IP Library Granted Patent US 8,290,802
Granted Patent B2
US 8,290,802 · App. 12/366,401 · Granted Oct 16, 2012

System and method for product deployment and in-service product risk simulation

Assignee: Honeywell International Inc.
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Quick Facts
Patent No.
US 8,290,802
App. No.
12/366,401
Granted
Oct 16, 2012
Kind
B2
Abstract

Methods and systems are provided for predicting the reliability of a plurality of products that will be deployed during a product deployment period comprising a plurality of time intervals. The method comprises retrieving historical product removal data from a product removal data source, retrieving historical product shipment data from a product shipment data source, identifying a plurality of Weibull parameters based on at least a portion of retrieved product removal data and product shipment data, and performing a plurality of product deployment simulations, wherein each product deployment simulation includes predicting a lifespan for each of the plurality of products and determining reliability metrics for uniform time intervals during the product deployment period.

Claims (25)

1. A product deployment and in-service product risk simulation system for predicting the reliability of a plurality of products that will be deployed during a product deployment period, the system comprising:

a product removal data source comprising historical product removal data;

a product shipment data source comprising historical product shipment data; and

a processor coupled to the product removal data source and the product shipment data source, the processor configured to:

retrieve historical product removal data from the product removal data source;

retrieve historical product shipment data from the product shipment data source;

identify a shape parameter and a scale parameter by performing a Weibull analysis on the retrieved historical product removal data and historical product shipment data; and

perform a plurality of product deployment simulations:

a) predicting a product lifespan for each of the plurality of products, each product lifespan comprising a random failure time that is selected based on values of the shape parameter and the scale parameter;

b) determining a total number of operational hours for all deployed products for uniform time intervals of a product deployment period;

c) determining a total number of product failures for the uniform time intervals of the product deployment period;

d) utilizing a selected base algorithm to determine a product reliability metric for the uniform time intervals of the product deployment period based on the total number of operational hours and the total number of product failures; and

e) repeating a) through d) a plurality of times.

2. The system of claim 1 , wherein the processor is further configured to determine a Mean Time to Failure based on the shape parameter and the scale parameter.

3. The system of claim 2 , wherein the selected base algorithm is a mean time between failure (MTBX) algorithm.

4. The system of claim 3 , wherein the MTBX algorithm comprises an instantaneous MTBX (iMTBX) algorithm.

5. The system of claim 3 , wherein the MTBX algorithm comprises a moving months variant of the MTBX algorithm.

6. The system of claim 3 , wherein the MTBX algorithm comprises a cumulative variant of the MTBX algorithm.

7. The system of claim 3 , wherein the processor is further configured to generate at least one MTBX Chart based on the reliability metrics.

8. The system of claim 7 , wherein the at least one MTBX Chart comprises:

an MTBX Chart showing the average value of the reliability metrics for each time interval; and

a percentage MTBX Chart showing, for each time interval, the percentage of reliability metrics that were below a selected reliability target.

9. The system of claim 7 , wherein the at least one MTBX Chart comprise:

an MTBX Chart showing the percentile value of the reliability metrics for each time interval; and

a percentage MTBX Chart showing, for each time interval, the percentage of reliability metrics that were below a selected reliability target.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2009
From: PIRTLE, RANDALL; FOLEY, RICHARD; SUBRAHMANYA, AMARNATH; SUBRAMONIAN, PRAKASH; BALIGA, SANDEEP; SETHU, RAMJI; LALL, NITESH
To: HONEYWELL INTERNATIONAL INC.
Reel/Frame 022213/0902 →
Continuity (1)
Related Publication 20100198635A1 · Aug 5, 2010