IP Library Granted Patent US 7,796,067
Granted Patent B2
US 7,796,067 · App. 12/317,314 · Granted Sep 14, 2010

Curvature correction methodology

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Quick Facts
Patent No.
US 7,796,067
App. No.
12/317,314
Granted
Sep 14, 2010
Kind
B2
Abstract

A method is provided to produce an error corrected digital output from a temperature measurement system that generates digital outputs representative of the output of one or more temperature sensors. In an embodiment of the invention the method comprises: storing in a plurality of memory locations corresponding error correction data, with each memory location having a correlation to a corresponding range of the digital outputs; utilizing each digital output to identify a corresponding one of the memory locations; accessing the corresponding one memory location to obtain error correction data specific to the digital output; and utilizing the error correction data specific to the digital output to correct the digital output, whereby an error corrected digital output is generated.

Claims (63)

1. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

storing in a plurality of memory locations corresponding error correction data, each of said memory locations having a correlation to a corresponding range of said digital outputs;

utilizing each of said digital outputs to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain error correction data specific to each of said digital outputs;

establishing said error correction data from a piece-wise linear approximation of a characteristic error curve for said temperature measurement system;

said characteristic error curve is determined from a plurality of error curves obtained from a statistically significant number of measurement systems; and

utilizing said error correction data specific to each of said digital outputs to correct each said digital output, whereby error corrected digital outputs are generated.

2. A method in accordance with claim 1 , comprising:

providing circuitry to operate on each said digital output with said error correction data to generate said error corrected digital outputs.

3. A method in accordance with claim 1 , comprising:

providing offset data and slope data as said error correction data.

4. A method in accordance with claim 1 , comprising:

providing said temperature measurement system on a single integrated circuit.

5. A method in accordance with claim 4 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

6. A method in accordance with claim 5 , comprising:

providing offset data and slope data as said error correction data.

7. A method in accordance with claim 1 , comprising:

establishing a plurality of linear segments of said piece-wise linear approximation, said linear segments being determined from predetermined acceptable error limits; and

utilizing each segment of said plurality of linear segments to determine corresponding said error correction data.

8. A method in accordance with claim 4 , comprising:

providing at least one temperature sensor on said integrated circuit.

9. A method in accordance with claim 4 , comprising:

providing an input to said integrated circuit for coupling to a temperature sensor external to said integrated circuit.

10. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

providing a plurality of error correction information sets for said measurement system;

generating said plurality of error correction information sets by:

producing a typical error curve;

providing a piece-wise linear representation of said typical error curve comprising a plurality of segments; and

minimizing the number of said segments in said piece-wise linear representation to achieve a predetermined acceptable error; and

utilizing said segments to generate error correction information sets;

storing said plurality of error correction information sets in a corresponding plurality of memory locations;

associating each of each of said memory locations to a corresponding range of said digital outputs;

utilizing each said digital output to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain a corresponding said error correction information set; and

utilizing said corresponding error correction data set to correct said digital output, whereby an error corrected digital output is generated.

11. A method in accordance with claim 10 , comprising:

utilizing said digital output to access a particular corresponding segment error correction information set to correct said digital output.

12. A method in accordance with claim 11 comprising:

providing a memory for storing said plurality of error correction information sets in a plurality of corresponding locations; and

storing each said error correction information set in a predetermined location that has a correlation to its corresponding said segment.

13. A method in accordance with claim 12 , comprising;

utilizing each said digital output to access a corresponding memory location based upon a corresponding said segment.

14. A method in accordance with claim 12 , comprising:

providing said temperature measurement system on a single integrated circuit.

15. A method in accordance with claim 14 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

16. A method in accordance with claim 15 , comprising:

providing offset data and slope data as said error correction data.

17. A method in accordance with claim 10 , comprising:

providing said temperature measurement system on a single integrated circuit.

18. A method in accordance with claim 17 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

19. A method in accordance with claim 18 , comprising:

providing offset data and slope data as said error correction data.

20. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

storing in a plurality of memory locations corresponding error correction data, each of said memory locations having a correlation to a corresponding range of said digital outputs;

utilizing each of said digital outputs to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain error correction data specific to each of said digital outputs;

establishing said error correction data from a piece-wise linear approximation of a characteristic error curve for said temperature measurement system;

establishing a plurality of linear segments of said piece-wise linear approximation, said linear segments being determined from predetermined acceptable error limits; and

utilizing each segment of said plurality of linear segments to determine corresponding said error correction data; and

utilizing said error correction data specific to each of said digital outputs to correct each said digital output, whereby error corrected digital outputs are generated.