IP Library Granted Patent US 7,990,444
Granted Patent B2
US 7,990,444 · App. 12/358,086 · Granted Aug 2, 2011

Solid-state imaging device and camera

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Quick Facts
Patent No.
US 7,990,444
App. No.
12/358,086
Granted
Aug 2, 2011
Kind
B2
Abstract

Disclosed is a solid-state imaging device which includes a group of elements, the group including at least color photoelectric conversion elements configured to convert light signals in first, second, and third wavelength ranges to electric signals, respectively, a white photoelectric conversion element configured to convert light signals in the wavelength range including the entire visible light range and a portion of the infrared light range to electric signals, and a light-shielded diode element configured to be shielded from light. A unit is formed by including the white photoelectric conversion element and the light-shielded diode element for one color photoelectric conversion element, and within the unit, the white photoelectric conversion element is electrically connected with the light-shielded diode element by way of an overflow path. A camera provided with the solid-state imaging device is also disclosed.

Claims (46)

1. A solid-state imaging device, comprising:

an imaging section including a group of elements, the group of elements including color photoelectric conversion elements configured to convert light signals in first, second, and third wavelength ranges to electric signals, respectively, a white photoelectric conversion element configured to convert light signals in a wavelength range including an entire visible light range and a portion of an infrared light range to electric signals, and a light-shielded diode element configured to be shielded from light; and

a peripheral circuit disposed around the imaging section, wherein

in the imaging section, a unit is formed by including a white photoelectric conversion element and a light-shielded diode element for one color photoelectric conversion element, and within the unit, the white photoelectric conversion element is electrically connected with the light-shielded diode element by way of an overflow path.

2. The solid-state imaging device according to claim 1 , wherein

the unit is formed by including two elements each vertically and horizontally, four elements in total, a first one being the white photoelectric conversion element, a second one being the one color photoelectric conversion element, and a third one being the light-shielded diode element, and a fourth one being another light-shielded diode element, and within the unit, the white photoelectric conversion element is disposed diagonally to the one color photoelectric conversion element, and the two light-shielded diode elements are each electrically connected with the white photoelectric conversion element by way of overflow paths.

3. The solid-state imaging device according to claim 2 , wherein

a group of the color photoelectric conversion elements are disposed to form a Bayer arrangement.

4. The solid-state imaging device according to claim 3 , wherein

the imaging section further includes on-chip lenses each spatially corresponding to the one color photoelectric conversion element and the white photoelectric conversion element and disposed to form a slant pixel arrangement.

5. The solid-state imaging device according to claim 4 , wherein

the imaging section further includes an inner lens to serve as a light condensing structure.

6. The solid-state imaging device according to claim 4 , wherein

the imaging section further includes an optical waveguide to serve as a light condensing structure.

7. The solid-state imaging device according to claim 4 , wherein

an area of the light-shielded diode element is smaller than an area of at least one of the photoelectric conversion elements and the white photoelectric conversion element.

8. The solid-state imaging device according to claim 4 , wherein

in the imaging section, a floating diffusion region, an amplifying transistor, and a reset transistor are disposed so as to be shared by a plurality of the elements.

9. The solid-state imaging device according to claim 1 , wherein

the unit includes one white photoelectric conversion element and two light-shielded diode elements.

10. The solid-state imaging device according to claim 1 , wherein

a group of the color photoelectric conversion elements are disposed to form a Bayer arrangement.

11. The solid-state imaging device according to claim 1 , wherein

the imaging section further includes on-chip lenses each spatially corresponding to the one color photoelectric conversion element and the white photoelectric conversion element and disposed to form a slant pixel arrangement.

12. The solid-state imaging device according to claim 1 , wherein

the imaging section further includes an inner lens to serve as a light condensing structure.

13. The solid-state imaging device according to claim 1 , wherein

the imaging section further includes an optical waveguide to serve as a light condensing structure.

14. The solid-state imaging device according to claim 1 , wherein

an area of the light-shielded diode element is smaller than an area of at least one of the color photoelectric conversion elements and the white photoelectric conversion element.

15. The solid-state imaging device according to claim 1 , wherein

the first wavelength range is a wavelength range of a blue color filter, the second wavelength range is a wavelength range of a green color filter, and the third wavelength range is a wavelength range of a red color filter.

16. The solid-state imaging device according to claim 1 , wherein

the first wavelength range is a wavelength range of a cyan color filter, the second wavelength range is a wavelength range of a magenta color filter, and the third wavelength range is a wavelength range of a yellow color filter.

17. A camera, comprising:

a solid-state imaging device;

an optical system configured to lead incident light to a photoelectric conversion element included in the solid-state imaging device; and

a signal processing circuit configured to process output signals from the solid-state imaging device;

wherein the solid-state imaging device includes a group of elements, the group of photoelectric conversion elements including color photoelectric conversion elements configured to convert light signals in first, second, and third wavelength ranges to electric signals, respectively, a white photoelectric conversion element configured to convert light signals in a wavelength range including an entire visible light range and a portion of an infrared light range to electric signals, and a light-shielded diode element configured to be shielded from light, and

wherein a unit is formed by including a white photoelectric conversion element and a light-shielded diode element for one color photoelectric conversion element, and within the unit, the white photoelectric conversion element is electrically connected with the light-shielded diode element by way of an overflow path.

18. The camera according to claim 17 , wherein

the unit is formed by including two elements each vertically and horizontally, four elements in total, a first one being the white photoelectric conversion element, a second one being the one color photoelectric conversion element, and a third one being the light-shielded diode element, and a fourth one being another light-shielded diode element, and within the unit, the white photoelectric conversion element is disposed diagonally to the one color photoelectric conversion element, and the two light-shielded diode elements are each electrically connected with the white photoelectric conversion element by way of overflow paths.

19. The camera according to claim 18 , wherein

a group of the color photoelectric conversion elements are disposed to form a Bayer arrangement.

20. The camera according to claim 19 , wherein

the solid-state imaging device further includes on-chip lenses each spatially corresponding to the one color photoelectric conversion element and the white photoelectric conversion element and disposed to form a slant pixel arrangement.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2016
From: SONY CORPORATION
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 040419/0001 →