Electronic thermometer with flex circuit location
View Patent ↗An electronic thermometer is configured for ease and accuracy in construction. A probe of the thermometer includes a flex circuit containing electronic components used to measure temperature and transmit signals to a calculating unit of the thermometer. A resilient locator can function to pre-position the flex circuit prior to final fixation so that the electronic components are reliably positioned in manufacture.
1. An electronic thermometer comprising:
a probe tip adapted to be heated to a temperature by an object for use in measuring the temperature of the object:
a flex circuit including a deformable substrate, an electrical conductor on the substrate and at least one temperature sensor on the substrate electrically connected to the electrical conductor for detecting the temperature of the probe tip;
a probe shaft supporting the probe tip and flex circuit and including an end portion; and
a locating member supported by the probe shaft and at least temporarily locating the flex circuit, said locating member comprising a resilient locator resiliently deformed by engagement with the flex circuit, the resilient locator biasing the flex circuit into a selected position.
2. An electronic thermometer as set forth in claim 1 , wherein the resilient locator defines a cavity, said cavity permitting resilient deformation of the resilient locator that biases the flex circuit into said selected position.
3. An electronic thermometer as set forth in claim 1 further comprising a separator supported by the probe shaft.
4. An electronic thermometer as set forth in claim 3 , wherein the flex circuit is biased by the resilient locator against an interior wall of the separator for achieving and maintaining contact with the separator.
5. An electronic thermometer as set forth in claim 4 , wherein the flex circuit includes a pair of arms and a thermistor and a resistor mounted on respective arms, the resilient locator biasing the arms to urge the thermistor and the resistor against the interior wall of the separator.
6. An electronic thermometer as set forth in claim 1 , further comprising a base unit and a cord connecting the probe shaft to the base unit.
7. A probe for an electronic thermometer comprising:
a probe tip adapted to be heated to a temperature by an object for use in measuring the temperature of the object:
a flex circuit including a deformable substrate, an electrical conductor on the substrate and at least one temperature sensor on the substrate electrically connected to the electrical conductor for detecting the temperature of the probe tip;
a probe shaft supporting the probe tip and flex circuit and including an end portion; and
a locating member supported by the probe shaft and at least temporarily locating the flex circuit, said locating member comprising a resilient locator, said resilient locator being resiliently deformed by engagement with the flex circuit and biasing the flex circuit to a selected position.
8. A probe as set forth in claim 7 , wherein the resilient locator defines a cavity, said cavity permitting resilient deformation of the resilient locator that biases the flex circuit into said selected position.
9. A probe as set forth in claim 7 further comprising a separator supported by the probe shaft.
10. A probe as set forth in claim 9 , wherein the flex circuit is biased against an interior wall of the separator for achieving and maintaining contact with the separator.
11. A probe as set forth in claim 7 , wherein the flex circuit includes a pair of arms and a thermistor and resistor mounted on respective arms, the resilient locator biasing the arms to urge the thermistor and the resistor against the interior wall of the separator.
12. A method of making a probe for an electronic thermometer comprising:
positioning a flex circuit together with a probe shaft;
connecting a locating member to the probe shaft, said locating member comprising a resilient locator; and
resiliently deforming the resilient locator by engagement with the flex circuit thereby to bias the flex circuit to a selected position;
wherein positioning the flex circuit comprises deforming the flex circuit by bending arms of the flex circuit to an arcuate shape.
13. A method as set forth in claim 12 further comprising connecting a separator to the probe shaft.
14. A method as set forth in claim 13 wherein resiliently deforming the resilient locator comprises biasing the flex circuit against an interior wall of the separator for achieving and maintaining contact with the separator.
15. A method as set forth in claim 12 wherein resiliently deforming the resilient locator comprises bringing the resilient locator into contact with the bent arms of the flex circuit.