Optical three-dimensional measurement device and filter process method
This is an optical three-dimensional measurement device provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and its measurement result that are obtained via the object lens. The optical three-dimensional measurement device comprises a filter process determination unit for determining a first filter process on the basis of observation conditions used when taking in a three-dimensional image of the observation specimen and a filter process unit for applying the first filter process determined by the filter process determination unit to the measurement image or the measurement result.
1. An optical three-dimensional measurement device provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and its measurement result that are obtained via the object lens, comprising;
a filter process determination unit for determining a first filter process on the basis of observation conditions used when taking in a three-dimensional image of the observation specimen; and
a filter process unit for applying the first filter process determined by the filter process determination unit to the measurement image or the measurement result.
2. The optical three-dimensional measurement device according to claim 1 , wherein
the filter process unit applies a second process filter being a cut-off filter process for eliminating high-frequency of a contact type roughness meter instead of the first filter process according to an instruction of an operator.
3. The optical three-dimensional measurement device according to claim 2 , wherein
one or more height profiles to which at least one of the first and second filter processes is applied are selected and displayed on the display unit.
4. The optical three-dimensional measurement device according to claim 3 , wherein
the filter process unit displays a type of a filter applied to each of the height profiles displayed on the display unit by changing a color of each of the height profiles.
5. The optical three-dimensional measurement device according to claim 3 , wherein
the filter process unit displays a type of a filter applied to each of the height profiles displayed on the display unit by changing a line type of each of the height profiles.
6. The optical three-dimensional measurement device according to claim 2 , wherein
the filter process unit further performs a third filter process being a cut-off filter process for eliminating low frequency of a contact type roughness meter and after applying one of the first and third filter processes to the observation image or its measurement result, carries out roughness parameter analysis, selects one or more of the analysis results and displays them on the display unit.
7. The optical three-dimensional measurement device according to claim 2 , wherein
the filter process unit further comprises an image composition unit for displaying information indicating a type of the first or second filter process which is applied the observation image or the measurement result that is displayed on the display unit, together with the observation image or the measurement result on the display unit.
8. The optical three-dimensional measurement device according to claim 1 , wherein
the observation condition includes at least one of an NA of the object lens, a wavelength of the observation illumination light, the observation field and the number of displayed pixels.
9. The optical three-dimensional measurement device according to claim 8 , wherein
the observation condition includes at least NA of the object lens.
10. The optical three-dimensional measurement device according to claim 1 , further comprising
a wavelength modification unit capable of modifying a wavelength of the observation illumination light,
wherein
the wavelength of the observation illumination light determined by the wavelength modification unit is included in the observation condition.
11. The optical three-dimensional measurement device according to claim 1 , which is a scanning type confocal laser microscope using laser light as the observation illumination light, comprising;
a two-dimensional scanning mechanism for enabling the laser light to scan in a two-dimensional direction;
a light receiving device for detecting volume of light of the laser light; and
a confocal iris disposed in a position conjugate with a focal point of the object lens.
12. An optical three-dimensional measurement device provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and the measurement result that are obtained via the object lens, comprising;
a filter process determination means for determining a first filter process on the basis of an observation condition used when taking in a three-dimensional image of the observation specimen; and
a filter process means for applying the first filter process determined by the filter process determination means to the observation image or the measurement result.
13. An optical three-dimensional measurement method implemented by an optical three-dimensional measurement provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and its measurement result that are obtained via the object lens, comprising;
determining a first filter process on the basis of observation conditions used when taking in a three-dimensional image of the observation specimen; and
applying the determined first filter process to the measurement image or the measurement result.