Optical devices, spectroscopic systems and methods for detecting scattered light
View Patent ↗Certain examples described herein are directed to optical devices and systems that include first and second optical elements. In some examples, the first optical element may be configured to pass light received from an excitation source, and the second optical element may be optically coupled to the first optical element and may be configured to reflect incident light from the first optical element back to the first optical element and configured to pass the light reflected from the first optical element. Methods using the devices and systems are also described.
1. An optical device comprising first and second optical elements, the first optical element angle-tuned to pass light received from an excitation source, and the second optical element optically coupled to the first optical element and angle-tuned to reflect incident light from the first optical element back to the first optical element and configured to pass light reflected from the first optical element, wherein the first and second optical elements are both long pass filters.
2. The optical device of claim 1 , further comprising a collection device configured to receive sample light incident on the first and second optical elements and passed by the first and second optical elements to the collection device.
3. The optical device of claim 2 , further comprising a detector optically coupled to the collection device.
4. The optical device of claim 1 , in which the long pass filters are configured to pass scattered or emitted light from a sample to a detector optically coupled to the sample.
5. The optical device of claim 2 , in which the collection device comprises an optical fiber bundle.
6. The optical device of claim 3 , in which the detector is a charge-coupled device.
7. The optical device of claim 1 , in which the optical device is configured to detect Raman scattered light.
8. A spectroscopic system, comprising:
an excitation source configured to provide light, the excitation source comprising a plurality of optical fibers;
a first optical element optically coupled to the excitation source and configured to pass light received from the excitation source, each optical fiber of the excitation source configured to provide light to the first optical element;
a second optical element optically coupled to the first optical element, the first and second optical elements each angle-tuned such that the second optical element is configured to reflect incident light from the first optical element back to the first optical element and to pass light reflected from the first optical element;
a sample space optically coupled to the second optical element and configured to receive the light passed by the second optical element; and
a collection device optically coupled to the second optical element, in which the first and second optical elements are further configured to receive emitted light from a sample in the sample space and to provide the emitted light to the collection device.
9. The spectroscopic system of claim 8 , in which the collection device comprises a plurality of optical fibers each configured to receive a light emission from a different sample in a multi-sample device in the sample space.
10. The spectroscopic system of claim 9 , further comprising a detector optically coupled to the plurality of optical fibers each configured to receive the light emission.
11. The spectroscopic system of claim 8 , in which the spectroscopic system is configured to detect Raman scattered light.
12. The spectroscopic system of claim 8 , wherein the first and second optical elements are both long pass filters.
13. A system comprising:
means for providing light to a sample space;
a first optical path between the means for providing light and the sample space; and
first and second optical means in the first optical path, the first optical means for passing light received from the means for providing light, and the second optical means optically coupled to the first optical means, the second optical means for reflecting incident light from the first optical means back to the first optical means and for passing the light reflected from the first optical means to the sample space.
14. The system of claim 13 , further comprising means for detecting light emitted from the sample space, wherein said means for detecting light is optically coupled to the sample space through a second optical path and wherein the first optical means and the second optical means are in the second optical path and pass emitted or scattered light from the sample space to the means for detecting along the second optical path.
15. The system of claim 14 , wherein said first optical means and said second optical means are each a long pass filter.
16. The system of claim 15 , wherein said means for providing light comprises an optical fiber bundle optically coupled to a laser.
17. The system of claim 16 , wherein said means for detecting light comprises an optical fiber bundle optically coupled to a charge-coupled device.
18. A method comprising:
providing a sample space;
providing an excitation source comprising a plurality of optical fibers configured to provide light to the sample space;
selecting a first angle for a first optical element;
selecting a second angle for a second optical element that is optically coupled to the first optical element;
angle tuning the first and second optical elements by adjusting the selected first and second angles such that the first optical element is configured to pass light received from the excitation source, and the second optical element is configured to reflect incident light from the first optical element back to the first optical element and configured to pass the light reflected from the first optical element to the sample space;
providing light to the first optical element with the plurality of optical fibers of the excitation source;
reflecting incident light from the first optical element back to the first optical element:
passing light reflected from the first optical element to the sample space; and
detecting emitted light from the sample space with a detector.
19. The method of claim 18 , wherein the first and second optical elements are both long pass filters.
20. A method of detecting emitted or scattered light comprising
configuring a system with at least a first and second long pass filter;
angle-tuning the first and second long pass filters such that the first long pass filter is configured to pass light received from an excitation source, and the second long pass filter is configured to reflect incident light from the first long pass filter back to the first long pass filter and configured to pass the light reflected from the first long pass filter to a sample; and
detecting emitted light from the sample with a detector.