Semiconductor device and method of testing the same
View Patent ↗An object is to provide a semiconductor device in which it is possible to determine whether or not a minute delay time given by a delay circuit is within a specified value or not, and a method of testing the semiconductor device. In response to a data strobe signal TDQS for testing, the delay circuits DC 0 and DC 1 produce delay data strobe signals IDQS 0 and IDQS 1 delayed by delay times DT 0 and DT 1 . Outputted as a reverse signal from the inverter INV 0 , is a reverse data strobe signal RIDQS 0 in response to the delay data strobe signal IDQS 0 , and delayed by an allowable delay time IT. Inputted into the NAND gate ND 0 , are the reverse data strobe signal RIDQS 0 and the delay data strobe signal IDQS 1 . When, in comparison with the phase of the delay data strobe signal IDQS 0 , the phase of the delay data strobe signal IDQS 1 is delayed by the allowable delay time IT or more, a pulse signal PL 0 is not outputted from the NAND gate ND 0.
1. A semiconductor device comprising:
a delay circuit configured to output an output signal to provide a delay time to an input signal,
a switch circuit configured to connect an output terminal and an input terminal of the delay circuit in response to a functioning test control signal to perform a functioning test, and
a dividing section configured to be connected to the output terminal of the delay circuit in response to the functioning test control signal, and to divide a cycle of the output signal of the delay circuit, wherein,
when the output terminal and the input terminal of the delay circuit are connected, the delay circuit operates as a ring oscillator.
2. The semiconductor device according to claim 1 , wherein:
the delay circuit comprises an even number of delay elements, and
the switch circuit connects the output terminal and the input terminal of the delay circuit via an inverter.
3. A method of testing a semiconductor device which includes a delay circuit configured to output an output signal to provide a delay time to an input signal, and which is subject to a functioning test in response to a functioning test control signal, the method comprising:
connecting an output terminal and an input terminal of the delay circuit in response to the functioning test control signal, so as to make the delay circuit operate as a ring oscillator; and
dividing a cycle of the output signal of the delay circuit which is operating as the ring oscillator.
4. A method of testing a semiconductor device which includes a delay circuit and a control circuit, the method comprising:
outputting a functioning test control signal to perform a functioning test, by the control circuit;
in response to the functioning test control signal, connecting an output terminal and an input terminal of the delay circuit to provide a delay time to an input signal, so as to make the delay circuit operate as a ring oscillator; and
in response to the functioning test control signal, supplying, to a dividing section, an output signal of the delay circuit so as to output a dividing signal obtained by dividing a cycle of the output signal.