IP Library Granted Patent US 8,195,855
Granted Patent B2
US 8,195,855 · App. 12/477,545 · Granted Jun 5, 2012

Bi-directional multi-drop bus memory system

Assignees: Hynix Semiconductor Inc.; Seoul National University Industry Foundation
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Quick Facts
Patent No.
US 8,195,855
App. No.
12/477,545
Granted
Jun 5, 2012
Kind
B2
Abstract

A bus system includes a plurality of stubs; a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules; a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors; and a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs, wherein the first and the second serial loads are determined to be impedance matched at each transmission line terminal of the stubs.

Claims (331)

1. A bus system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled to a corresponding one of the stubs;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors; and

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

nZ

0

Zb

[

n

]

=

Z

0

/

n

,

Zb

[

0

]

=

0

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has ‘0’ or a positive integer; and Z0 denotes a characteristic impedance of the bus system.

2. The bus system of claim 1 , wherein a plurality of memory modules, each of which includes at least one memory chip, are correspondingly coupled to the stubs through the corresponding connectors; and a memory controller is coupled to the bus system.

3. The bus system of claim 2 , wherein the memory chips and the memory controller are on-die terminated.

4. The bus system of claim 2 , wherein each of the memory chips includes a signal driver that are line-matched with the memory modules.

5. The bus system of claim 2 , wherein the memory controller includes a signal driver that is line-matched with the bus system.

6. The bus system of claim 2 , wherein the first and second serial loads are implemented with a printed circuit board (PCB) embedded load.

7. The bus system of claim 2 , wherein each of the memory modules includes:

a first load, coupled to a corresponding one of the connectors, having a characteristic impedance of the memory modules;

a second load, coupled to the first load, having an equivalent impedance with the first load;

a first memory chip coupled to the second load;

a third load, coupled in parallel with the second load, having the equivalent impedance with the first load;

a second memory chip coupled to the third load; and

a fourth load, serially coupled between the first load and a common node of the second and third loads, having a half impedance of the first load.

8. A bus system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors;

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs; and

a parallel resistor of

Z

1

Z

2

Z

2

-

Z

1

 connected to a final one of the stubs,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

nZ

1

,

Zc

[

0

]

=

0

Zb

[

n

]

=

Z

1

2

(

n

+

1

)

Z

1

+

Z

2

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has a positive integer; Z1 denotes a characteristic impedance of the bus system; and Z2 denotes a characteristic impedance of the memory module.

9. The bus system of claim 8 , wherein an on-die terminated memory controller is coupled to the bus system.

10. The bus system of claim 8 , wherein each of the memory modules includes at least one on-die terminated memory chip that is line-matched with the memory module.

11. The bus system of claim 9 , wherein the on-die terminated memory controller includes a signal driver that is line-matched with the bus system.

12. The bus system of claim 8 , wherein the first and second serial loads are implemented with a PCB embedded load.

13. The bus system of claim 8 , wherein each of the memory modules includes:

a first load, coupled to a corresponding one of the connectors, having a characteristic impedance of the memory modules;

a second load, coupled to the first load, having an equivalent impedance with the first load;

a first memory chip coupled to the second load;

a third load, coupled in parallel with the second load, having the equivalent impedance with the first load;

a second memory chip coupled to the third load; and

a fourth load, serially coupled between the first load and a common node of the second and third loads, having a half impedance of the first load.

14. A bus system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors; and

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

(

n

+

1

)

Z

1

-

Z

2

Zb

[

n

]

=

Z

1

n

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has ‘0’ or a positive integer; Z1 denotes a characteristic impedance of the bus system; and Z2 denotes a characteristic impedance of the memory module.

15. The bus system of claim 14 , wherein an on-die terminated memory controller is coupled to the bus system.

16. The bus system of claim 14 , wherein each of the memory modules includes at least one on-die terminated memory chip that is line-matched with the memory module.

17. The bus system of claim 15 , wherein the on-die terminated memory controller includes a signal driver that is line-matched with the bus system.

18. The bus system of claim 14 , wherein the first and second serial loads are implemented with a PCB embedded load.

19. The bus system of claim 14 , wherein each of the memory modules includes:

a first load, coupled to a corresponding one of the connectors, having a characteristic impedance of the memory modules;

a second load, coupled to the first load, having an equivalent impedance with the first load;

a first memory chip coupled to the second load;

a third load, coupled in parallel with the second load, having the equivalent impedance with the first load;

a second memory chip coupled to the third load; and

a fourth load, serially coupled between the first load and a common node of the second and third loads, having a half impedance of the first load.

20. A memory system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors; and

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

nZ

0

Zb

[

n

]

=

Z

0

/

n

,

Zb

[

0

]

=

0

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has ‘0’ or a positive integer; and Z0 denotes the characteristic impedance of the transmission line.

21. A memory system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors;

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs; and

a parallel resistor of

Z

1

Z

2

Z

2

-

Z

1

 connected to the final stub,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

n

Z

1

,

Zc

[

0

]

=

0

Zb

[

n

]

=

Z

1

2

(

n

+

1

)

Z

1

+

Z

2

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has a positive integer; Z1 denotes the characteristic impedance of the transmission line; and Z2 denotes a characteristic impedance of the memory module.

22. A memory system, comprising:

a plurality of stubs;

a plurality of connectors, each of which is serially coupled between a corresponding one of the stubs and a corresponding one of memory modules;

a plurality of first serial loads, each of which is serially coupled to a corresponding one of the connectors; and

a plurality of second serial loads, each of which is serially coupled to characteristic impedance of a transmission line of a corresponding one of the stubs,

wherein the first and second serial loads are determined by the following equation:

Zc

[

n

]

=

(

n

+

1

)

Z

1

-

Z

2

Zb

[

n

]

=

Z

1

n

where, Zc[n] denotes the first serial loads; the Zb[n] denotes the second serial loads; n denotes an index allocated for each of the stubs and has ‘0’ or a positive integer; Z1 denotes the characteristic impedance of the transmission line; and Z2 denotes a characteristic impedance of the memory module.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE LIST OF ASSIGNEES TO ADD ONE MORE ASSIGNEE PREVIOUSLY RECORDED ON REEL 022775 FRAME 0200. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 22, 2010
From: JEONG, DEOG-KYOON; KIM, SUHWAN; SHIN, WOO-YEOL; LIM, DONG-HYUK; OH, IC-SU
To: HYNIX SEMICONDUCTOR, INC.; SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION
Reel/Frame 023968/0297 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2009
From: JEONG, DEOG-KYOON; KIM, SUHWAN; SHIN, WOO-YEOL; LIM, DONG-HYUK; OH, IC-SU
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 022775/0200 →
Priority Claims (1)
KR 10-2008-0055220 · Jun 12, 2008 · national
Continuity (1)
Related Publication 20090313410A1 · Dec 17, 2009