System and method of measuring and mapping three dimensional structures
View Patent ↗A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.
1. A system, comprising:
a projecting optical system adapted to project light onto an object;
a pre-correction system adapted to compensate a light beam to be projected onto the object for at least one aberration in the object, the pre-correction system being positioned in between the projecting optical system and the object and comprising a telescope having two lenses, at least one of the lenses being movable;
an imaging system adapted to collect light scattered by the object;
a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light;
means for adjusting the compensation applied to the light beam by the pre-correction system to thereby change the wavefront of the light received by the wavefront sensor;
means for stitching together the sensed wavefronts of the light received by the wavefront sensor for each compensation to map a surface of the object; and
a dynamic range limiting aperture disposed in an optical path between the two lenses and being adapted to insure that the wavefront sensor only sees light within a dynamic range of the system;
wherein the means for stitching further comprises a processor, the processor further being adapted to move the movable lens to a plurality of positions and to stitch together the sensed wavefronts of the light received by the wavefront sensor at each of the positions.
2. The system of claim 1 , wherein the wavefront sensor is a Shack-Hartmann wavefront sensor.
3. A system, comprising:
a projecting optical system adapted to project light onto an object;
a pre-correction system comprising telescope having two lenses, at least one of the lenses being movable, the pre-correction system adapted to compensate a light beam to be projected onto the object for at least one aberration in the object without reflecting the light beam, the pre-correction system being positioned in between the projecting optical system and the object;
an imaging system adapted to collect light scattered by the object;
a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light;
a dynamic-range-limiting aperture disposed in an optical path between the two lenses and being adapted to insure that the wavefront sensor only sees light within a dynamic range of the system;
means for adjusting the compensation applied to the light beam by the pre-correction system to thereby change the wavefront of the light received by the wavefront sensor; and
means for stitching together the sensed wavefronts of the light received by the wavefront sensor for each compensation to map a surface of the object, the means for stitching comprising a processor adapted to move the movable lens to a plurality of positions and to stitch together the sensed wavefronts of the light received by the wavefront sensor at each of the positions.
4. The system of claim 3 , wherein the wavefront sensor is a Shack-Hartmann wavefront sensor.