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App. No. 12/458,151 · Confirmation No. 9682

Non-volatile semiconductor memory device, and manufacture method for non-volatile semiconductor memory device

Inventor: Kenichiro Nakagawa
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2013-02-21 ABN Abandonment 2 View
2012-07-24 CTNF Non-Final Rejection 9 View
2012-07-24 892 List of references cited by examiner 1 View
2012-07-24 SRFW Search information including classification, databases and other search related notes 1 View
2012-07-24 1449 List of References cited by applicant and considered by examiner 1 View
2012-07-24 SRNT Examiner's search strategy and results 2 View
2012-07-24 FWCLM Index of Claims 1 View
2012-01-20 ELC. Response to Election / Restriction Filed 1 View
2012-01-20 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2011-12-22 CTMS Miscellaneous Action with shortened statutory period (SSP) 2 View
2011-11-30 ELC. Response to Election / Restriction Filed 1 View
2011-11-30 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2011-11-10 CTRS Requirement for Restriction/Election 7 View
2011-11-10 FWCLM Index of Claims 1 View
2010-01-07 NTC.PUB Notice of Publication 1 View
2009-07-30 PD.FILED.E Priority Documents electronically retrieved by USPTO from a participating IP Office 61 View
2009-07-22 APP.FILE.REC Filing Receipt 3 View
2009-07-01 TRNA Transmittal of New Application 8 View
2009-07-01 SPEC Specification 68 View
2009-07-01 CLM Claims 8 View
2009-07-01 ABST Abstract 1 View
2009-07-01 DRW Drawings-only black and white line drawings 32 View
2009-07-01 OATH Oath or Declaration filed 2 View
2009-07-01 TRAN.LET Transmittal Letter 1 View
2009-07-01 136A Authorization for Extension of Time all replies 8 View
2009-07-01 IDS Information Disclosure Statement (IDS) Form (SB08) 1 View
2009-07-01 FOR Foreign Reference 40 View
2009-07-01 WFEE Fee Worksheet (SB06) 1 View
2009-07-01 WFEE Fee Worksheet (SB06) 1 View
2009-07-01 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
12/458,151
Filed
2009-07-01
Pub. No.
US20100001338A1
Examiner
LI, MEIYA
Art Unit
2811