IP Library Granted Patent US 8,519,504
Granted Patent B2
US 8,519,504 · App. 12/453,238 · Granted Aug 27, 2013

Electrode for semiconductor chip and semiconductor chip with the electrode

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Quick Facts
Patent No.
US 8,519,504
App. No.
12/453,238
Granted
Aug 27, 2013
Kind
B2
Abstract

In an n-type semiconductor layer that contains gallium (Ga), contact resistance is to be suppressed at a low level. An n-side electrode is provided on a surface of the n-type semiconductor layer containing Ga. The electrode includes a metal layer having a Ga content of equal to or more than 1 at % and equal to or less than 25 at %. The metal layer is disposed in contact with the n-type semiconductor layer.

Claims (16)

1. A semiconductor laser, comprising:

an n-side electrode to be formed on a surface of an n-type semiconductor layer that comprises gallium (Ga),

wherein said n-side electrode comprises:

a metal layer having a Ga content of equal to or more than 1 at% and equal to or less than 10 at%,

wherein said metal layer is disposed in contact with said n-type semiconductor layer, and

wherein a metal predominantly composing said metal layer is Ti.

2. The semiconductor laser according to claim 1 , wherein said metal layer includes a metal material having a Ga content of equal to or more than 1 at% and equal to or less than 10 at%.

3. The semiconductor laser according to claim 1 , wherein said n-type semiconductor layer includes a III-V compound.

4. The semiconductor laser according to claim 1 , wherein said metal predominantly composing said metal layer has a work function of equal to or less than 5 eV.

5. The semiconductor laser according to claim 1 , wherein said n-type semiconductor layer is an n-type nitride semiconductor layer.

6. The semiconductor laser according to claim 1 , wherein said n-side electrode further comprises a gold-plating layer disposed above the metal layer.

7. The semiconductor laser according to claim 6 , wherein said n-side electrode further comprises a barrier layer disposed between the gold-plating layer and the metal layer.

8. The semiconductor laser according to claim 6 , wherein said n-side electrode further comprises a gold layer and a platinum layer disposed between the gold-plating layer and the metal layer.

9. The semiconductor laser according to claim 1 , wherein said n-type semiconductor layer comprises Ti 3 Ga or Ti 2 Ga.

10. A recording and reproducing apparatus, comprising a semiconductor laser according to claim l.

11. The semiconductor laser according to claim 1 , wherein a thickness of the metal layer is 100 Å or more.

Assignments (3)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025193/0174 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2009
From: TADA, KENTARO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022676/0252 →