IP Library Granted Patent US 7,817,450
Granted Patent B2
US 7,817,450 · App. 12/383,499 · Granted Oct 19, 2010

Method and apparatus for resetting a silicon controlled rectifier bridge

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Quick Facts
Patent No.
US 7,817,450
App. No.
12/383,499
Granted
Oct 19, 2010
Kind
B2
Abstract

A method and an apparatus for resetting at least one Silicon Controlled Rectifier (SCR) in an H-bridge. The apparatus comprises a current interruption device for controlling current flow through the H-bridge, and a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge.

Claims (45)

1. Apparatus for resetting at least one Silicon Controlled Rectifier (SCR) in an H-bridge, comprising:

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector comprises a transistor, a resistor, and a capacitor, wherein (i) the resistor is coupled across an emitter-collector junction of the transistor, (ii) the capacitor is coupled across an emitter-base junction of the transistor, and (iii) a collector-base junction of the transistor is coupled across the H-bridge.

2. The apparatus of claim 1 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

3. The apparatus of claim 2 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

4. The apparatus of claim 2 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

5. The apparatus of claim 1 , wherein the current interruption device is a semiconductor switch.

6. Apparatus for resetting at least one Silicon Controlled Rectifier (SCR) in an H-bridge, comprising:

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector, comprises a diode, a first resistor, a second resistor, a transistor, a zener diode, and a capacitor, wherein (i) the first resistor is coupled across an emitter-base junction of the transistor, (ii) the zener diode is coupled across a collector-base junction of the transistor, an anode terminal of the zener diode coupled to a base terminal of the transistor, (iii) the capacitor is coupled across the collector-base junction, (iv) a first terminal of the second resistor is coupled to a collector terminal of the transistor and a second terminal of the second resistor is coupled to a cathode terminal of the diode, (v) an anode terminal of the diode is coupled to an emitter terminal of the transistor, and (vi) the cathode terminal of the diode and the base terminal of the transistor are coupled across the H-bridge.

7. Apparatus for resetting at least one Silicon Controlled Rectifier (SCR) in an H-bridge, comprising:

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector comprises a diode, a first resistor, a second resistor, a silicon controlled rectifier (SCR), a zener diode, and a capacitor, wherein (i) the first resistor is coupled between a cathode terminal and a gate terminal of the SCR, (ii) the zener diode is coupled between an anode terminal and the gate terminal of the SCR, an anode terminal of the zener diode coupled to the gate terminal of the SCR, (iii) the capacitor is coupled between the anode terminal and the gate terminal of the SCR, (iv) a first terminal of the second resistor is coupled to the anode terminal of the SCR and a second terminal of the second resistor is coupled to a cathode terminal of the diode, (v) an anode terminal of the diode is coupled to the cathode terminal of the SCR, and (vi) the cathode terminal of the diode and the gate terminal of the SCR are coupled across the H-bridge.

8. An inverter, comprising:

an H-bridge comprising at least one Silicon Controlled Rectifier (SCR);

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector comprises a transistor, a resistor, and a capacitor, wherein (i) the resistor is coupled across an emitter-collector junction of the transistor, (ii) the capacitor is coupled across an emitter-base junction of the transistor, and (iii) a collector-base junction of the transistor is coupled across the H-bridge.

9. The inverter of claim 8 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

10. The inverter of claim 9 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

11. The inverter of claim 9 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

12. The inverter of claim 8 , wherein the current interruption device is a semiconductor switch.

13. An inverter, comprising:

an H-bridge comprising at least one Silicon Controlled Rectifier (SCR);

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector comprises a diode, a first resistor, a second resistor, a transistor, a zener diode, and a capacitor, wherein (i) the first resistor is coupled across an emitter-base junction of the transistor, (ii) the zener diode is coupled across a collector-base junction of the transistor, an anode terminal of the zener diode coupled to a base terminal of the transistor, (iii) the capacitor is coupled across the collector-base junction, (iv) a first terminal of the second resistor is coupled to a collector terminal of the transistor and a second terminal of the second resistor is coupled to a cathode terminal of the diode, (v) an anode terminal of the diode is coupled to an emitter terminal of the transistor, and (vi) the cathode terminal of the diode and the base terminal of the transistor are coupled across the H-bridge.

14. An inverter, comprising:

an H-bridge comprising at least one Silicon Controlled Rectifier (SCR);

a current interruption device for controlling current flow through the H-bridge; and

a negative voltage detector for detecting a negative voltage at the H-bridge and driving the current interruption device to control the current flow through the H-bridge, wherein the negative voltage detector comprises a diode, a first resistor, a second resistor, a silicon controlled rectifier (SCR), a zener diode, and a capacitor, wherein (i) the first resistor is coupled between a cathode terminal and a gate terminal of the SCR, (ii) the zener diode is coupled between an anode terminal and the gate terminal of the SCR, an anode terminal of the zener diode coupled to the gate terminal of the SCR, (iii) the capacitor is coupled between the anode terminal and the gate terminal of the SCR, (iv) a first terminal of the second resistor is coupled to the anode terminal of the SCR and a second terminal of the second resistor is coupled to a cathode terminal of the diode, (v) an anode terminal of the diode is coupled to the cathode terminal of the SCR, and (vi) the cathode terminal of the diode and the gate terminal of the SCR are coupled across the H-bridge.

15. The apparatus of claim 6 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

16. The apparatus of claim 15 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

17. The apparatus of claim 15 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

18. The apparatus of claim 6 , wherein the current interruption device is a semiconductor switch.

19. The apparatus of claim 7 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

20. The apparatus of claim 19 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

21. The apparatus of claim 19 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

22. The apparatus of claim 7 , wherein the current interruption device is a semiconductor switch.

23. The inverter of claim 13 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

24. The inverter of claim 23 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

25. The inverter of claim 23 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

26. The inverter of claim 13 , wherein the current interruption device is a semiconductor switch.

27. The inverter of claim 14 , wherein the negative voltage detector causes the current interruption device to interrupt the current flow for a stabilization period in response to the detecting and to allow the current flow following the stabilization period.

28. The inverter of claim 27 , wherein the negative voltage detector generates a first voltage and a second voltage, wherein the first voltage causes the current interruption device to interrupt the current flow through the H-bridge and the second voltage causes the current interruption device to allow the current flow through the H-bridge.

29. The inverter of claim 27 , wherein the stabilization period is determined by an RC time constant of the negative voltage detector.

30. The inverter of claim 14 , wherein the current interruption device is a semiconductor switch.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded May 5, 2026
From: OBSIDIAN AGENCY SERVICES, INC.
To: ENPHASE ENERGY, INC.
Reel/Frame 075546/0734 →
RELEASE OF SECURITY INTEREST Recorded Feb 26, 2020
From: FLEXTRONICS INDUSTRIAL, LTD.; FLEXTRONICS AMERICA, LLC
To: ENPHASE ENERGY, INC.
Reel/Frame 052022/0954 →
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY NAME PREVIOUSLY RECORDED AT REEL: 041936 FRAME: 0109. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Apr 17, 2017
From: ENPHASE ENERGY, INC.
To: FLEXTRONICS INDUSTRIAL, LTD; FLEXTRONICS AMERICA, LLC
Reel/Frame 043339/0856 →
SECURITY INTEREST Recorded Dec 30, 2016
From: ENPHASE ENERGY, INC.
To: OBSIDIAN AGENCY SERVICES, INC.
Reel/Frame 041225/0509 →
SECURITY INTEREST Recorded Dec 30, 2016
From: ENPHASE ENERGY, INC.
To: FLEXTRONICS AMERICA, LLC
Reel/Frame 041936/0109 →
SECURITY AGREEMENT Recorded Dec 30, 2016
From: ENPHASE ENERGY, INC.
To: FLEXTRONICS INDUSTRIAL, LTD
Reel/Frame 041958/0820 →
SECURITY INTEREST Recorded Dec 28, 2016
From: ENPHASE ENERGY, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS AGENT
Reel/Frame 041210/0283 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2009
From: FORNAGE, MARTIN
To: ENPHASE ENERGY, INC.
Reel/Frame 022501/0526 →