IP Library Granted Patent US 7,609,803
Granted Patent B2
US 7,609,803 · App. 12/244,259 · Granted Oct 27, 2009

Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus

Assignees: Kabushiki Kaisha Toshiba; Toshiba Medical Systems Corporation
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Quick Facts
Patent No.
US 7,609,803
App. No.
12/244,259
Granted
Oct 27, 2009
Kind
B2
Abstract

A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.

Claims (30)

1. A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method comprising:

irradiating a subject with X-rays; and

configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject,

on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.

2. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein a transmission path of the X-rays passing through the subject is determined.

3. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein the path length is calculated in the calculation of the intensity of the scattered ray.

4. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein intensity of a component scattered once of the scattered ray is calculated assuming uniformity of a sectional structure of the subject.

5. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein intensity of a component scattered once of the scattered ray in a direction of the path length is integrated.

6. The method for estimating the scattered ray intensity distribution according to claim 5 , wherein intensity of the component integrated is calculated for all of the path lengths is calculated.

7. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein the intensity of the scattered ray is calculated under approximation of the subject to water.

8. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein the X-ray absorption coefficient is an X-ray absorption coefficient for water.

9. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein the X-ray scattering probability is an X-ray scattering probability for water.

10. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein a shape of the subject is reconfigured from a projection data including the scattered ray, and a path length in the subject is achieved from the shape.

11. The method for estimating the scattered ray intensity distribution according to claim 1 , wherein the scattered ray is produced by irradiating the subject with X-rays generated from any of the plurality of X-ray generation sections.

12. An X-ray CT apparatus comprising:

a first X-ray generation section configured to generate X-rays;

an X-ray detection section configured to detect the X-rays passing through a subject;

an image reconfiguration section configured to configure a cross-sectional image of the subject on the basis of results detected by the X-ray detection section; and

a scattered ray calculation section configured to estimate a scattered ray intensity distribution of the X-rays in the subject,

the scattered ray calculation section estimating the scattered ray intensity distribution by calculating the intensity of the scattered ray on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, and

the image reconfiguration section reconfiguring the cross-sectional image by correcting the results detected by the X-ray detection section using the scattered ray intensity distribution estimated by the scattered ray calculation section.

13. The X-ray CT apparatus according to claim 12 , wherein the scattered ray calculation section calculates intensity of a component scattered once of the scattered ray assuming uniformity of a sectional structure of the subject.

14. The X-ray CT apparatus according to claim 12 , wherein the scattered ray calculation section calculates the path length.

15. The X-ray CT apparatus according to claim 12 , further comprising: a second X-ray generation section radiating X-rays,

the scattered ray being produced by irradiating the subject with X-rays generated from the second X-ray generation section.

16. The X-ray CT apparatus according to claim 12 , wherein the X-ray detection section detects the X-rays generated from the first X-ray generation section to pass through the subject, and the scattered ray.

17. The X-ray CT apparatus according to claim 12 , wherein the image reconfiguration section configures the cross-sectional image of the subject by reconfiguring a projection data achieved by rotating the first X-ray generation section around the subject.

18. The X-ray CT apparatus according to claim 12 , wherein the scattered ray calculation section calculates the intensity of the scattered ray under approximation of the subject to water.

19. The X-ray CT apparatus according to claim 12 , wherein the scattered ray calculation section calculates the intensity of the scattered ray using an X-ray absorption coefficient for water as the X-ray absorption coefficient.

20. The X-ray CT apparatus according to claim 12 , wherein the scattered ray calculation section calculates the intensity of the scattered ray using a scattering probability for water as the scattering probability.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 038595/0569 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2008
From: OKAMOTO, YOSUKE; AKINO, NARUOMI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 022015/0878 →
Priority Claims (1)
JP 2007-258987 · Oct 2, 2007 · national
Continuity (1)
Related Publication 20090092222A1 · Apr 9, 2009