IP Library Patent Application 12429125
Patent Application
App. No. 12/429,125

THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF

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Quick Facts
Patent No.
US None
App. No.
12/429,125
Abstract

The present invention relates to a thin film transistor and a manufacturing method thereof. A thin film transistor according to an exemplary embodiment of the present invention includes: a first electrode arranged on a substrate; a second electrode arranged on the substrate and separated from the first electrode; a first ohmic contact arranged on an upper surface of the first electrode; a second ohmic contact arranged on an upper surface of the second electrode; a first buffer member covering a lateral surface of the first electrode and the second electrode; a semiconductor member contacted with an upper surface of the first buffer member, and the first ohmic contact and the second ohmic contact; an insulating layer arranged on the semiconductor member; and a third electrode arranged on the insulating layer, and disposed on the semiconductor member.

Claims (53)

1 . A thin film transistor, comprising:

a first electrode arranged on a substrate;

a second electrode arranged on the substrate and separated from the first electrode;

a first ohmic contact arranged on an upper surface of the first electrode;

a second ohmic contact arranged on an upper surface of the second electrode;

a first buffer member covering a lateral surface of the first electrode and a lateral surface of the second electrode;

a semiconductor member contacted with an upper surface of the first buffer member, the first ohmic contact, and the second ohmic contact;

an insulating layer arranged on the semiconductor member; and

a third electrode arranged on the insulating layer and on the semiconductor member.

2 . The thin film transistor of claim 1 , wherein

the first buffer member comprises silicon oxide or silicon nitride.

3 . The thin film transistor of claim 2 , wherein

the first buffer member covers a portion of the upper surface of the first electrode and the second electrode.

4 . The thin film transistor of claim 3 , wherein

the first buffer member covers the entire portion of the substrate located between the first electrode and the second electrode.

5 . The thin film transistor of claim 4 , wherein

the semiconductor member comprises microcrystalline silicon.

6 . The thin film transistor of claim 5 , wherein

a grain diameter of the microcrystalline silicon is less than 10 μm.

7 . The thin film transistor of claim 6 , wherein

the first ohmic contact and the second ohmic contact comprise polysilicon further comprising an impurity.

8 . The thin film transistor of claim 7 , wherein

a plane shape of the first electrode is the same as a plane shape of the first ohmic contact, and a plane shape of the second electrode is the same as a plane shape of the second ohmic contact.

9 . The thin film transistor of claim 8 , further comprising

a second buffer member arranged on the substrate, wherein the first electrode, the second electrode, and the first buffer member are arranged on the second buffer member.

10 . A method for manufacturing a thin film transistor, comprising:

forming a first electrode and a second electrode on a substrate;

respectively forming a first ohmic contact and second ohmic contact on an upper surface of the first electrode and an upper surface of the second electrode;

forming a buffer member on the first ohmic contact, the second ohmic contact, and the substrate;

forming a semiconductor member on the buffer member, the first ohmic contact, and the second ohmic contact;

forming an insulating layer on the semiconductor member; and

forming a third electrode on the insulating layer.

11 . The method of claim 10 , wherein

the semiconductor member comprises microcrystalline silicon.

12 . The method of claim 11 , wherein

the first ohmic contact and the second ohmic contact comprise polysilicon further comprising an impurity.

13 . The method of claim 10 , wherein

the first ohmic contact, the second ohmic contact, the first electrode, and the second electrode are formed through one photolithography step.

14 . The method of claim 10 , further comprising

before forming the first electrode and the second electrode, forming a buffer layer on the substrate.

15 . An organic light emitting device, comprising:

an organic light emitting element to emit light according to a driving current;

a driving transistor connected to the organic light emitting element to flow the driving current according to a data signal, and

a switching transistor to transmit the data signal to the driving transistor,

wherein the driving transistor comprises:

a first electrode arranged on a substrate;

a second electrode arranged on the substrate and separated from the first electrode;

a first ohmic contact arranged on an upper surface of the first electrode;

a second ohmic contact arranged on an upper surface of the second electrode;

a first buffer member covering a lateral surface of the first electrode and a lateral surface of the second electrode;

a semiconductor member contacted with an upper surface of the first buffer member, the first ohmic contact, and the second ohmic contact;

an insulating layer arranged on the semiconductor member; and

a third electrode arranged on the insulating layer and on the semiconductor member.

Assignments (2)
CHANGE OF NAME Recorded Aug 28, 2012
From: SAMSUNG ELECTRONICS CO., LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 028859/0828 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2009
From: PARK, SEUNG-KYU; GIROTRA, KUNAL SATYABHUSHAN; HUH, JONG-MOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 022611/0966 →