IP Library Granted Patent US 8,140,277
Granted Patent B2
US 8,140,277 · App. 12/415,814 · Granted Mar 20, 2012

Enhanced characterization of electrical connection degradation

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Quick Facts
Patent No.
US 8,140,277
App. No.
12/415,814
Granted
Mar 20, 2012
Kind
B2
Abstract

One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical connection and applies a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient. Next, the system assesses the integrity of the electrical connection based on the statistical deviation of the reflection coefficient. Finally, the system uses the assessed integrity to maintain the electrical connection.

Claims (38)

1. A computer-implemented method for analyzing an electrical connection in a computer system, comprising:

monitoring a reflection coefficient associated with the electrical connection;

applying a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient;

assessing the integrity of the electrical connection based on the statistical deviation of the reflection coefficient by verifying the integrity of the electrical connection if the statistical deviation is not found in the reflection coefficient and identifying a degradation risk associated with the electrical connection if the statistical deviation is found in the reflection coefficient; and

using the assessed integrity to maintain the electrical connection.

2. The computer-implemented method of claim 1 , wherein the monitoring of the reflection coefficient takes place under control of a background process during an idle state of the computer system.

3. The computer-implemented method of claim 1 , wherein the sequential-analysis technique corresponds to a sequential probability ratio test.

4. The computer-implemented method of claim 1 , wherein monitoring the reflection coefficient involves:

periodically measuring the reflection coefficient from the electrical connection using time domain reflectometry (TDR); and

digitizing the reflection coefficient.

5. The computer-implemented method of claim 4 , wherein the sequential-analysis technique determines the statistical deviation of the reflection coefficient by comparing the reflection coefficient with previous reflection coefficients measured from the electrical connection.

6. The computer-implemented method of claim 1 , wherein the sequential-analysis technique is applied to the reflection coefficient using a service processor in the computer system.

7. The computer-implemented method of claim 1 , wherein using the assessed integrity to maintain the electrical connection involves at least one of:

performing advanced reliability testing on the electrical connection; and

correcting a fault in the electrical connection corresponding to a source of the statistical deviation.

8. A system for analyzing an electrical connection in a computer system, comprising:

a time domain reflectometry (TDR) circuit configured to monitor a reflection coefficient associated with the electrical connection; and

a sequential-analysis circuit configured to:

apply a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient;

assess the integrity of the electrical connection based on the statistical deviation of the reflection coefficient by verifying the integrity of the electrical connection if the statistical deviation is not found in the reflection coefficient and identifying a degradation risk associated with the electrical connection if the statistical deviation is found in the reflection coefficient; and

use the assessed integrity to maintain the electrical connection.

9. The system of claim 8 , wherein the TDR circuit is configured to monitor the reflection coefficient under control of a background process during an idle state of the computer system.

10. The system of claim 8 , wherein the sequential-analysis technique corresponds to a sequential probability ratio test.

11. The system of claim 8 , wherein the TDR circuit is configured to monitor the reflection coefficient by:

periodically measuring the reflection coefficient from the electrical connection using time domain reflectometry (TDR); and

digitizing the reflection coefficient.

12. The system of claim 11 , wherein the sequential-analysis technique determines the statistical deviation of the reflection coefficient by comparing the reflection coefficient with previous reflection coefficients measured from the electrical connection.

13. The system of claim 8 , wherein the sequential-analysis circuit corresponds to a service processor in the computer system.

14. The system of claim 8 , wherein the TDR circuit corresponds to a digital signal processor (DSP) in the computer system.

15. The system of claim 8 , wherein using the assessed integrity to maintain the electrical connection involves at least one of:

performing advanced reliability testing on the electrical connection; and

correcting a fault in the electrical connection corresponding to a source of the statistical deviation.

16. A computer-readable storage medium storing instructions that when executed by a computer cause the computer to perform a method for analyzing an electrical connection in a computer system, the method comprising:

monitoring a reflection coefficient associated with the electrical connection;

applying a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient;

assessing the integrity of the electrical connection based on the statistical deviation of the reflection coefficient by verifying the integrity of the electrical connection if the statistical deviation is not found and identifying a degradation risk associated with the electrical connection if the statistical deviation is found; and

using the assessed integrity to maintain the electrical connection.

17. The computer-readable storage medium of claim 16 , wherein the monitoring of the reflection coefficient takes place under control of a background process during an idle state of the computer system.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Dec 16, 2015
From: ORACLE USA, INC.; SUN MICROSYSTEMS, INC.; ORACLE AMERICA, INC.
To: ORACLE AMERICA, INC.
Reel/Frame 037311/0150 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2010
From: MCELFRESH, DAVID K.; GROSS, KENNY C.; LOPEZ, LEONCIO D.; VACAR, DAN
To: SUN MICROSYSTEMS, INC.
Reel/Frame 023754/0242 →