Apparatus and system for measuring material thickness
View Patent ↗An apparatus and system for measuring material thickness of a test object. In one embodiment, the apparatus can include a measurement probe that can have a plurality of transducer elements that can include transmitter elements and receiver elements arranged, respectively, in on a first side and a second side of a gap. The first side and the second side can form a scan area with at least one active group that can have at least one transmitter element and at least one receiver element, which can be separated from the transmitter element in a spaced relationship.
1. A measurement system, comprising:
a measurement probe including a delay block having a longitudinal axis and a plurality of transducer elements acoustically coupled to the delay in a manner forming an active group, the active group including a transmitter side for generating an ultrasound beam and a receiver side for receiving an echo signal, the receiver side in a spaced relationship with the transmitter side, the spaced relationship forming a gap about the longitudinal axis, the gap including a cross-talk barrier disposed in a manner acoustically separating the transmitter side and the receiver side; and
a test instrument coupled to the measurement probe, the test instrument including an interface controlling at least one transducer element in the active group in a manner causing a first parameter of the ultrasound beam,
wherein the receiver side includes at least one transducer element responsive to the echo that corresponds to the ultrasound beam, and
wherein the measurement probe includes a first active group and a second active group that has a number of transducer elements that is different from the first active group.
2. The measurement system according to claim 1 , wherein the number of transducer elements is selected in accordance with the first parameter of the ultrasound beam.
3. The measurement system according to claim 1 , wherein each of the receiver side and the transmitter side includes a plurality of the transducer elements.
4. The measurement probe according to claim 3 , wherein the transducer elements include an inner transducer element located a first distance from the longitudinal axis, and at least one outer transducer element located a second distance from the longitudinal axis that is greater than the first distance, the first distance and second distance measured substantially perpendicular to the longitudinal axis.
5. The measurement probe according to claim 1 , wherein the spaced relationship is less than about 3 mm.