IP Library Granted Patent US 8,098,374
Granted Patent B2
US 8,098,374 · App. 12/444,244 · Granted Jan 17, 2012

Highly sensitive spectroscopic unit

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Quick Facts
Patent No.
US 8,098,374
App. No.
12/444,244
Granted
Jan 17, 2012
Kind
B2
Abstract

The invention is directed to a highly sensitive spectrum analysis unit with a diffraction grating, wherein a parallel light bundle having a wavelength range impinges on a diffraction grating which splits the different wavelengths into spectra by diffraction in first directions, and wavelength partial ranges of the spectrally split light bundle can be focused on a detector row by means of camera optics, and evaluation electronics are connected to the detector row and acquire the generated spectrum as information and display it. The invention is characterized in that the light bundle passes a first optical element, and then wavelength partial ranges of a spectrally split light bundle impinge on respective partial regions of a diffraction grating, the diffraction grating having the same grating constant across all partial regions and a changing profile shape, the profile shapes generating different blaze wavelengths that lie in the respective wavelength partial ranges.

Claims (19)

1. A highly sensitive spectrum analysis unit with a diffraction grating;

wherein a parallel light bundle having a wavelength range impinges on the diffraction grating which splits the different wavelengths into spectra by diffraction in first directions;

wherein wavelength partial ranges of the spectrally split light bundle can be focused on a detector row by means of camera optics; and

wherein evaluation electronics are connected to the detector row and acquire the generated spectrum as information and display it;

wherein the light bundle passes through a first optical clement, and then wavelength partial ranges of a spectrally split light bundle impinge on respective partial regions of the diffraction grating;

wherein the diffraction grating has the same grating constant across all partial regions and a changing profile shape; and

wherein the profile shapes generate different blaze wavelengths that lie in the respective wavelength partial ranges.

2. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 1 ;

wherein the first optical element is a beamsplitter.

3. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 1 ;

wherein the first optical element is a dispersive element.

4. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 3 ;

wherein the dispersive element is a dispersion prism.

5. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 1 ;

wherein the diffraction grating has a number of partial regions corresponding to the number of wavelength ranges.

6. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 1 ;

wherein the diffraction grating has a constantly changing profile shape which is adapted to the wavelength range of the incident light bundle.

7. The highly sensitive spectrum analysis unit with a diffraction grating according to claim 1 ;

wherein the analysis unit is used as a detector in a laser scanning microscope.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2020
From: CARL ZEISS MICROSCOPY GMBH
To: CARL ZEISS SPECTROSCOPY GMBH
Reel/Frame 051821/0978 →
CHANGE OF NAME Recorded Jun 14, 2013
From: CARL ZEISS MICROIMAGING GMBH
To: CARL ZEISS MICROSCOPY GMBH
Reel/Frame 030610/0269 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2009
From: WOLLESCHENSKY, RALF; DOBSCHAL, HANS-JUERGEN; STEINER, REINHARD
To: CARL ZEISS MICROIMAGING GMBH
Reel/Frame 022501/0622 →