IP Library Granted Patent US 7,732,783
Granted Patent B2
US 7,732,783 · App. 12/219,185 · Granted Jun 8, 2010

Ultraviolet light monitoring system

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Quick Facts
Patent No.
US 7,732,783
App. No.
12/219,185
Granted
Jun 8, 2010
Kind
B2
Abstract

An ultraviolet light monitoring system includes first and second electrodes, an evaluation subject film and a power source. The first and second electrodes are opposingly disposed and attract holes which are generated in accordance with irradiation of ultraviolet light. The evaluation subject film is formed in a vicinity of the first and second electrodes, and is a subject of evaluation of damage caused by the irradiation of ultraviolet light. The power source, at times of monitoring of the ultraviolet light, applies a predetermined bias to a series path formed by the first electrode, a gap between the first and second electrodes, and the second electrode.

Claims (16)

1. An ultraviolet light monitoring system comprising:

first and second electrodes that are opposingly disposed and that attract holes which are generated in accordance with irradiation of ultraviolet light;

an evaluation subject film that is formed in a vicinity of the first and second electrodes and that is a subject of evaluation of damage caused by the irradiation of the ultraviolet light; and

a power source that, at a time of monitoring of the ultraviolet light, applies a predetermined bias to a series path formed by the first electrode, a gap between the first and second electrodes, and the second electrode.

2. The ultraviolet light monitoring system of claim 1 , wherein the first and second electrodes are formed by square conductive films disposed in parallel.

3. The ultraviolet light monitoring system of claim 2 , wherein the evaluation subject film is formed on the first and second electrodes and is irradiated with the ultraviolet light.

4. The ultraviolet light monitoring system of claim 3 , wherein the ultraviolet light is emitted by plasma processing.

5. The ultraviolet light monitoring system of claim 2 , wherein the evaluation subject film is disposed in the gap between the first and second electrodes, is formed to a height the same as a surface of the first and second electrodes, and is irradiated with the ultraviolet light, and

a protective film is formed on the first and second electrodes.

6. The ultraviolet light monitoring system of claim 2 , wherein the ultraviolet light is emitted by plasma processing.

7. The ultraviolet light monitoring system of claim 1 , wherein the first and second electrodes are formed by comb shape conductive films disposed so as to mesh with one another.

8. The ultraviolet light monitoring system of claim 7 , wherein the evaluation subject film is formed on the first and second electrodes and is irradiated with the ultraviolet light.

9. The ultraviolet light monitoring system of claim 7 , wherein the evaluation subject film is disposed in the gap between the first and second electrodes, is formed to a height the same as a surface of the first and second electrodes, and is irradiated with the ultraviolet light, and

a protective film is formed on the first and second electrodes.

10. The ultraviolet light monitoring system of claim 7 , wherein the ultraviolet light is emitted by plasma processing.

11. The ultraviolet light monitoring system of claim 1 , wherein the ultraviolet light is emitted by plasma processing.

Assignments (3)
CHANGE OF NAME Recorded Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →
CHANGE OF NAME Recorded Jan 29, 2009
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022231/0935 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2008
From: HASHIMOTO, JUN; KAWADA, SHINJI; KURACHI, IKUO; SAMUKAWA, SEIJI
To: OKI ELECTRIC INDUSTRY CO., LTD.; TOHOKU UNIVERSITY
Reel/Frame 021293/0423 →