IP Library Granted Patent US 7,655,888
Granted Patent B2
US 7,655,888 · App. 12/362,110 · Granted Feb 2, 2010

Laser scanning microscope and assembly for non-descanned detection

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Quick Facts
Patent No.
US 7,655,888
App. No.
12/362,110
Granted
Feb 2, 2010
Kind
B2
Abstract

A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.

Claims (48)

1. A scanning microscope comprising:

a light source, particularly a pulsed light source, which emits illumination light for illuminating a specimen;

at least a first detector for detecting the detection light proceeding from the specimen;

an objective through which the specimen can be illuminated and detected; and

a second detector for non-descanned detection of the detection light proceeding from the specimen;

wherein the objective is arranged in an illumination beam path and in a detection beam path;

wherein an assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination and/or detection beam path of the scanning microscope; and

wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.

2. The scanning microscope according to claim 1 ;

wherein the assembly is vertically displaceable at the stand for focusing.

3. The scanning microscope according to claim 1 ;

wherein the detection beam path of the microscope can be deflected in direction of the second detector by a swivelable mirror.

4. The scanning microscope according to claim 1 ;

wherein a partially transparent mirror is provided in the detection beam path for simultaneous detection by the first detector and second detector.

5. The scanning microscope according to claim 1 ;

wherein evaluating electronics for the signals of at least the second detector are arranged in the housing.

6. The scanning microscope according to claim 1 ;

wherein at least the second detector is connected by heat-conducting media to cooling means, particularly cooling ribs, arranged outside the housing.

7. The scanning microscope according to claim 1 ;

wherein additional deflecting mirrors are provided in the housing for the detection light in direction of the second detector.

8. The scanning microscope according to claim 1 ;

wherein focusing optics are provided in the detection beam path for focusing the detection light on the second detector.

9. The scanning microscope according to claim 1 ;

wherein filters are provided in front of the detector for selecting detection wavelengths.

10. The scanning microscope according to claim 1 ;

wherein the NDD detection light is split, and at least another detector is arranged downstream of the split, preferably in the housing.

11. The scanning microscope according to claim 1 , for nonlinear fluorescence excitation, in particular SHG and/or multiphoton excitation.

12. A compact assembly for non-descanned detection of specimen light for a scanning microscope, comprising:

a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination and/or detection beam path of the scanning microscope; and

at least one detector which is arranged in the housing and which can be acted upon, particularly as needed, by specimen light.

13. The assembly according to claim 12 ;

wherein the assembly is vertically displaceable at the stand for focusing.

14. The assembly according to claim 12 ;

wherein the detection beam path of the microscope can be deflected in direction of the second detector by a swivelable mirror.

15. The assembly according to claim 12 ;

wherein a partially transparent mirror is provided in the detection beam path for simultaneous detection by the first detector and second detector.

16. The assembly according to claim 12 ;

wherein evaluating electronics for the signals of at least the second detector are arranged in the housing.

17. The assembly according to claim 12 ;

wherein at least the second detector is connected by heat-conducting media to cooling means, particularly cooling ribs, arranged outside the housing.

18. The assembly according to claim 12 ;

wherein additional deflecting mirrors are provided in the housing for the detection light in direction of the second detector.

19. The assembly according to claim 12 ;

wherein focusing optics are provided in the detection beam path for focusing the detection light on the second detector.

20. The assembly according to claim 12 ;

wherein filters are provided in front of the detector for selecting detection wavelengths.

21. The assembly according to claim 12 ;

wherein the NDD detection light is split, and at least another detector is arranged downstream of the split, preferably in the housing.

Assignments (2)
CHANGE OF NAME Recorded Jun 14, 2013
From: CARL ZEISS MICROIMAGING GMBH
To: CARL ZEISS MICROSCOPY GMBH
Reel/Frame 030610/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2009
From: SCHADWINKEL, HARALD; WAHL, HUBERT; SCHAU, DIETER
To: CARL ZEISS MICROIMAGING GMBH
Reel/Frame 022175/0381 →