IP Library Granted Patent US 8,134,375
Granted Patent B2
US 8,134,375 · App. 12/301,163 · Granted Mar 13, 2012

Capacitive MEMS sensor device

Assignee: NXP B.V.
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Quick Facts
Patent No.
US 8,134,375
App. No.
12/301,163
Granted
Mar 13, 2012
Kind
B2
Abstract

The present invention relates to a capacitive MEMS sensor device for sensing a mechanical quantity. To provide such a capacitive MEMS sensor device which enables fast recovery from (near) sticking after a mechanical overload situation it is proposed that the sensor device comprises: —a first bias voltage unit (V 1 ) for supplying a first bias voltage (V bias 1 ) to a first plate of said MEMS sensing element, —a second bias voltage unit (V 2 ) for supplying a second bias voltage (V bias2 ) to the second plate of said MEMS sensing element, —a signal processing ( 20 ) unit for processing said electrical quantity into an output signal (V OUT ), —a comparator unit ( 21 ) for comparing said output (V OUT ) signal to a reference signal (V ref ) for detection of an overload condition of said MEMS sensing element ( 10 ) and for outputting a comparator signal, —a control unit ( 22 ) for controlling the discharge of said MEMS sensing element ( 10 ) in case of an overload condition signalled by said comparator signal by connecting, in case of an overload condition, said first plate to a first discharge terminal (D) during a first time interval (T 1 ) and said second plate to a second discharge terminal (D) during a second time interval (T 2 ).

Claims (50)

1. A capacitive Micro Electro Mechanical System (MEMS) sensor device that senses a mechanical quantity, the capacitive MEMS sensor comprising:

a capacitive MEMS sensing element, having two plates arranged in parallel at a distance that varies in response to said mechanical quantity, that converts the sensed mechanical quantity into an electrical quantity;

a first bias voltage unit that supplies a first bias voltage (V bias 1 ) to a first plate of said capacitive MEMS sensing element;

a second bias voltage unit that supplies a second bias voltage (V bias 2 ) to the second plate of said capacitive MEMS sensing element;

a signal processing unit that processes said electrical quantity into an output signal (V OUT );

a comparator unit that compares said output signal (V OUT ) to a reference voltage (V ref ) to detect an overload condition of said capacitive MEMS sensing element and outputs a comparator signal; and

a control unit that controls the discharge of said capacitive MEMS sensing element based upon said comparator signal by connecting, after detection of the overload condition, said first plate to a discharge terminal during a first time interval and said second plate to the discharge terminal during a second time interval wherein the first bias voltage and the second bias voltage are separately controlled.

2. The capacitive MEMS sensor device as claimed in claim 1 , wherein said first bias voltage unit comprises:

a first voltage source; and

a first impedance element having a low impedance and connected between said first voltage source and said first plate, and wherein said second bias voltage unit comprises:

a second voltage source; and

a second impedance element having a high impedance and connected between said second voltage source and said second plate.

3. The capacitive MEMS sensor device as claimed in claim 2 , wherein the discharge terminal connects said second voltage source and said second impedance element.

4. The capacitive MEMS sensor device as claimed in claim 2 , wherein a supply voltage of said first voltage source is larger than a supply voltage of said second voltage source.

5. The capacitive MEMS sensor device as claimed in claim 1 , wherein said first time interval and said second time interval have substantially identical start times and said first time interval is shorter than said second time interval.

6. The capacitive MEMS sensor device as claimed in claim 1 , wherein said control unit comprises:

a first pulse generator having a first pulse time corresponding to said first time interval; and

a second pulse generator having a second pulse time corresponding to said second time interval.

7. The capacitive MEMS sensor device as claimed in claim 1 , wherein said discharge terminal corresponds to a bias voltage supply terminal of said second bias voltage unit.

8. The capacitive MEMS sensor device as claimed in claim 1 , wherein said control unit comprises

a first switch that connects said first plate to said discharge terminal during said first time intervals; and

a second switch that connects said second plate to said discharge terminal during said second time interval.

9. The capacitive MEMS sensor device as claimed in claim 1 , wherein said signal processing unit comprises:

an analog signal amplifier, wherein said comparator unit comprises:

an analog comparator, and wherein said first bias voltage is derived from said reference voltage.

10. The capacitive MEMS sensor device as claimed in claim 1 , wherein said signal processing unit comprises:

an analog signal amplifier that produces an amplifier output signal; and

an analog-to-digital converter that converts the amplifier output signal into a digital output signal, and wherein said comparator unit comprises:

a digital counter that detects a predetermined number of subsequent bits having a predetermined bit value.

11. An electronic circuit for a capacitive Micro Electro Mechanical System (MEMS) sensor device that senses a mechanical quantity, the capacitive MEMS sensor device comprising a capacitive MEMS sensing element having two plates arranged in parallel at a distance that varies in response to said mechanical quantity and converting the sensed mechanical quantity into an electrical quantity, the electronic circuit comprising:

a first bias voltage unit that supplies a first bias voltage to a first plate of said capacitive MEMS sensing element;

a second bias voltage unit that supplies a second bias voltage to a second plate of said capacitive MEMS sensing element;

a signal processing unit that processes said electrical quantity into an output signal;

a comparator unit that compares said output signal to a reference signal to detect an overload condition of said capacitive MEMS sensing element and outputs a comparator signal; and

a control unit that controls the discharge of said capacitive MEMS sensing element based upon said comparator signal by connecting, after detection of the overload condition, said first plate to a discharge terminal during a first time interval and said second plate to the discharge terminal during a second time interval, wherein the first bias voltage and the second bias voltage are separately controlled.

12. A method of operating a capacitive Micro Electro Mechanical System (MEMS) sensor device that senses a mechanical quantity, the capacitive MEMS sensor comprising a capacitive MEMS sensing element having two plates arranged in parallel at a distance that varies in response to said mechanical quantity and converting the sensed mechanical quantity into an electrical quantity, the method comprising:

supplying a first bias voltage to a first plate of said capacitive MEMS sensing element;

supplying a second bias voltage to the second plate of said capacitive MEMS sensing element;

processing said electrical quantity into an output signal;

comparing said output signal to a reference signal to detect an overload condition of said capacitive MEMS sensing element;

outputting a comparator signal based upon the comparison; and

controlling the discharge of said capacitive MEMS sensing element based upon said comparator signal by connecting, after detection of the overload condition, said first plate to a discharge terminal during a first time interval and said second plate to the discharge terminal during a second time interval, wherein the first bias voltage and the second bias voltage are separately controlled.

13. The method of claim 12 , further comprising:

determining a recharge time using the second bias voltage.

14. The method of claim 12 , further comprising:

during recovery from the overload condition, maintaining an input DC level at the second bias voltage.

15. The method of claim 12 , further comprising:

deriving a reference level for the comparator signal from the first bias voltage.

16. The method of claim 12 , further comprising:

providing the first bias voltage with a nonlinear diode.

Assignments (12)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
PATENT RELEASE Recorded Aug 17, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 039707/0471 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2015
From: NXP B.V.
To: III HOLDINGS 6, LLC
Reel/Frame 036304/0330 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2008
From: VAN DEN BOOM, JEROEN MICHIEL
To: NXP, B.V.
Reel/Frame 021845/0851 →
Priority Claims (1)
EP 06114074 · May 17, 2006 · regional
Continuity (1)
Related Publication 20100013501A1 · Jan 21, 2010