IP Library Granted Patent US 7,981,717
Granted Patent B2
US 7,981,717 · App. 12/204,668 · Granted Jul 19, 2011

Image sensor and method of manufacturing the same

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Quick Facts
Patent No.
US 7,981,717
App. No.
12/204,668
Granted
Jul 19, 2011
Kind
B2
Abstract

An image sensor includes a pixel array including a photodiode, a peripheral region including a logic circuit, and an isolation region formed between the pixel array and the peripheral region and formed under the peripheral region to electrically isolate the pixel array from the peripheral region.

Claims (38)

1. A method of manufacturing an image sensor comprised of a pixel array region, a first isolation region, a second isolation region, and a peripheral region, the method comprising:

forming a pixel array within the pixel array region;

forming the first isolation region under the peripheral region and between the pixel array and the peripheral region to electrically isolate the pixel array from the peripheral region;

forming the second isolation region on a partial upper side of the first isolation region to electrically isolate the pixel array from the peripheral region; and

forming a logic circuit within the peripheral region,

wherein the forming the pixel array comprises:

forming a red photodiode on a sub-epitaxial layer of a first conductivity by performing implantation of ions of a second conductivity;

forming a first epitaxial layer of the first conductivity on the red photodiode;

forming a first plug in a portion of the first epitaxial layer by performing implantation of ions of the second conductivity so as to be electrically connected to the red photodiode; and

forming a green photodiode on the first epitaxial layer by performing implantation of ions of the second conductivity.

2. The method of claim 1 , wherein the forming of the first isolation region is performed together with the forming of the red photodiode, the first plug, or the green photodiode.

3. The method of claim 1 , further comprising:

forming a second epitaxial layer on the first epitaxial layer having the green photodiode formed thereon;

forming a second plug in a portion of the second epitaxial layer by performing implantation of ions of the second conductivity so as to be electrically connected with the first plug; and

forming a blue photodiode on the second epitaxial layer having the second plug formed thereon by performing implantation of ions of the second conductivity.

4. The method of claim 3 , wherein the forming of the second plug is performed together with the forming of the second isolation region.

5. A method of manufacturing an image sensor comprised of a pixel array region, an isolation region, and a peripheral region, the method comprising:

forming a pixel array within the pixel array region;

forming a first isolation region to be electrically isolated from the pixel array within the isolation region and the peripheral region;

forming a second isolation region on a partial upper side of the first isolation region; and

forming a logic circuit within the peripheral region,

wherein the forming of the first isolation region comprises:

forming a red isolation region on a sub-epitaxial layer of a first conductivity by performing implantation of ions of a second conductivity;

forming an epitaxial layer of the first conductivity on the red isolation region; and

forming a first plug isolation region on the epitaxial layer by performing implantation of ions of the second conductivity, and

wherein the forming the second isolation region comprises:

forming a green isolation region in a portion of the first plug isolation region by performing implantation of ions of the second conductivity.

6. The method of claim 5 , wherein the forming the pixel array comprises:

forming a red photodiode on a sub-epitaxial layer of a first conductivity by performing implantation of ions of a second conductivity;

forming a first epitaxial layer of the first conductivity on the red photodiode;

forming a first plug in a portion of the first epitaxial layer by performing implantation of ions of the second conductivity so as to be electrically connected to the red photodiode; and

forming a green photodiode on the first epitaxial layer by performing implantation of ions of the second conductivity.

7. The method of claim 6 , wherein the forming of the first isolation region is performed together with the forming of the red photodiode, the first plug, or the green photodiode.

8. The method of claim 6 , further comprising:

forming a second epitaxial layer on the first epitaxial layer having the green photodiode formed thereon;

forming a second plug in a portion of the second epitaxial layer by performing implantation of ions of the second conductivity so as to be electrically connected with the first plug; and

forming a blue photodiode on the second epitaxial layer having the second plug formed thereon by performing implantation of ions of the second conductivity.

9. The method of claim 8 , wherein the forming the second plug is performed together with the forming the second isolation region.

Assignments (2)
CHANGE OF NAME Recorded Nov 30, 2017
From: DONGBU HITEK CO., LTD.
To: DB HITEK CO., LTD.
Reel/Frame 044559/0819 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2008
From: LIM, SU
To: DONGBU HITEK CO., LTD.
Reel/Frame 021484/0177 →