Apparatus and method for operating a differential mobility analyzer with a mass spectrometer
View Patent ↗An apparatus and method of analyzing ions is described in which a Differential Mobility Analyzer (DMA) is combined with an analysis device. The DMS can be operated in first and second modes of operation to produce a plurality of ions that are sampled and analyzed by the analysis device. In the first mode of operation the DMA is configured to enable ion mobility separation and the analysis device samples and analyzes ions having ion mobility in a certain range of ion mobility and in the second mode of operation the DMA is configured to disable ion mobility separation and the analysis device samples and analyzes ions without discrimination based on ion mobility.
1. A method of providing a Differential Mobility Analyzer (DMA) that can operate in several modes of operation, wherein the method comprises:
providing a chamber having a first plate with first and second inlet apertures and a second plate with an exit aperture, the second plate being located relative to the first plate to define a DMA drift region;
providing the first inlet aperture at a position that is generally opposite to and aligned with the exit aperture and a second inlet aperture at a position that is offset with respect to the exit aperture;
providing a laminar gas flow element that is operable to create a sheath gas flow in the DMA drift region when provided with a gas flow during use; and
configuring the DMA to receive voltages, wherein during use, the voltages are applied to the DMA to generate an electric field between the first and second plates,
wherein, during use, in a first mode of operation sample ions provided to the second inlet aperture are separated based on mobility to provide a portion of the sample ions to the exit aperture, and in a second mode of operation another portion of sample ions provided to the first inlet aperture are provided to the exit aperture without mobility separation.
2. The method of claim 1 , wherein the method comprises providing a gas assembly that is configurable to provide a variable amount of the gas flow, wherein during use the gas assembly is configured to disable the gas flow in the second mode of operation.
3. The method of claim 1 , wherein the method comprises providing a gas assembly that is configurable to provide a variable amount of the gas flow, wherein during use the gas assembly is configured to sufficiently reduce the gas flow to disable ion mobility separation in the second mode of operation.
4. The method of claim 2 , wherein, during use, the method comprises applying a first set of voltages to the DMA to generate an electric field between the first and second plates to guide ions from the first entrance aperture to the exit aperture in the second mode of operation.
5. The method of claim 4 , wherein, during use, the method comprises applying a second set of voltages to the DMA to generate an electric field between the first and second plates to guide mobility separated ions from the second entrance aperture to the exit aperture in a direction generally perpendicular with respect to the sheath gas flow in the first mode of operation, and the first and second set of voltages are selected to create electric fields having similar or different magnitudes.
6. The method of claim 1 , wherein the method comprises locating the first inlet aperture downstream of the second inlet aperture with respect to sheath gas flow direction.
7. The method of claim 2 , wherein the method further comprises providing an auxiliary flow of gas to the DMA during use, wherein the auxiliary flow of gas is not sufficient to provide ion mobility separation.
8. A Differential Mobility Analyzer (DMA) comprising:
a chamber comprising a first plate with first and second inlet apertures and a second plate with an exit aperture, the second plate being located relative to the first plate to define a DMA drift region, the first inlet aperture being at a position that is generally opposite to and aligned with the exit aperture and the second inlet aperture being at a level that is offset with respect to the exit aperture;
a laminar gas flow element that is operable to create a sheath gas flow in the DMA drift region when provided with a gas flow during use; and
first and second voltage contacts configured to receive voltages to generate an electric field between the first and second plates during use,
wherein, the DMA is configurable to operate in a first mode of operation in which sample ions provided to the second inlet aperture are separated based on mobility to provide a portion of the sample ions to the exit aperture, and in a second mode of operation another portion of sample ions provided to the first inlet aperture are provided to the exit aperture without undergoing separation based on mobility.
9. The analyzer of claim 8 , wherein the analyzer further comprises a gas assembly that is configurable to provide a variable amount of the gas flow, wherein during use the gas assembly is configured to disable the gas flow in the second mode of operation.
10. The analyzer of claim 8 , wherein the analyzer further comprises a gas assembly that is configurable to provide a variable amount of the gas flow, wherein during use the gas assembly is configured to sufficiently reduce the gas flow to disable ion mobility separation in the second mode of operation.
11. The analyzer of claim 8 , wherein the first inlet aperture is located downstream of the second inlet aperture with respect to sheath gas flow direction.
12. The analyzer of claim 9 , wherein the apparatus further comprises an auxiliary gas assembly configured to provide an auxiliary flow of gas to the DMA during use, wherein the auxiliary flow of gas is not sufficient to provide ion mobility separation.
13. A method of analyzing ions, wherein the method comprises:
providing a Differential Mobility Analyzer (DMA) with a first plurality of ions;
operating the DMA in first and second modes of operation to produce a second plurality of ions from the first plurality of ions; and
sampling and analyzing the second plurality of ions with an analysis device,
wherein in the first mode of operation the DMA is configured to enable ion mobility separation and the analysis device samples and analyzes ions having a certain mobility and in the second mode of operation the DMA is configured to disable ion mobility separation and the analysis device samples and analyzes ions without discrimination based on ion mobility.
14. The method of claim 13 , wherein the method comprises providing the DMA with first and second inlet apertures and an exit aperture, the first inlet aperture being at a position that is generally opposite to and aligned with the exit aperture and the second inlet aperture at a level that is offset with respect to the exit aperture.
15. The method of claim 14 , wherein the method comprises turning off gas flow to the DMA in the second mode of operation.
16. The method of claim 14 , wherein the method comprises sufficiently reducing gas flow to the DMA to disable ion mobility separation in the second mode of operation.
17. The method of claim 14 , wherein the method comprises locating the first inlet aperture downstream of the second inlet aperture with respect to sheath gas flow direction.
18. The method of claim 13 , wherein the method further comprises providing an auxiliary flow of gas to the DMA during use, wherein the auxiliary flow of gas is not sufficient to provide ion mobility separation.
19. An apparatus for analyzing ions, wherein the apparatus comprises:
a Differential Mobility Analyzer (DMA) that is configured to operate in first and second modes of operation to produce a second plurality of ions from a first plurality of ions; and
an analysis device that is configured to sample and analyze the second plurality of ions,
wherein in the first mode of operation the DMA is configured to enable ion mobility separation and the analysis device is configured to sample and analyze ions having a certain mobility and in the second mode of operation the DMA is configured to disable ion mobility separation and the analysis device is configured to sample and analyze ions without discrimination based on ion mobility.
20. The apparatus of claim 19 , wherein the DMA comprises first and second inlet apertures and an exit aperture, the first inlet aperture being at a position that is generally opposite to and aligned with the exit aperture and the second inlet aperture at a level that is offset with respect to the exit aperture.
21. The apparatus of claim 20 , wherein gas flow to the DMA is turned off in the second mode of operation.
22. The apparatus of claim 20 , wherein gas flow to the DMA is sufficiently reduced to disable ion mobility separation in the second mode of operation.
23. The apparatus of claim 20 , wherein the first inlet aperture is located downstream of the second inlet aperture with respect to sheath gas flow direction.
24. The apparatus of claim 19 , wherein the apparatus further comprises an auxiliary gas assembly configured to provide an auxiliary flow of gas to the DMA during use, wherein the auxiliary flow of gas is not sufficient to provide ion mobility separation.