IP Library Granted Patent US 8,251,576
Granted Patent B1
US 8,251,576 · App. 12/455,398 · Granted Aug 28, 2012

Cold lift-off test for strength of film stack subjected to thermal loading

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Quick Facts
Patent No.
US 8,251,576
App. No.
12/455,398
Granted
Aug 28, 2012
Kind
B1
Abstract

Multilayer articles such as thin-film solar cells can be effectively tested under thermal load in a mini-module that includes a chamber or enclosure in which one or more laminated multilayer articles are housed. The inner dimensions of the chamber, at least along the axis that is perpendicular to the plane defined by the laminated solar cells, are configured to remain substantially constant during testing. Cooling the laminated solar cells in the mini-module device causes the encapsulant material to shrink and thereby induces accelerated failures in the laminated solar cells and associated structures. A technique of detecting the presence of defects or failures is near infrared radiation thermography wherein NIR images of the laminated solar cells are taken during the cooling process. The color patterns manifested from the cooled laminated solar cells can reveal the location, nature and extent of the defect or failure.

Claims (10)

1. A method of testing a solar cell that comprises the steps of:

positioning the solar cell within a chamber having defined inner dimensions;

laminating the solar cell with an encapsulant that is added to the chamber;

cooling the laminated solar cell to a temperature sufficient to cause defects to appear wherein the inner dimensions of the chamber, at least along an axis that is perpendicular to a plane defined by the solar cell, remain substantially constant during cooling; and

detecting the presence of defects in the solar cell.

2. The method of claim 1 wherein the laminated solar cell is cooled to about −80° C. in less than about 2 hours.

3. The method of claim 2 further comprising the step of maintaining the laminated solar cell at the predetermined temperature for at least about 10 minutes.

4. The method of claim 1 further comprising the step of noting the temperature at which the first defect is detected.

5. The method of claim 1 wherein the step of detecting the presence of defects employs infrared thermography.

6. The method of claim 1 wherein the solar cell is electrically connected to a busbar.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 29, 2016
From: APOLLO PRECISION FUJIAN LIMITED
To: BEIJING APOLLO DING RONG SOLAR TECHNOLOGY CO., LTD.
Reel/Frame 037855/0478 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2015
From: HANERGY HOLDING GROUP LTD.
To: APOLLO PRECISION FUJIAN LIMITED
Reel/Frame 034826/0132 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2014
From: MIASOLE
To: HANERGY HOLDING GROUP LTD.
Reel/Frame 032092/0694 →
RELEASE OF SECURITY INTEREST Recorded Jan 7, 2013
From: PINNACLE VENTURES, L.L.C.
To: MIASOLE
Reel/Frame 029579/0494 →
SECURITY AGREEMENT Recorded Aug 28, 2012
From: MIASOLE
To: PINNACLE VENTURES, L.L.C.
Reel/Frame 028863/0887 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 5, 2009
From: HARDIKAR, KEDAR; KRAJEWSKI, TODD
To: MIASOLE
Reel/Frame 023077/0547 →