18 . The method of claim 16 , wherein providing the at least two area detectors comprises providing flat panel detectors.
19 . The method of claim 16 , wherein said providing the processing circuitry configured to overlay the image data streams comprises employing a shift and add algorithm.
20 . The method of claim 16 , wherein said providing the processing circuitry configured to overlay the image data streams comprises employing a dual energy technique to provide material identification.
21 . The method of claim 16 , wherein providing at least one source comprises providing an X-ray source or a gamma source.
22 . The method of claim 16 , comprising disposing at least one filter before the at least two area detectors, the at least one filter configured to allow radiation corresponding to a pre-determined wavelength range.
23 . An inspection system, comprising:
at least one source configured to emit a beam of radiation onto an object; and
at least two area detectors comprising at least one scintillator, the at least one scintillator comprising a thickness between about 0.1 mm to about 30 mm, the at least two area detectors having different characteristics configured to receive a transmitted beam of radiation from the object and output a plurality of image data streams corresponding to the different characteristics, the at least two area detectors disposed in at least one of a cascaded arrangement or separated by a pre-determined distance along a direction parallel or perpendicular to a scan direction of the object.
24 . The system of claim 23 , wherein the scintillator comprises cesium iodide deposited on a read out device.
25 . The system of claim 24 , wherein the read out device comprises an amorphous silicon diode photodiode.