Off-Chip Supply Of Calibration Data

1 . A computing device comprising:

a network interface;

processing logic; and

memory accessible to the processing logic, the memory comprising a calibration data module configured to:

receive calibration data of an integrated circuit of the computing device from a server coupled to a remote database via the network interface;

store the calibration data in the memory; and

calibrate the integrated circuit based on the calibration data.

2 . The computing device of claim 1 , wherein the calibration data module is configured to send a request to the server for the calibration data.

3 . The computing device of claim 2 , wherein the memory further comprises error correction software to:

detect errors in operation of the computing device; and

invoke the calibration data module to send the request for the calibration data of the integrated circuit to the server when an error in operation of the computing device relates to the integrated circuit.

4 . The computing device of claim 2 , wherein the calibration data module is configured to send the request for the calibration data of the integrated circuit during a start-up procedure of the computing device.

5 . The computing device of claim 2 , wherein the request for the calibration data of the integrated circuit is sent to the server in response to user input received via input/output devices of the computing device.

6 . The computing device of claim 1 , wherein the calibration data module is configured to receive updated calibration data from the server.

7 . The computing device of claim 1 , wherein the calibration data is included in a software patch for the computing device.

8 . The computing device of claim 1 , wherein the calibration data module is configured to receive calibration data from the server for an additional integrated circuit of the computing device.

9 . A method comprising:

incorporating an integrated circuit into a computing device;

retrieving an identifier of the integrated circuit;

accessing calibration data of the integrated circuit from a computer-readable storage medium based on the identifier, wherein the computer-readable storage medium is separate from the computing device and separate from the integrated circuit; and

writing the calibration data to memory of the computing device.

10 . The method of claim 9 , wherein the identifier of the integrated circuit is retrieved by reading the identifier from an electronic fuse of the integrated circuit.

11 . The method of claim 9 , wherein the identifier of the integrated circuit is retrieved by reading a bar code associated with the integrated circuit.

12 . The method of claim 9 , wherein the identifier is retrieved from a radio-frequency identification (RFID) tag associated with the integrated circuit.

13 . The method of claim 9 , wherein the computer-readable storage medium is included in a database coupled to a remote server.

14 . The method of claim 13 , wherein the database is maintained by one or more computing device manufacturers, by one or more integrated circuit manufacturers, by a third-party entity, or a combination thereof.

15 . The method of claim 9 , wherein the calibration data is customized before writing the calibration data to the memory of the computing device.

16 . The method of claim 9 , wherein the calibration data is supplied by a manufacturer of the integrated circuit.

17 . One or more computer-readable storage media comprising computer executable instructions that, when executed by a computer, perform acts comprising:

generating calibration data for an integrated circuit;

writing a unique identifier to the integrated circuit; and

storing calibration data on an additional computer-readable storage medium in association with the unique identifier, wherein the additional computer-readable storage medium is separate from the integrated circuit.

18 . The one or more computer-readable storage media of claim 17 , wherein the unique identifier is written to an electronic fuse of the integrated circuit.

19 . The one or more computer-readable storage media of claim 17 , wherein the calibration data is stored in association with a respective digital signature.

20 . The one or more computer-readable storage media of claim 17 , wherein the calibration data is generated during testing of a wafer including the integrated circuit.