IP Library Granted Patent US 7,733,935
Granted Patent B2
US 7,733,935 · App. 12/289,128 · Granted Jun 8, 2010

Nitride semiconductor laser device and method of producing the same

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Quick Facts
Patent No.
US 7,733,935
App. No.
12/289,128
Granted
Jun 8, 2010
Kind
B2
Abstract

A nitride semiconductor laser device has a semiconductor multi-layer structure that includes a lower clad layer of a first conductive type, an active layer, and an upper clad layer of a second conductive type stacked in this order on a substrate, wherein a layer under the active layer includes a stripe-like trench; the semiconductor multi-layer structure includes a stripe-like optical cavity arranged along the stripe-like trench; the stripe-like trench has a narrower width in its both end regions compared to its central main region; and the active layer is formed of a nitride semiconductor containing In.

Claims (19)

1. A nitride semiconductor laser device comprising a semiconductor multi-layer structure including at least a lower clad layer of a first conductive type, an active layer, and an upper clad layer of a second conductive type stacked in this order on a substrate, wherein

a layer under said active layer includes a stripe-like trench;

said semiconductor multi-layer structure includes a stripe-like optical cavity arranged along said stripe-like trench;

said stripe-like trench has a narrower width in its both end regions as compared with its central main region; and

said active layer is formed of a nitride semiconductor containing In.

2. The nitride semiconductor laser device according to claim 1 , wherein said active layer has a less In concentration in the narrower end regions of said stripe-like trench than in the central main region.

3. The nitride semiconductor laser device according to claim 2 , wherein said active layer has a greater energy band gap in the narrower end regions of said stripe-like trench than in the central main region.

4. The nitride semiconductor laser device according to claim 2 , wherein said active layer has a smaller thickness in the narrower end regions of said stripe-like trench than in the central main region.

5. A method of producing the nitride semiconductor laser device of claim 1 , comprising:

forming said stripe-like trench including alternate wide-width regions and narrow-width regions on said substrate by etching;

depositing said lower clad layer of the first conductive type, said active layer, and said upper clad layer of the second conductive type in this order on said substrate;

conducting cleavage across each of said narrow-width regions of said stripe-like trench; and

conducting chip segmentation for each of said stripe-like optical cavity.

6. A method of producing the nitride semiconductor laser device of claim 1 , comprising:

depositing up to said lower clad layer of the first conductive type on said substrate,

forming said stripe-like trench including alternate wide-width regions and narrow-width regions by etching from a top face of said lower clad layer;

depositing said active layer and said upper clad layer of the second conductive type in this order;

conducting cleavage across each of said narrow-width regions of said stripe-like trench; and

conducting chip segmentation for each of said stripe-like optical cavity.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2022
From: SHARP KABUSHIKI KAISHA
To: SHARP FUKUYAMA LASER CO., LTD.
Reel/Frame 059039/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2008
From: VACCARO, PABLO; TSUDA, YUHZOH
To: SHARP KABUSHIKI KASISHA
Reel/Frame 021772/0349 →