IP Library Granted Patent US 8,940,178
Granted Patent B2
US 8,940,178 · App. 12/406,319 · Granted Jan 27, 2015

Textured silicon substrate and method

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Quick Facts
Patent No.
US 8,940,178
App. No.
12/406,319
Granted
Jan 27, 2015
Kind
B2
Abstract

A method of texturizing a silicon substrate comprising a) contacting the substrate with an etching solution comprising glycolic acid, b) etching a surface of the substrate thereby forming disruptions in said surface of the substrate, and c) removing the etching solution to yield a texturized substrate, said texturized substrate having a plurality of disruptions in at least one surface with a surface density of disruptions of a minimum of 60 disruptions in a 400 micron square area.

Claims (11)

1. A method of texturizing a silicon substrate comprising a) contacting the substrate with an acidic etching solution consisting of hydrofluoric acid, nitric acid, water, and about 4% to about 40% by weight of glycolic acid, b) etching a surface of the substrate thereby forming disruptions in said surface of the substrate, and c) removing the etching solution to yield a texturized substrate.

2. The method of claim 1 wherein the etching solution contains a minimum of 5% by weight of glycolic acid.

3. The method of claim 1 wherein the etching solution contains from about 5% to 28.6% by weight glycolic acid.

4. The method of claim 1 further comprising washing the texturized substrate surface with water or a basic solution, and drying.

5. The method of claim 1 wherein the contacting is by immersing the substrate into the etching solution or by spraying the etching solution onto the substrate.

6. The method of claim 1 wherein the etching rate is from about 0.6 to about 1.3 micrometers per minute.

7. The method of claim 1 wherein the etching rate is kept constant during etching.

8. The method of claim 1 wherein the etching solution consists of on a weight percent basis from about 37.4% to about 39.2% hydrofluoric acid from about 16.0% to about 16.8% nitric acid from about 37.4% to about 39.2% water, and from about 4.8% to about 9.1% glycolic acid.

9. The method of claim 1 wherein the etching solution consists of on a weight percent basis from about 38.9% to about 42.4% hydrofluoric acid, from about 16.7% to about 18.2% nitric acid, from about 27.8% to about 30.3% water, and from about 9.1% to about 16.7% glycolic acid.

10. The method of claim 1 wherein the etching solution consists of on a weight percent basis from about 21.0% to about 26.7% hydrofluoric acid from about 21.0% to about 26.7% nitric acid, from about 29.4% to about 37.4% water, and from about 9.1% to about 28.6% glycolic acid.

11. The method of claim 1 wherein the etching solution consists of on a weight percent basis from about 23.9% to about 25.1% hydrofluoric acid, from about 23.9% to about 25.1% nitric acid, from about 43.1% to about 45.1% water, and from about 4.8% to about 9.1% glycolic acid.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 9, 2023
From: THE CHEMOURS COMPANY FC, LLC
To: PURETECH SCIENTIFIC LLC
Reel/Frame 064546/0286 →
SECURITY INTEREST Recorded Jul 31, 2023
From: PURETECH SCIENTIFIC LLC
To: TWIN BROOK CAPITAL PARTNERS, LLC, AS AGENT
Reel/Frame 064440/0479 →
PARTIAL RELEASE OF SECURITY INTEREST Recorded Jul 31, 2023
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: THE CHEMOURS COMPANY FC, LLC
Reel/Frame 064442/0631 →
SECURITY INTEREST Recorded Apr 4, 2018
From: THE CHEMOURS COMPANY FC, LLC
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 045846/0011 →
RELEASE OF SECURITY INTEREST Recorded Apr 4, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: THE CHEMOURS COMPANY FC, LLC
Reel/Frame 045845/0913 →
SECURITY AGREEMENT Recorded Jun 10, 2015
From: THE CHEMOURS COMPANY FC LLC; THE CHEMOURS COMPANY TT, LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 035839/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2015
From: E. I. DU PONT DE NEMOURS AND COMPANY
To: THE CHEMOURS COMPANY FC, LLC
Reel/Frame 035432/0023 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2009
From: LEE, SEUNG JIN; YEO, HEE SOO
To: E. I. DU PONT DE NEMOURS AND COMPANY
Reel/Frame 022472/0894 →