Thermal control system and method for operating an integrated circuit
View Patent ↗According to one embodiment, a system and method for operating an Integrated Circuit (IC) includes inputting power to the IC in bursts, sensing an IC temperature using a temperature sensor, operating the IC by controlling the power to be outputted by the IC during the burst in dependence on the sensed IC temperature compared to a reference IC temperature using a controller, wherein the IC temperature is obtained at a predetermined moment prior to a start of the burst, and the IC is operated by setting an allowable power to be outputted by the IC prior to the start of the burst.
1. A method of operating an integrated circuit (IC), the method comprising:
inputting power to the IC in bursts using a power supply;
sensing an IC temperature using a temperature sensor; and
operating the IC by controlling the power to be outputted by the IC during a burst in dependence on the sensed IC temperature compared to a reference IC temperature using a controller,
wherein the IC temperature is sensed prior to a start of the burst, wherein the IC temperature is obtained at a predetermined moment prior to the start of the burst, and wherein operating the IC by controlling the power to be outputted by the IC is provided by setting an allowable power to be outputted by the IC prior to the start of the burst.
2. The method according to claim 1 , wherein a sample of the sensed IC temperature is provided and the sampled IC temperature is used as the IC temperature obtained at the predetermined moment prior to the start of the burst.
3. The method according to claim 1 , wherein a sample of the sensed IC temperature is obtained at the end of a previous burst and the sampled IC temperature is used for setting a maximum allowable power to be outputted by the IC prior to the start of a next burst.
4. The method according to claim 1 , wherein the power to be outputted by the IC is controlled by a regulation of the power to be inputted to the IC, the regulation being provided prior to the burst.
5. The method according to claim 1 , wherein the power to be outputted by the IC is controlled by a regulation of a gain of a power amplification, which power amplification is provided by the IC and wherein the regulation is provided prior to the burst.
6. The method according to claim 1 , wherein a regulation of the power to be outputted by the IC in a next burst is only provided in a period between an end of a previous burst until a start of the next burst.
7. The method according to claim 1 , wherein the power to be outputted by the IC in a next burst is controlled in dependence on a sampled and held IC temperature obtained during a previous burst prior to the next burst, which the sampled and held IC temperature is compared to the reference IC temperature.
8. The method according to claim 1 , wherein setting a maximum level of power to be outputted by the IC during the burst results in the power to be outputted by the IC being decreased when the IC temperature obtained at the predetermined moment prior to the start of the burst is higher than the reference IC temperature.
9. An integrated circuit (IC) controller configured for use with an IC and a power supply configured to supply power to the IC in bursts, the IC controller configured for use with a temperature sensor sensing an IC temperature, the IC controller comprising:
an input configured to input the sensed IC temperature;
a device configured to access a reference IC temperature;
an output configured to output a control signal; and
a control logic, wherein the control logic is configured to obtain the sensed IC temperature at a predetermined moment prior to a start of the burst, and the control logic is further configured to operate the IC by controlling the power to be outputted by the IC by outputting the control signal, the control signal comprising a signal configured to set an allowable power to be outputted by the IC, the allowable power configured to be set prior to the start of the burst and the control signal configured to be set in dependence on a comparison of the obtained sensed IC temperature obtained at the predetermined moment with the reference IC temperature.
10. An IC system comprising the IC controller of claim 9 , the IC to be controlled by the IC controller of claim 9 , and the temperature sensor of claim 9 , the IC system further comprising one or more of:
a sample and hold device for sampling and holding the IC temperature;
a burst timing detection device;
a device using an output of the IC; and
a device using a power outputted by the IC.