Microchip testing device
A testing device equipped with: a microchip having a receiver for a test fluid, a discharge lamp which emits light into the microchip test fluid receiver, a light source housing in which the discharge lamp is located, and an arithmetic calculation mechanism, which calculates the concentration of the component to be detected, based on the intensity of the light emitted from the test fluid container unit. To reduce the size of the device and to shield the arithmetic calculation mechanism from electromagnetic waves generated around the light source, the light source housing is equipped with shielding connected to the ground on the outside of the light source housing made of insulating material. The light source housing is positioned within an enclosure of the testing device holding the microchip and containing the arithmetic calculation mechanism, analysis output device(s), and other components of the testing device.
1. A testing device, comprising:
a microchip having a receiver for test fluid;
a light source having a discharge lamp which emits light into the test fluid receiver, the light source having a housing in which the discharge lamp is located;
a light receiving unit which receives the light transmitted through the test fluid receiver, and
an arithmetic calculation mechanism which calculates a concentration of a component of the test fluid to be detected based on the intensity of light emitted from the test fluid receiver after having passed through the test fluid therein and received by the light receiver,
wherein the discharge lamp has a rated power of 20 W to 150 W, and
wherein the light source housing is formed of an electrical insulating material and is equipped on an outer surface thereof with a shielding mechanism connected to the ground comprised of a thin metal film having a thickness of 0.1 μm to 100 μm, the shielding mechanism shielding the arithmetic calculation mechanism located outside of the housing from electromagnetic waves emitted from the light source.
2. The testing device according to claim 1 , wherein the testing device is equipped with a pressing mechanism which presses an area in which the thin metal film is formed on the outer surface of the light source housing.
3. The testing device according to claim 2 , wherein the pressing mechanism is connected to ground.
4. The testing device according to claim 1 , wherein the testing device is equipped with a cooling air supply mechanism for supplying cooling air into the light source housing, and wherein a cooling air inlet and a cooling air outlet are formed in the light source housing.
5. The testing device according to claim 4 , wherein the light source is a discharge lamp equipped with a light emitting part in which a pair of electrodes and a discharge gas are contained, wherein a hermetically sealed part is attached to each of opposite sides of the light emitting part, and wherein a central axis of the discharge lamp is vertically oriented.
6. The testing device according to claim 5 , wherein the cooling air inlet is located opposite the hermetically sealed part which is located at a vertically lower end of the vertically oriented discharge lamp, and the cooling air outlet is located opposite the hermetically sealed part which is located at a vertically upper end of the vertically oriented discharge lamp.
7. The testing device according to claim 1 , wherein the light source housing is located within an enclosure of the testing device which has an output unit which outputs analysis results; a microchip unit for attaching and detaching of the microchip; and a flap unit with an opening through which the light source housing is insertable and removable for attaching and detaching thereof from the enclosure.