IP Library Granted Patent US 7,738,219
Granted Patent B2
US 7,738,219 · App. 12/345,724 · Granted Jun 15, 2010

Narrow track extraordinary magneto resistive [EMR] device with wide voltage tabs and diad lead structure

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Quick Facts
Patent No.
US 7,738,219
App. No.
12/345,724
Granted
Jun 15, 2010
Kind
B2
Abstract

A Lorenz magnetoresistive sensor having a pair of voltage leads and a pair of current leads. The voltage leads are located at either side of one of the current leads and are separated by a distance that is substantially equal to the length of a bit to be measured. The Lorenz magnetoresistive sensor can be, for example an extraordinary magnetoresistive sensor having a quantum well structure such as a two dimensional electron gas and a shunt structure formed on an edge of the quantum well structure opposite the voltage and current leads.

Claims (29)

1. A Lorentz magnetoresistive sensor, comprising:

a quantum well structure having an edge:

first and second current leads electrically connected with the edge of the quantum well structure;

first and second voltage leads connected with the edge of the quantum well structure and arranged such that the second current lead is located between the first and second voltage leads, the first and second voltage leads being separated from one another by a distance that is substantially equivalent with a length of a magnetic bit to be measured by the sensor.

2. A Lorentz magnetoresistive sensor as in claim 1 wherein the edge of the quantum well structure has a length L and wherein the first and second voltage leads are separated from one another by a distance no greater than L/20.

3. A Lorentz magnetoresistive sensor as in claim 1 wherein the edge of the quantum well structure terminates at first and second ends defining a length L therebetween, and wherein the second current lead is located a distance 2L/3 from one of the first and second ends of the layer of semi-conductor material.

4. A Lorentz magnetoresistive sensor as in claim 1 wherein the edge of the quantum well structure terminates at first and second ends defining a length L therebetween and the second current lead is located a distance greater than L/3 and less than 5L/6 from one of the first and second ends of the quantum well structure.

5. A Lorentz magnetoresistive sensor as in claim 1 wherein the edge of the quantum well structure terminates at first and second ends defining a length L therebetween and the quantum well structure has a width (W) in a direction perpendicular to the length (L), and wherein the ratio of W/L is between L/10 and L/30.

6. A Lorentz magnetoresistive sensor as in claim 1 wherein the edge of the quantum well structure terminates at first and second ends defining a length L therebetween and the quantum well structure has a width (W) in a direction perpendicular to the length (L), and wherein the ratio of W/L is between 1/5 and 1/60.

7. A Lorentz magnetoresistive sensor, comprising:

a layer of non-magnetic, electrically conductive material;

a layer of semi-conductor material formed adjacent to and contacting the layer of electrically conductive material, the layer of semi-conductor material having an edge surface opposite the non-magnetic electrically conductive material and having first and second ends separated by a length (L);

first and second electrically conductive current leads, in electrical communication with the semi-conductive material; and

first and second electrically conductive voltage leads in electrical communication with the semiconductor material, the second current lead being located between the first and second voltage leads, and wherein the first and second voltage leads are each separated from one another by a distance that is substantially equivalent to a length of a magnetic bit to be sensed.

8. A Lorentz magnetoresistive sensor as in claim 7 wherein the first and second voltage leads are separated from one another by a distance that is less than L/5.

9. A Lorentz magnetoresistive sensor as in claim 7 wherein the second current lead is located a distance greater than L/3 and less than 5L/6 from one of the first and second ends of the layer of semi-conductor material.

10. A Lorentz magnetoresistive sensor as in claim 7 wherein the second lead is located a distance of about 2L/3 from one of the first and second ends of the layer of semi-conductor material.

11. A Lorentz magnetoresistive sensor as in claim 7 wherein the layer of semiconductor material has a width (W) in a direction perpendicular to the length (L), and wherein the ratio of W/L is between 1/5 and 1/60.

12. A Lorentz magnetoresistive sensor as in claim 7 wherein the layer of semiconductor material has a width (W) in a direction perpendicular to the length (L), and wherein the ratio of W/L is between L/10 and L/30.

13. A Lorentz magnetoresistive sensor as in claim 7 further comprising a magnetic shield disposed adjacent to the semiconductor layer and the electrically conductive layer.

14. A Lorentz magnetoresistive sensor as in claim 7 wherein the sensor does not include a magnetic shield.

15. A Lorentz magnetoresistive sensor as in claim 7 wherein the semiconductor comprises InSb or InAs.

16. A Lorentz magnetoresistive sensor as in claim 7 wherein the semiconductor is a modulation doped semiconductor involving a 2DEG quantum well, and wherein the layer of highly electrically conductive material comprises a metal.

17. A Lorentz magnetoresistive sensor as in claim 7 wherein the layer of semiconductor material and the layer of electrically conductive material form an Ohmic interface there between.

18. A Lorentz magnetoresistive sensor as in claim 7 further comprising a layer of material intercalated between the layer of semiconductor material and the layer of electrically conductive material to form an Ohmic contact between the layer of semiconductor material and the layer of electrically conductive material.

19. A Lorentz magnetoresistive sensor, comprising:

a quantum well structure having an edge:

first and second current leads electrically connected with the edge of the quantum well structure, the first and second current leads being separated from one another by a first distance;

first and second voltage leads connected with the edge of the quantum well structure and arranged such that the second current lead is located between the first and second voltage leads, the first and second voltage leads being separated from one another by a second distance that is less than the first distance.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040826/0821 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 19, 2009
From: BOONE JR., THOMAS DUDLEY; GURNEY, BRUCE ALVIN; MARINERO, ERNESTO E.; SMITH, NEIL
To: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
Reel/Frame 022283/0407 →