Method and apparatus to facilitate using multiple radiation-detection views to differentiate one material from another
View Patent ↗At least three radiation-detection views are used to facilitate identifying material as comprises an object being assessed along a beam path relative to that object. This comprises developing a first radiation-detection view ( 101 ) as corresponds to the material along the beam path, a second radiation-detection view ( 102 ) as corresponds to the material along substantially the beam path, and at least a third radiation-detection view ( 103 ) as corresponds to the material along substantially the beam path. At least one of the source spectra and detector spectral responses used for these radiation-detection views are different from one another for each view. One then uses ( 104 ) these radiation-detection views to identify the material by, at least in part, differentiating the material from other possible materials.
1. A method to facilitate identifying material as comprises an object being assessed along a beam path, relative to the object, comprising:
developing a first radiation-detection view as corresponds to the material along the beam path using a first interlaced-energy x-ray pulse and a first detector of a stacked detector;
developing a second radiation-detection view as corresponds to the material along substantially the beam path using the first interlaced-energy x-ray pulse and a second detector of the stacked detector, wherein the second detector has a different spectral response than the first detector;
developing at least a third radiation-detection view as corresponds to the material along substantially the beam path using a second interlaced-energy x-ray pulse and the first detector of the stacked detector, wherein the second interlaced-energy x-ray pulse has a different source spectra as compared to the first interlaced-energy x-ray pulse and wherein additional radiation-detection views may be developed but without using additional interlaced-energy x-ray pulses having a different source spectra as compared to the first and second interlaced-energy x-ray pulses;
using the first, second, and third radiation-detection views to identify the material by, at least in part, differentiating the material from other possible materials.
2. The method of claim 1 wherein the stacked detector comprises a stacked detector having at least two in-beam detectors.
3. The method of claim 1 wherein the stacked detector comprises a stacked detector having photo-sensitive detectors that are protected from the beam path.
4. The method of claim 3 wherein the stacked detector having photo-sensitive detectors that are protected from the beam path comprises a stacked detector having photo-sensitive detectors that are disposed external to the beam path.
5. The method of claim 1 wherein the stacked detector comprises a stacked detector comprised of at least two detectors each having different conversion materials as compared to one another.
6. The method of claim 1 wherein the stacked detector comprises a stacked detector having a first scintillator that is functionally separated from a second scintillator by non-scintillating material, where the non-scintillating material acts to filter beam spectrum between the first and second scintillators.
7. The method of claim 1 further comprising:
using multiple-channel electronics to process corresponding detector signals to thereby reduce crosstalk between radiation-detection views separated in time.
8. The method of claim 1 wherein the stacked detector comprises a stacked detector having a first scintillator and a second scintillator that are comprised of substantially identical materials.
9. The method of claim 1 wherein the stacked detector comprises a stacked detector having a first scintillator that is comprised of a first material and a second scintillator that is comprised of a second material, wherein the first material is different from the second material.
10. An apparatus to facilitate identifying material as comprises an object being assessed along a beam path, relative to the object, comprising:
an interlaced-energy pulsed x-ray beam source configured to provide first and second interlaced-energy x-ray pulses having different source spectra from one another along the beam path;
a stacked detector comprising a first and second detector disposed along the beam path, wherein the first and second detector have a different spectral response from one another;
a memory having stored therein information regarding:
a first radiation-detection view as corresponds to the material along the beam path formed using the first interlaced-energy x-ray pulse from the interlaced-energy pulsed x-ray beam source and the first detector of the stacked detector;
a second radiation-detection view as corresponds to the material along substantially the beam path formed using the first interlaced-energy x-ray pulse from the interlaced-energy pulsed x-ray beam source and the second detector of the stacked detector;
at least a third radiation-detection view as corresponds to the material along substantially the beam path formed using the second interlaced-energy x-ray pulse from the interlaced-energy pulsed x-ray beam source and the first detector of the stacked detector, wherein additional radiation-detection views may be included but wherein the additional radiation-detection views are not formed using other than one of the first and second interlaced-energy x-ray pulses;
a control circuit operably coupled to the memory and being configured to use the first, second, and third radiation detection views to identify the material by, at least in part, differentiating the material from other possible materials.
11. The apparatus of claim 10 wherein the stacked detector comprises a stacked detector having photo-sensitive detectors that are protected from the beam path.
12. The apparatus of claim 11 wherein the stacked detector having photo-sensitive detectors that are protected from the beam path comprises a stacked detector having photo-sensitive detectors that are disposed external to the beam path.
13. The apparatus of claim 10 wherein the stacked detector comprises a stacked detector comprised of at least two detectors each having different conversion materials as compared to one another.
14. The apparatus of claim 10 wherein the stacked detector comprises a stacked detector having a first scintillator that is functionally separated from a second scintillator by non-scintillating material, where the non-scintillating material acts to filter beam spectrum between the first and second scintillators.
15. The apparatus of claim 10 wherein the stacked detector comprises a stacked detector having a first scintillator and a second scintillator that are comprised of substantially identical materials.
16. The apparatus of claim 10 wherein the stacked detector comprises a stacked detector having a first scintillator that is comprised of a first material and a second scintillator that is comprised of a second material, wherein the first material is different from the second material.