Digital imaging of marking materials by thermally induced pattern-wise transfer
View Patent ↗An imaging system including an image receiving structure including a material layer having a tunable energy transfer characteristic; and an energy source to emit an energy beam at the material having the tunable energy transfer characteristic such that marking material is pattern-wise transferred to the image receiving structure. An imaging system includes an image receiving structure disposed to be in direct contact with marking material; and an energy source to emit a pattern-wise modulated energy beam at a region of the image receiving structure contacting the marking material to pattern-wise transfer marking material to the image receiving structure.
1. An imaging system, comprising:
an image receiving structure including a material having a tunable energy transfer characteristic configured to pattern-wise mask a transmission of energy from the energy source to the marking material;
an energy source to emit an energy beam at the material having the tunable energy transfer characteristic such that marking material is pattern-wise transferred to a surface of the image receiving structure; and
a second energy source to emit an energy beam at the image receiving structure, the second energy source selected to pattern-wise tune the energy transfer characteristic of the marking material.
2. The imaging system of claim 1 , further comprising:
a donor structure to receive a layer of marking material;
wherein the image receiving structure further comprises:
a first layer including the material having the tunable energy transfer characteristic; and
a second layer disposed between the first layer and the donor structure.
3. The imaging system of claim 1 , wherein the image receiving structure comprises a layer including a siloxane material.
4. The imaging system of claim 1 , wherein the material having a tunable energy transfer characteristic includes a bi-stable phase change material.
5. The imaging system of claim 1 , wherein the tunable energy transfer characteristic of the material is defined by a tunable transmittance, the material including at least one of a thermochromic material and a photochromic material.
6. The imaging system of claim 1 , wherein:
the material having the tunable energy transfer characteristic has a first transmittance in a first state and a second transmittance in a second state; and
the first transmittance is less than the second transmittance.
7. The imaging system of claim 1 , wherein:
the material having the tunable energy transfer characteristic has a first absorbance and a first reflectance in a first state and a second absorbance and a second reflectance in a second state;
the first absorbance is less than the second absorbance; and
the first reflectance is higher than the second reflectance.
8. An imaging system, comprising:
an image receiving structure disposed to be in direct contact with a marking material; and
an energy source to emit a pattern-wise modulated energy beam at a region of the image receiving structure contacting the marking material to pattern-wise transfer marking material to the image receiving structure, wherein the region of the image receiving structure contacting the marking material at which the pattern-wise modulated energy beam is directed is offset from a minimum distance point between the image receiving structure and a donor structure towards an exit from a nip between the donor structure and the image receiving structure.
9. The imaging system of claim 8 , further comprising:
a cooling system to cool the marking material transferred to the image receiving structure prior to contacting a substrate.
10. The imaging system of claim 8 , wherein the region of the image receiving structure contacting the marking material at which the pattern-wise modulated energy beam is directed is offset from the exit from the nip.
11. The imaging system of claim 8 , wherein the energy source is configured to emit the pattern-wise modulated energy beam such that an amount of energy delivered to the marking material is less than an amount of energy to change a phase of the marking material.
12. A method of imaging, comprising:
pattern-wise tuning a tunable energy transfer characteristic of a material of an image receiving structure;
selectively transferring marking material to the image receiving structure according to the energy transfer characteristic of the material; and
selectively modifying viscoelastic properties of the marking material using the material of the image receiving structure as a mask.
13. The method of imaging of claim 12 , further comprising:
pattern-wise transferring thermal energy to the material of the image receiving structure; and
transferring at least part of the thermal energy of the material to the marking material.
14. The method of imaging of claim 12 , further comprising:
irradiating the image receiving structure with an energy beam; and
pattern-wise transmitting at least part of the irradiation incident on the image receiving structure to the marking material.
15. The method of imaging of claim 12 , further comprising:
pattern-wise changing at least one of a transmittance, an absorbance, and a reflectance of the material of the image receiving structure.
16. An imaging system, comprising:
an image receiving structure including a material having a tunable energy transfer characteristic configured to pattern-wise absorb energy from the energy source and indirectly transfer at least a part of the energy to the marking material through heat conduction;
an energy source to emit an energy beam at the material having the tunable energy transfer characteristic such that marking material is pattern-wise transferred to a surface of the image receiving structure; and
a second energy source to emit an energy beam at the image receiving structure, the energy source selected to pattern-wise tune the energy transfer characteristic of the marking material.