Method and system for calibrating an electronic lapping guide for a beveled pole in a magnetic recording transducer
View Patent ↗A method and system for calibrating an electronic lapping guide (ELG) for transducer(s) having an ABS and a magnetic structure are described. The magnetic structure has a desired thickness, a bevel, and a flare point a distance from the ABS. The method and system include providing at least three ELGs. A first ELG has first and second edges first and second distances from the ABS. A second ELG has third and fourth edges third and second distances from the ABS. A third ELG has fifth and sixth edges fourth and second distances from the ABS. The first, third, and fourth distances correspond to a stripe height and an offset. The first, third, and fourth distance and/or the second distance corresponds to an intersection between the bevel and the desired thickness. The method and system also include measuring resistances of the ELGs, and calibrating the ELG(s) utilizing the offset and resistances.
1. A method for calibrating an electronic lapping guide (ELG) for least one transducer having an air-bearing surface (ABS) and a magnetic structure, the magnetic structure having a desired thickness, a bevel, and a flare point a distance from the ABS, the method further comprising:
providing at least a first ELG, a second ELG, and a third ELG, the first ELG having a first edge a first distance from the ABS and a second edge a second distance from the ABS, at least one of the first distance and the second distance corresponding to an intersection between the bevel and the desired thickness, the second ELG having a third edge a third distance from the ABS and a fourth edge the second distance from the ABS, at least one of the third distance and the second distance corresponding to the intersection between the bevel and the desired thickness, the third ELG having a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS, the first distance, the third distance, and the fourth distance corresponding to a stripe height and an offset, at least one of the fourth distance and the second distance corresponding to the intersection between the bevel and the desired thickness;
measuring resistances of the first ELG, the second ELG, and the third ELG; and
calibrating the at least one of the first ELG, the second ELG, and the third ELG utilizing the offset and the resistances.
2. The method of claim 1 wherein the magnetic structure is a pole having the bevel and a plurality of sides, the plurality of sides having a reverse angle.
3. The method of claim 1 further wherein the step of calibrating further includes:
determining the stripe height, a target resistance, and a sheet resistance of the at least one of the first ELG, the second ELG and the third ELG.
4. The method of claim 3 wherein the step of providing the at least the first ELG, the second ELG, and a third ELG utilizes a reticle to provide a mask and wherein the step of providing the at least the first ELG, the second ELG, and a third ELG further includes:
shifting the reticle between the first ELG, the second ELG, and the third ELG to provide the offset between the first ELG, the second ELG, and the third ELG in the mask.
5. The method of claim 1 wherein the second distance corresponds to an intersection between the bevel and the desired thickness.
6. The method of claim 1 wherein the first distance, the third distance, and the fourth distance each corresponds to an intersection between the bevel and the desired thickness.
7. The method of claim 1 wherein the first distance is the third distance minus the offset and the fourth distance is the third distance plus the offset.
8. The method of claim 1 wherein the step of providing the at least the first ELG, the second ELG and the third ELG further includes:
providing a fourth ELG having a seventh edge a fifth distance from the ABS and an eighth edge a second distance from the ABS, at least one of the seventh distance and the second distance corresponding to an intersection between the bevel and the desired thickness.
9. The method of claim 8 wherein the step of measuring the resistances further includes:
measuring resistance of the fourth ELG.
10. The method of claim 9 wherein the step of calibrating the at least one ELG further includes
calibrating the at least one ELG utilizing the resistance.
11. A method for calibrating an electronic lapping guide (ELG) for least one transducer having an air-bearing surface (ABS) and a pole, the pole having a desired thickness, a bevel, and a flare point a distance from the ABS, the method further comprising:
providing a resistive sheet substantially coplanar with the desired thickness;
providing at least a first ELG, a second ELG, and a third ELG from the resistive sheet, the first ELG having a first edge a first distance from the ABS and a second edge a second distance from the ABS, at least one of the first distance and the second distance corresponding to an intersection between the bevel and the desired thickness, the second ELG having a third edge a third distance from the ABS and a fourth edge the second distance from the ABS, at least one of the third distance and the second distance corresponding to the intersection between the bevel and the desired thickness, the third ELG having a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS, the first distance, the third distance, and the fourth distance corresponding to a stripe height and an offset, at least one of the fifth distance and the second distance corresponding to the intersection between the bevel and the desired thickness, the first distance being the third distance plus the offset, the fourth distance being the third distance minus the offset, the step of providing the at least the first ELG, the second ELG, and a third ELG utilizing a reticle to provide a mask, the reticle being shifted between the first ELG, the second ELG, and the third ELG to provide the offset between the first ELG, the second ELG, and the third ELG in the mask;
measuring resistances of the first ELG, the second ELG, and the third ELG; and
calibrating the at least one of the ELG, the second ELG and the third ELG utilizing the offset and the resistances.