Method for testing reliability of solid-state storage medium
View Patent ↗A method for testing a reliability of a solid-state storage medium is provided, wherein the solid-state storage medium has a plurality of blocks. First, a lifetime of each of the blocks of the solid-state storage medium is obtained. Then, an erase count of each of the blocks is obtained, and whether the erase count is greater than a predetermined erase count is determined. After that, those blocks having their erase counts greater than the predetermined erase count are accumulated to generate a problematic block number, and a test report is output.
1. A method for testing a reliability of a solid-state storage medium, wherein the solid-state storage medium comprises a plurality of blocks, the method comprising:
obtaining a lifetime of each of the blocks of the solid-state storage medium;
obtaining an erase count of each of the blocks for each erase;
determining whether the erase count of each of the blocks is greater than a predetermined erase count;
accumulating the blocks having the erase counts greater than the predetermined erase count to generate a problematic block;
calculating a ratio of the problematic block number to a total block number of the solid-state storage medium, and using the ratio as a test report; and
outputting the test report.
2. The method according to claim 1 , wherein the lifetime is a total erase count of the block.
3. The method according to claim 1 , wherein the predetermined erase count is a fixed percentage of the lifetime.
4. The method according to claim 1 , wherein the lifetime is input into a host system by a user.
5. The method according to claim 1 , wherein the lifetime is obtained by a host system through an interface command between the host system and the solid-state storage medium.
6. The method according to claim 1 further comprising:
obtaining an error correction code (ECC) endurance of each of the blocks;
obtaining a bidden error according to the ECC endurance; and
merging the hidden error of each of the blocks into the problematic block number to be the test report.
7. The method according to claim 6 , wherein the ECC endurance is obtained by a host system through an interface command between the host system and the solid-state storage medium.
8. The Method according to claim 1 , further comprising:
obtaining an invalid page number of each of the blocks, and calculating a corresponding block number according to the invalid page number; and
merging the block number corresponding to the invalid page number into the problematic block number to be the test report.
9. The method according to claim 8 , wherein the invalid page number is obtained by a host system through an interface command between the host system and the solid-state storage medium.
10. A method for testing a reliability of a solid-state storage medium, wherein the solid-state storage medium comprises a plurality of blocks, the method comprising:
determining a test process;
sending a data of a test item to a host through an interface command by using the solid-state storage medium; and
obtaining a data difference of the test item before and after the test process;
calculating a ratio of the problematic block number to a total block number of the solid-state storage medium, and using the ratio as a test report; and
outputting the test report,
wherein the test item is to determine whether an erase count of each of the blocks is greater than a redetermined erase court and the step of sending the data of the test item further comprises:
accumulating the blocks having the erase counts greater than the predetermined erase count to generate a problematic block number and outputting the test report.
11. The method according to claim 10 , wherein the predetermined erase count is determined by a fixed percentage of a lifetime of each of the blocks.
12. The method according to claim 10 , wherein the test item further comprises an invalid page, and the step of sending the data of the test item further comprises:
obtaining an invalid page number of each of the blocks, and calculating a corresponding block number according to the invalid page number; and
merging the block number into the problematic block number to be the test report.
13. The method according to claim 10 , wherein the test item is an ECC endurance of each of the blocks.
14. The method according to claim 13 , wherein the step of sending the data of the test item further comprises:
obtaining the ECC endurance of each of the blocks,
obtaining a hidden error according to the ECC endurance; and
serving the hidden error of each of the blocks as the test report.