Personal computer based audio frequency impedance analyzer
View Patent ↗An apparatus, method, and system for analyzing the response of a device under test using a signal generated by an audio card comprises a housing. The apparatus comprises a first connector coupled to the housing and configured to couple electrically with an output of the audio card and to receive a first signal from the audio card. The apparatus also comprises a second connector being electrically coupled with the first connector and configured to interface with the device under test in order to transmit the first signal to a device under test. The apparatus also comprises a third connector configured to receive a second signal from the device under test. The apparatus also comprises a fourth connector being electrically coupled with the third connector and configured to transmit the second signal to an input of the audio card.
1. An apparatus for analyzing the response of a device under test using a signal generated by an audio card, comprising:
a housing;
a first connector coupled to the housing and configured to couple electrically with an output of the audio card and to receive a first signal from the audio card;
a second connector being electrically coupled with the first connector and configured to interface with the device under test in order to transmit the first signal to a device under test;
a third connector configured to receive a second signal from the device under test;
a fourth connector being electrically coupled with the third connector and configured to transmit the second signal to an input of the audio card;
at least one switch electrically coupled with the fourth connector; and
at least one of a null circuit, a short circuit, an open circuit, or a known impedance circuit electrically coupled to the at least one switch.
2. The apparatus as in claim 1 , further comprising a transformer electrically coupled with the first connector.
3. The apparatus as in claim 1 , further comprising an amplifier electrically coupled with the first connector.
4. The apparatus as in claim 1 , wherein the second connector and the third connector further comprise a four wire Kelvin configuration.
5. The apparatus as in claim 1 , wherein the first connector is a TSR connector.
6. The apparatus as in claim 1 , wherein the first connector is an RCA connector.
7. The apparatus as in claim 1 , wherein the second connector is a test probe.
8. An apparatus for analyzing the response of a device under test using a signal generated by an audio card, comprising:
a first means for receiving a first signal from the audio card;
a first means for transmitting the first signal to a device under test;
a second means for receiving a second signal from the device under test;
a second means for transmitting the second signal to the audio card;
a third means for transmitting the first signal to a short circuit;
a third means for receiving the second signal from the short circuit;
a fourth means for transmitting the first signal to an open circuit; and
a fourth means for receiving the second signal from the open circuit.
9. The apparatus as in claim 8 , further comprising:
a fifth means for transmitting the first signal to a null circuit; and
a fifth means for receiving the second signal from the null circuit.
10. The apparatus as in claim 8 , further comprising:
a sixth means for transmitting the first signal to a known impedance circuit; and
a sixth means for receiving the second signal from the open circuit.
11. The apparatus as in claim 8 , further comprising:
a means for calculating a measurement of the device under test.
12. The apparatus as in claim 11 , wherein the measurement is an impedance measurement.
13. The apparatus as in claim 11 , wherein the measurement is a transfer function measurement.
14. A method for analyzing the response of a device under test using a signal generated by an audio card, comprising:
generating a first sound file;
generating a first signal with the audio card where the first signal corresponds to the first sound file;
transmitting the first signal to the device under test through a Z box;
receiving a second signal from the device under test; and
transmitting the second signal through the Z box to the audio card, wherein the audio card converts and records the second signal as a second sound file.
15. The method as in claim 14 , further comprising comparing the second sound file to the first sound file to determine a measure of the device under test.
16. The method as in claim 15 , wherein comparing the second sound file to the first sound file to determine a measure of the device under test comprises digital signal processing.
17. The method as in claim 14 , further comprising:
making a short circuit measurement utilizing the first signal; and
making an open circuit measurement utilizing the first signal.
18. The method as in claim 17 , further comprising making a null circuit measurement utilizing the first signal.
19. The method as in claim 18 , further comprising calculating an impedance measurement for the device under test based on the null circuit measurement, the short circuit measurement, the open circuit measurement, and a device under test circuit measurement.
20. The method as in claim 17 , further comprising making a known impedance circuit measurement utilizing the first signal.
21. The method as in claim 20 , further comprising calculating an impedance measurement for the device under test based on the known impedance circuit measurement, the short circuit measurement, the open circuit measurement, and a device under test circuit measurement.
22. The method as in claim 14 , further comprising calculating a phase.
23. The method as in claim 14 , wherein the first sound file represents a signal comprising a plurality of frequencies.