IP Library Granted Patent US 7,872,258
Granted Patent B2
US 7,872,258 · App. 12/273,589 · Granted Jan 18, 2011

Organic thin-film transistors

Assignee: Xerox Corporation
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Quick Facts
Patent No.
US 7,872,258
App. No.
12/273,589
Granted
Jan 18, 2011
Kind
B2
Abstract

A thin-film transistor uses a semiconducting layer comprising a semiconducting material of (A): where X, Ar, Ar′, R 1 , R 2 , R 3 , R 4 , R 5 , a, b, m, and n are as defined herein. The transistor has improved performance.

Claims (50)

1. A thin-film transistor comprising a semiconducting layer, wherein the semiconducting layer comprises a semiconducting material of Formula (A):

wherein X is independently selected from S, Se, O, and NR 6 ;

R 1 , R 2 , R 3 , R 4 , R 5 , and R 6 are independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 ;

Ar and Ar′ are independently a conjugated divalent moiety;

a and b are integers of from 0 to about 10;

m is 0 or 1; and

n is an integer and is at least 2.

2. The transistor of claim 1 , wherein each X is sulfur.

3. The transistor of claim 1 , wherein (a+b)>0.

4. The transistor of claim 1 , wherein the semiconducting material has a weight average molecular weight of from about 2,000 to about 200,000.

5. The transistor of claim 1 , wherein Ar and Ar′ independently comprise a moiety selected from

and combinations thereof, wherein R′ is independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 .

6. The transistor of claim 5 , wherein Ar and Ar′ are both

and a and b are each from 1 to about 5.

7. A thin-film transistor comprising a semiconducting layer, wherein the semiconducting layer comprises a semiconducting material of Formula (I), (II), (III), or (IV):

wherein X is independently selected from S, Se, O, and NR 6 ;

R 1 , R 2 , R 3 , R 4 , R 5 , and R 6 are independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 ;

Ar and Ar′ are independently a conjugated divalent moiety;

a and b are integers of from 0 to about 10; and

n is an integer and is at least 2.

8. The transistor of claim 7 , wherein each X is sulfur.

9. The transistor of claim 7 , wherein at least one of R 1 , R 2 , R 3 , R 4 , and R 5 is alkyl.

10. The transistor of claim 7 , wherein R 1 , R 2 , R 3 , R 4 , and R 5 are hydrogen.

11. The transistor of claim 7 , wherein the semiconducting material has a weight average molecular weight of from about 2,000 to about 200,000.

12. The thin-film transistor of claim 7 , wherein the semiconducting layer comprises a semiconducting material selected from Formula (I) or (II):

wherein n is an integer from 2 to about 5,000.

13. The transistor of claim 12 , wherein each X is sulfur and R 1 , R 2 , and R 3 are hydrogen.

14. The transistor of claim 12 , wherein each X is sulfur; one of R 1 , R 2 , and R 3 , is alkyl, and the other two of R 1 , R 2 , and R 3 are hydrogen.

15. The thin-film transistor of claim 7 , wherein the semiconducting layer comprises a semiconducting material selected from Formula (III) or (IV):

wherein n is an integer from 2 to about 5,000.

16. The transistor of claim 15 , wherein each X is sulfur and R 1 , R 2 , R 3 , R 4 , and R 5 are hydrogen.

17. The transistor of claim 15 , wherein each X is sulfur; one of R 1 , R 2 , R 3 , R 4 , and R 5 is alkyl, and the other four of R 1 , R 2 , R 3 , R 4 , and R 5 are hydrogen.

18. A semiconducting composition comprising a semiconducting material of Formula (A):

wherein X is independently selected from S, Se, O, and NR 6 ;

R 1 , R 2 , R 3 , R 4 , R 5 , and R 6 are independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 ;

Ar and Ar′ are independently a conjugated divalent moiety;

a and b are integers of from 0 to about 10;

m is 0 or 1; and

n is an integer and is at least 2.

19. A semiconducting composition comprising a semiconducting material of Formula (I), (II), (III), or (IV):

wherein X is independently selected from S, Se, O, and NR 6 ;

R 1 , R 2 , R 3 , R 4 , R 5 , and R 6 are independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 ;

Ar and Ar′ are independently a conjugated divalent moiety;

a and b are integers of from 0 to about 10; and

n is an integer and is at least 2.

20. The composition of claim 18 , wherein each X is sulfur.

21. The composition of claim 18 , wherein R 1 , R 2 , R 3 , R 4 , and R 5 are hydrogen.

22. The composition of claim 18 , wherein the semiconducting material has a weight average molecular weight of from about 2,000 to about 200,000.

23. The composition of claim 18 , wherein Ar and Ar′ independently comprise a moiety selected from

and combinations thereof, wherein R′ is independently selected from hydrogen, alkyl, substituted alkyl, aryl, substituted aryl, heteroaryl, halogen, —CN, and —NO 2 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 3, 2013
From: XEROX CORPORATION
To: SAMSUNG ELECTRONICS CO. LTD.
Reel/Frame 030733/0970 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2008
From: LI, YUNING; LIU, PING; WU, YILIANG; SMITH, PAUL F.
To: XEROX CORPORATION
Reel/Frame 021855/0515 →
Continuity (1)
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