Automatic test equipment

1. A coupling line for coupling a signal generator to a device under test, the coupling line comprising:

a first Zener diode;

a second Zener diode, wherein the first Zener diode and the second Zener diode are coupled in an anti-serial manner and are adapted to pass a signal from the signal generator to the device under test when the signal generator is active and to prevent a signal generated in the device under test from propagating to the signal generator when the signal generator is inactive;

a capacitor coupled in parallel with the first and second Zener diodes, wherein a capacitance value of the capacitor is set so as to achieve a predetermined admittance for a predetermined oscillation frequency of a test signal, such that the capacitance value is equal to the predetermined admittance divided by 2 times pi times the predetermined oscillation frequency.

2. The coupling line according to claim 1 further comprising a resistor coupled in parallel with the first and second Zener diodes.

3. The coupling line according to claim 2 , further comprising a resonant circuit for activating the device under test.

4. The electronic device according to claim 2 , wherein the first and second Zener diodes are coupled with their anodes together.

5. The coupling line according to claim 2 , wherein the device under test is an RFID circuit.

6. The coupling line according to claim 1 , further comprising a resonant circuit for activating the device under test.

7. The electronic device according to claim 6 , wherein the first and second Zener diodes are coupled with their anodes together.

8. The coupling line according to claim 6 , wherein the device under test is an RFID circuit.

9. The electronic device according to claim 1 , wherein the first and second Zener diodes are coupled with their anodes together.

10. The coupling line according to claim 1 , wherein the device under test is an RFID circuit.

11. An automatic test equipment for an RFID circuit including a signal generator and a coupling line for coupling the signal generator to a device under test, comprising:

a plurality of coupling lines each having a first end coupled to a same output of the signal generator and each having a second end coupled to a separate device under test, each coupling line comprising:

a first Zener diode;

a second Zener diode, wherein the first Zener diode and the second Zener diode are coupled in an anti-serial manner and are adapted to couple the signal generator to the device under test when the signal generator is active and decouple the signal generator from the device under test when the signal generator is inactive, to prevent a signal generated in the device under test from propagating to the signal generator when the signal generator is inactive.

12. A method of automatic testing, comprising:

using a plurality of coupling lines each comprising a first Zener diode and a second Zener diode;

coupling one of the plurality of coupling lines between a same signal generator output and a separate one of a plurality of devices under test, wherein the first Zener diode and the second Zener diode are coupled in an anti-serial manner; and

coupling the signal generator to the device under test when the signal generator is active and decoupling the signal generator from the device under test when the signal generator is inactive, to prevent a signal generated in the device under test from propagating to the signal generator when the signal generator is inactive.