Enhanced sample processing devices, systems and methods
Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.
1. A method of processing sample material comprising:
providing a device comprising a process chamber array, wherein the process chamber array comprises a first chamber and a second chamber;
providing sample material in the process chamber array;
moving the sample material within the process chamber array by rotating the device;
providing paramagnetic particles within the sample material located in the process chamber array;
locating a magnet proximate the device; and
rotating the device such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating.
2. The method of claim 1 , wherein the device comprises a plurality of the process chamber arrays.
3. The method of claim 1 , wherein the rotating comprises rotating the device at varying speeds that comprise at least two cycles of acceleration and deceleration.
4. The method of claim 1 , wherein the paramagnetic particles move within the process chamber array while the device is rotating.
5. The method of claim 1 , wherein the rotating comprises rotating the device through at least two cycles of acceleration and deceleration, and wherein the paramagnetic particles move within the process chamber array while the device is rotating.
6. The method of claim 1 , wherein the paramagnetic particles within the sample material in the process chamber array are subjected to forces pulling opposite directions intermittently.
7. The method of claim 1 , wherein rotating the device comprises rotating the device about an axis of rotation, wherein the magnet is located between the paramagnetic particles and the axis of rotation.
8. The method of claim 7 , wherein the axis of rotation passes through the device.
9. The method of claim 7 , wherein the rotating comprises rotating the device through at least two cycles of acceleration and deceleration.
10. The method of claim 1 , wherein the magnet does not rotate with the device when the device is rotating.
11. The method of claim 1 , wherein the sample material in the process chamber array comprises residual reaction materials, and wherein the method further comprises using the paramagnetic particles to remove the residual reaction materials from the sample material in the process chamber array.
12. The method of claim 1 , wherein the paramagnetic particles are located in the process chamber array before the sample material is provided in the process chamber array.
13. The method of claim 1 , further comprising thermal processing of the sample material in the process chamber array by controlling the temperature of the sample material in the process chamber array.
14. The method of claim 13 , wherein the controlling comprises thermally cycling the sample material in the process chamber array.
15. The method of claim 13 , wherein the thermal processing is performed while the device is rotating.
16. A method of processing sample material comprising:
providing a device comprising a process chamber array that comprises a first chamber and a second chamber;
providing sample material in the process chamber array;
providing paramagnetic particles within the sample material located in the process chamber array;
locating a magnet proximate the device; and
rotating the device about an axis of rotation such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating, wherein the rotating comprises varying the speed of rotation such that the device is rotated through at least two cycles of acceleration and deceleration;
wherein the magnet is located between the paramagnetic particles and the axis of rotation; and
wherein the paramagnetic particles within the sample material in the at least one process chamber array are subjected to forces pulling in opposite directions intermittently.
17. The method of claim 16 , wherein the axis of rotation passes through the device.
18. The method of claim 16 , wherein the magnet does not rotate with the device when the device is rotating.
19. The method of claim 16 , further comprising thermal processing of the sample material in the process chamber array by controlling the temperature of the sample material in the process chamber array.
20. The method of claim 19 , wherein the controlling comprises thermally cycling the sample material in the process chamber array.
21. The method of claim 19 , wherein the thermal processing is performed while the device is rotating.
22. The method of claim 16 , wherein the sample material in the process chamber array comprises residual reaction materials, and wherein the method further comprises using the paramagnetic particles to remove the residual reaction materials from the sample material in the process chamber array.
23. The method of claim 16 , wherein the paramagnetic particles are located in the process chamber array before the sample material is provided in the process chamber array.
24. The method of claim 16 , wherein the device comprises a plurality of process chamber arrays, and wherein the method further comprises providing sample material in two or more process chamber arrays of the plurality of process chamber arrays.
25. A method of processing sample material comprising:
providing a device comprising a process chamber array that comprises a first chamber and a second chamber;
providing sample material in the process chamber array;
thermal processing of the sample material in the process chamber array by controlling the temperature of the sample material in the process chamber array;
moving the sample material within the process chamber array by rotating the device;
providing paramagnetic particles within the sample material located in the process chamber array;
locating a magnet proximate the device; and
rotating the device about an axis of rotation;
wherein the paramagnetic particles within the sample material in the process chamber array are intermittently subjected to the magnetic field of the magnet during the rotating;
wherein the rotating comprises varying the speed of rotation such that the device is rotated through at least two cycles of acceleration and deceleration;
wherein the magnet does not rotate with the device when the device is rotating; and
wherein the magnet is located between the paramagnetic particles and the axis of rotation.