IP Library Granted Patent US 8,033,164
Granted Patent B2
US 8,033,164 · App. 12/334,760 · Granted Oct 11, 2011

Corrosion testing apparatus and method

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Quick Facts
Patent No.
US 8,033,164
App. No.
12/334,760
Granted
Oct 11, 2011
Kind
B2
Abstract

The present invention relates to an apparatus and method as described in the specification and drawings for parallel high throughput corrosion testing and electroplating testing of test coupons.

Claims (21)

1. An apparatus comprising:

(a) a first test coupon, which comprises a top face and a bottom face;

(b) a test framework, which comprises a top face, bottom face, and a plurality of walls that define a number N of test holes; wherein the top and bottom faces of the test framework are generally flat, spaced apart from, and generally parallel to, each other; the test holes pass through the test framework between bottom openings at the bottom face of the test framework and top openings at the top face of the test framework and are spaced apart from each other; N is an integer of from 2 to 200; and the bottom face of the test framework operatively contacts, around the bottom openings of at least two of the test holes, the top face of the first test coupon to independently circumscribe at least two separate test areas on the top face of the first test coupon; and

(c) a second test coupon, which comprises a top face and a bottom face; wherein the top face of the test framework operatively contacts, around the top openings of the at least two test holes, the bottom face of the second test coupon to independently circumscribe at least two separate test areas on the bottom face of the second test coupon;

wherein at least two test chambers are defined by the walls of the at least two test holes, the at least two separate test areas circumscribed on the top face of the first test coupon, and the at least two separate test areas circumscribed on the bottom face of the second test coupon.

2. The apparatus according to claim 1 , the apparatus further comprising a securing means, which operatively contacts the bottom face of the first test coupon and the top face of the second test coupon.

3. The apparatus according to claim 1 , the apparatus further comprising a first backing means, a second backing means, and a securing means; wherein the first backing means independently comprises a top face and a bottom face that is generally flat and spaced apart from, and generally parallel to, each other; the second backing means independently comprises a top face and a bottom face that is generally flat and spaced apart from, and generally parallel to, the other; the first backing means is disposed between the first test coupon and the securing means so that the top face of the first backing means operatively contacts the bottom face of the first test coupon and the bottom face of the first backing means operatively contacts the securing means; the second backing means is disposed between the second test coupon and the securing means so that the bottom face of the second backing means operatively contacts the top face of the second test coupon and the top face of the second backing means operatively contacts the securing means.

4. The apparatus according to claim 1 , the apparatus further comprising at least one sealing means, which either is disposed between, and forms a sealing contact with, the top face of the first test coupon and the bottom face of the test framework around a bottom opening of one of the at least two test holes or is disposed between, and forms a sealing contact with, the bottom face of the second test coupon and the top face of the test framework around a top opening of the same one of the at least two test holes.

5. The apparatus according to claim 4 , wherein the sealing means independently comprises a gasket or an O-ring.

6. The apparatus according to claim 1 , wherein the first test coupon is a first metal test coupon comprising palladium, platinum, gold, silver, titanium, stainless steel, silicon, brass, tungsten, tantalum, chromium, nickel, copper, carbon steel, lead, tin, aluminum, or zinc.

7. The apparatus according to claim 6 , wherein the second test coupon comprises a second metal test coupon comprising palladium, platinum, gold, silver, titanium, stainless steel, silicon, brass, tungsten, tantalum, chromium, nickel, copper, carbon steel, lead, tin, aluminum, or zinc.

8. The apparatus according to claim 1 , wherein the test framework is comprised of a polymer-or interpolymer-based chemical and corrosion resistant structural material.

9. The apparatus according to claim 1 , wherein the first and second test coupons are first and second metal test coupons, respectively, and the first and second metal test coupons comprise a voltaic couple.

10. A method comprising the steps of:

(a) providing an apparatus comprising:

(i) a first test coupon, which comprises a top face and a bottom face;

(ii) a test framework, which comprises a top face, bottom face, and a plurality of walls that define a number N of test holes; wherein the top and bottom faces of the test framework are generally flat, spaced apart from, and generally parallel to, each other; the test holes pass through the test framework between bottom openings at the bottom face of the test framework and top openings at the top face of the test framework and are spaced apart from each other; N is an integer of from 2 to 200; and the bottom face of the test framework operatively contacts, around the bottom openings of at least two of the test holes, the top face of the first test coupon to independently circumscribe at least two separate test areas on the top face of the first test coupon; and

(iii) a second test coupon, which comprises a top face and a bottom face; wherein the top face of the test framework operatively contacts, around the top openings of the at least two test holes, the bottom face of the second test coupon to independently circumscribe at least two separate test areas on the bottom face of the second test coupon;

wherein at least two test chambers are defined by the walls of the at least two test holes, the at least two separate test areas circumscribed on the top face of the first test coupon, and the at least two separate test areas circumscribed on the bottom face of the second test coupon;

(b) contacting a corrosion testing amount of a test liquid in each one of the at least two test chambers to at least one of the first and second test coupons, wherein the test liquids in the at least two test chambers may be the same or different and are secured against fluid communication with each other; and

(c) analyzing at least one of the first and second test coupons for corrosion.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2011
From: DERMODY, DANIEL L.; HARRIS, KEITH; HAYES, DAVID A
To: DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 026454/0440 →
CHANGE OF NAME Recorded Mar 21, 2011
From: DOW GLOBAL TECHNOLOGIES INC.
To: DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 025990/0408 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2009
From: DERMODY, DANIEL L.; HARRIS, KEITH; HAYES, DAVID A.
To: DOW GLOBAL TECHNOLOGIES INC.
Reel/Frame 022656/0555 →