IP Library Granted Patent US 8,107,202
Granted Patent B2
US 8,107,202 · App. 12/345,733 · Granted Jan 31, 2012

Magnetoresistive sensor with novel pinned layer structure

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Quick Facts
Patent No.
US 8,107,202
App. No.
12/345,733
Granted
Jan 31, 2012
Kind
B2
Abstract

A magnetoresistive sensor having an antiparallel coupled pinned layer structure including an AP 1 layer and an AP 2 layer. The AP 2 layer includes two ferromagnetic layers AP 2 ( a ) and AP 2 ( b ), and a separation layer sandwiched therebetween. The AP 2 ( a ) layer is significantly larger than the AP 2 ( b ) layer, which results in strong pinning, while the separation layer provides increased TMR and reduced RA.

Claims (26)

1. A magnetic head, comprising:

a magnetoresistive read sensor including a free layer, a barrier layer and a pinned structure between the barrier layer and an antiferromagnetic pinning layer, the pinned structure comprising:

a first pinned layer (AP 1 ) exchange coupled to the antiferromagnetic pinning layer;

an antiparallel coupling layer; and

a second pinned stack disposed between the barrier layer and the antiparallel coupling layer and antiparallel coupled to the first pinned layer, wherein the second pinned stack includes a first magnetic layer (AP 2 ( a )), a second magnetic layer (AP 2 ( b )) and thin layer of Ta sandwiched between said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )), and wherein said second magnetic layer (AP 2 ( b )) is located between the thin layer of Ta and the barrier layer, and said first magnetic layer (AP 2 ( a )) has a greater thickness than said second magnetic layer (AP 2 ( b )).

2. The magnetic head of claim 1 , wherein said first magnetic layer (AP 2 ( a )) is at least 25 percent thicker than said second magnetic layer (AP 2 ( b )).

3. The magnetic head of claim 2 , wherein said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )) comprise ferromagnetic material.

4. The magnetic head of claim 2 , wherein said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )) comprise cobalt-iron-boron (CoFeB).

5. The magnetic head of claim 1 , wherein the thin layer of Ta has a thickness that is less than 3 Angstroms but greater than 0 Angstroms.

6. The magnetic head of claim 1 , wherein the thin layer of Ta has a thickness 0.5 to 1.5 Angstroms.

7. The magnetic head of claim 1 , wherein the barrier layer comprises a dielectric material.

8. The magnetic head of claim 1 , wherein the barrier layer comprises magnesium oxide (MgO).

9. The magnetic head of claim 1 , wherein pinning of said first magnetic layer AP 2 ( a )) and second magnetic layer (AP 2 ( b )) establishes a common magnetic moment for both the said first and second magnetic layers.

10. A magnetic head as in claim 1 wherein said first pinned layer (AP 1 ) comprises CoFe and said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )) each comprise CoFeB.

11. A magnetic head as in claim 1 wherein the magnetoresistive read sensor is a bottom spin valve.

12. A magnetic head, comprising:

a magnetoresistive read sensor including a free layer, a barrier layer and a pinned structure between the barrier layer and an antiferromagnetic pinning layer, the pinned structure comprising:

a first pinned layer (AP 1 ) exchange coupled to the antiferromagnetic pinning layer;

an antiparallel coupling layer; and

a second pinned stack disposed between the barrier layer and the antiparallel coupling layer and antiparallel coupled to the first pinned layer, wherein the second pinned stack includes a compositionally distinct nanocrystalline layer between a first magnetic layer (AP 2 ( a )) and a second magnetic layer (AP 2 ( b )), wherein said second magnetic layer (AP 2 ( b )) is located between the antiparallel coupling layer and the barrier layer, and wherein said first magnetic layer (AP 2 ( a )) has a greater thickness than said second magnetic layer (AP 2 ( b )), and wherein the separation layer comprises a material selected from the group consisting of, NiTa, CrTa, TaNb and ZrX {where X is Ta, Nb, Cr or Hf}.

13. A magnetic head as in claim 12 wherein the compositionally distinct nanocrystalline layer has a thickness less than 3 Angstroms but neater than 0 Angstroms.

14. A magnetic head as in claim 12 wherein the compositionally distinct nanocrystalline layer has a thickness of 0.5 to 1.5 Angstroms.

15. A magnetic head as in claim 12 wherein said first magnetic layer (AP 2 ( a )) is at least 25 percent thicker than said second magnetic layer (AP 2 ( b )).

16. A magnetic head as in claim 12 wherein said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )) each comprise CoFeB.

17. A magnetic head as in claim 12 wherein said first pinned layer (AP 1 ) comprises CoFe and said first magnetic layer (AP 2 ( a )) and said second magnetic layer (AP 2 ( b )) each comprise CoFeB.

18. A magnetic head as in claim 12 wherein the magnetoresistive sensor is a bottom spin valve.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040826/0821 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →