IP Library Granted Patent US 8,546,751
Granted Patent B2
US 8,546,751 · App. 12/430,511 · Granted Oct 1, 2013

3D ion trap as fragmentation cell

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Quick Facts
Patent No.
US 8,546,751
App. No.
12/430,511
Granted
Oct 1, 2013
Kind
B2
Abstract

In a tandem mass spectrometer with mass selector spatially separated from a mass analyzer, ions are fragmented in a three-dimensional RF by electron transfer dissociation. The fragment ions are then extracted from the 3D ion trap and introduced into the mass analyzer. The extraction is accomplished by providing, in one of the ion trap end cap electrodes, an aperture with a relatively large area covered by a conductive mesh or formed by closely spaced smaller apertures. The fragment ions are extracted from the RF ion trap by applying a DC voltage to one of the end cap electrodes.

Claims (17)

1. A tandem-in-space mass spectrometer with a mass selector for selecting parent ions and a mass analyzer spatially separated from the mass selector, the spectrometer comprising:

a 3D RF ion trap formed from a ring electrode and two end cap electrodes connected to sources of RF potential that is constructed to provide fragment ions to the mass analyzer; and

a control system configured to control the 3D RF ion trap to dissociate the selected parent ions by electron transfer reactions and to then extract the parent ions and resulting fragment ions from the 3D RF ion trap and transfer them to the mass analyzer, wherein the 3D RF ion trap is not used as a mass analyzer.

2. The tandem mass spectrometer of claim 1 , wherein the 3D RF ion trap is a nonlinear 3D ion trap.

3. The tandem mass spectrometer of claim 1 , wherein the control system comprises a power supply connected to the 3D RF ion trap and a control unit that controls the power supply so that the 3D RF ion trap acts as the mass selector to select and isolate parent ions.

4. The tandem mass spectrometer of claim 1 , wherein one of the end cap electrodes comprises at least one exit aperture with a diameter of at least 2.5 millimeters for extracting ions from the 3D RF ion trap.

5. The tandem mass spectrometer of claim 4 , wherein the at least one exit aperture is covered by a conductive mesh.

6. The tandem mass spectrometer of claim 4 , wherein the at least one end cap electrode comprises a plurality of adjacent exit apertures wherein the diameters of the plurality of exit apertures total to at least 2.5 millimeters.

7. The tandem mass spectrometer of claim 4 , further comprising an ion storage device located between the at least one exit aperture and the mass analyzer into which the extracted ions enter.

8. The tandem mass spectrometer of claim 1 , further comprising a DC voltage supply connected to at least one of the end cap electrodes that supplies a DC voltage to extract ions from the 3D RF ion trap.

9. A method of operating a tandem-in-space mass spectrometer having a 3D RF ion trap as fragmentation cell, which is not used to mass-analyze parent ions or fragment ions, comprising:

(a) constructing the 3D ion trap with a ring electrode and two end cap electrodes connected to sources of RF potential in such a manner that the trap can provide fragment ions to a mass analyzer;

(b) providing selected positively-charged parent ions to the 3D RF ion trap, and operating the 3D RF ion trap by a control system to dissociate the selected positively-charged parent ions by electron transfer reactions;

(c) constantly supplying negative radical ions for electron transfer dissociation and formation of first generation fragment ions to the 3D RF ion trap;

(d) stopping the supply of negative radical ions to the 3D RF ion trap when a predetermined quantity of first generation fragment ions is present in the 3D RF ion trap;

(e) conveying the first generation fragment ions, together with the other ions present in the 3D RF ion trap, from the 3D RF ion trap to the mass analyzer which is spatially separated from the 3D RF ion trap; and

(f) mass analyzing the first generation fragment ions with the mass analyzer.

Assignments (2)
NUNC PRO TUNC ASSIGNMENT Recorded Jun 18, 2021
From: BRUKER DALTONIK GMBH
To: BRUKER DALTONICS GMBH & CO. KG
Reel/Frame 057209/0070 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2010
From: FRANZEN, JOCHEN
To: BRUKER DALTONIK, GMBH
Reel/Frame 023726/0981 →