Program lock circuit for a mask programmable anti-fuse memory array
A program lock circuit for inhibiting programming of memory cells. A memory array can have both mask programmable and one-time programmable memory cells connected to the wordlines and the bitlines. Since the one-time programmable memory cells are convertible into mask programmable memory cells through mask programming, such as diffusion mask programming or contact/via mask programming, these mask programmed cells are still electrically programmable, thereby destroying the originally stored data. The programming lock circuit inhibits programming of the mask programmed cells by detecting an activated wordline during a programming operation, and then immediately disabling or decoupling the high voltage supply that is provided to the wordline drivers. Mask programmed transistor elements coupled to each wordline detect the wordline voltage and disable the high voltage supply. A mask programmable master lock device can be provided to inhibit all the rows in the memory array from being programmed.
1. A program lock circuit for a memory having programmable memory cells arranged in rows and columns configured for receiving a programming voltage, comprising:
a mask programmable inhibit circuit coupled to a wordline corresponding to a row of programmable memory cells; and,
an enable circuit for coupling the mask programmable inhibit circuit to a voltage supply in a programming operation, the mask programmable inhibit circuit disabling the programming voltage in response to the programming voltage of the wordline when the mask programmable inhibit circuit is programmed to lock the row of programmable memory cells.
2. The program lock circuit of claim 1 , wherein the enable circuit includes a transistor for electrically coupling a common node to the voltage supply in the programming operation.
3. The program lock circuit of claim 2 , wherein the mask programmable inhibit circuit includes a mask programmable transistor having a gate terminal coupled to the wordline, a drain terminal coupled to the programming voltage and a source terminal coupled to the common node.
4. The program lock circuit of claim 3 , wherein the mask programmable transistor includes one of a channel region between the drain terminal and the source terminal for locking the row of programmable memory cells, and an absence of the channel region.
5. The program lock circuit of claim 4 , further including a master mask programmable transistor configured as a diode-connected mask programmable transistor for coupling the programming voltage to the voltage supply when mask programmed for locking the row of programmable memory cells.
6. The program lock circuit of claim 1 , wherein the mask programmable inhibit circuit includes a mask programmable transistor having a gate terminal coupled to an enable signal, a drain terminal coupled to the wordline and a source terminal coupled to the voltage supply.
7. The program lock circuit of claim 6 , wherein the mask programmable transistor includes one of an optional diffusion area between a channel region and the drain terminal for locking the row of programmable memory cells, and an absence of the optional diffusion area.
8. The program lock circuit of claim 1 , further including
a high voltage switch circuit for providing one of the programming voltage and a read voltage in response to a control signal, and
a logic circuit having a first input for receiving the selection signal and a second input coupled to an override signal line, the logic circuit providing the control signal having a logic state corresponding to the selection signal when the override signal line is at an inactive logic level, high voltage switch circuit being switched to provide the read voltage when the override signal line is at an active logic level.
9. The program lock circuit of claim 8 , wherein the mask programmable inhibit circuit includes
an activating transistor for electrically coupling the override signal line to another voltage supply corresponding to the active logic level, and
a mask programmable inverter coupled to the wordline for driving a gate terminal of the activating transistor.
10. The program lock circuit of claim 9 , wherein the mask programmable inverter includes an n-channel transistor having a channel region for locking the row of programmable memory cells.
11. The program lock circuit of claim 10 , further including a master mask programmable inhibit circuit having
a master activating transistor for electrically coupling the override signal line to the another voltage supply corresponding to the active logic level,
a master mask programmable inverter coupled to the another voltage supply for driving a gate terminal of the master activating transistor.