IP Library Granted Patent US 8,026,964
Granted Patent B2
US 8,026,964 · App. 12/216,573 · Granted Sep 27, 2011

Method and apparatus for correcting defective imager pixels

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Quick Facts
Patent No.
US 8,026,964
App. No.
12/216,573
Granted
Sep 27, 2011
Kind
B2
Abstract

A method and apparatus for correcting defective pixel signals, wherein pixel signals are corrected in accordance with correction information associated with operating conditions under which an image is acquired. A method for acquiring and storing correction information in an imager device is also provided.

Claims (31)

1. A method of operating an imager device comprising:

with a plurality of pixels, capturing an image using an exposure condition;

with the plurality of pixels, generating corresponding pixel signals;

with a correction control circuit, receiving the pixel signals, pixel address signals associated with the plurality of pixels, and the exposure condition;

with the correction control circuit, retrieving pixel correction information from memory, wherein the pixel correction information includes entries for each of the plurality of pixels, each entry including (1) a pixel address, (2) a condition selected from the group consisting of: a never repair condition, a conditional repair condition, and an always repair condition, and (3) a correction scheme;

with the correction control circuit, determining how to correct each pixel using the pixel address for that pixel and the corresponding entry in the pixel correction information;

in response to determining with the correction control circuit that the entry in the pixel correction information for a given pixel corresponds to the never repair condition, leaving the given pixel unrepaired by a pixel correction processor;

in response to determining with the correction control circuit that the entry in the pixel correction information for the given pixel corresponds to the always repair condition, repairing the given pixel using the pixel correction processor and the correction scheme for that entry in the pixel correction information, wherein repairing the given pixel with the pixel correction processor using the correction scheme for that entry comprises performing correction actions that depend on the exposure condition; and

in response to determining with the correction control circuit that the entry in the pixel correction information for the given pixel corresponds to the conditional repair condition, repairing the given pixel with the pixel correction processor using the correction scheme for that entry to produce a corrected pixel signal, wherein repairing the given pixel with the pixel correction processor using the correction scheme for that entry comprises performing correction actions that depend on the exposure condition.

2. The method defined in claim 1 , wherein the exposure condition is an operating condition selected from the group consisting of:

a level of lumination;

a level of temperature; and

an integration time.

3. The method defined in claim 1 , wherein the exposure condition comprises a level of gain applied to the pixel signal.

4. The method defined in claim 1 , further comprising:

determining exposure conditions under which the plurality of pixels produce defective signals.

5. The method defined in claim 1 , further comprising:

testing the plurality of pixels under a plurality of exposure conditions; and

under each of the exposure conditions tested, identifying which of the plurality of pixels produce defective signals.

6. The method defined in claim 5 , further comprising:

under each of the exposure conditions tested, identifying which of the plurality of pixels is part of a defective cluster.

7. The method defined in claim 1 , further comprising:

testing the plurality of pixels under a plurality of exposure conditions; and

under each of the exposure conditions tested, identifying which of the plurality of pixels is part of a defective cluster.

8. The method defined in claim 1 , wherein the memory comprises programmable memory.

9. The method defined in claim 1 , wherein the memory comprises a non-volatile storage device.

10. The method defined in claim 9 , wherein the non-volatile storage devices comprises at least one of a fuse bank and a flash drive.

11. The method defined in claim 1 , wherein the imager device is part of an imaging system.

12. The method defined in claim 11 , wherein the imaging system is a camera system.

13. The method defined in claim 1 , wherein the pixels signals received by the correction control circuit comprise digital signals.

14. The method defined in claim 1 , wherein the pixels signals received by the correction control circuit comprise analog signals.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 023245/0186 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2008
From: WALTER, NATHAN; DATAR, SACHIN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 021251/0803 →