ESD protection device with increased holding voltage during normal operation
View Patent ↗An ESD protection circuit including an SCR having at least one PNP transistor and at least one NPN transistor such that at least one of the PNP transistor and the NPN transistor having an additional second collector. The circuit further including at least one control circuit coupled to the at least one second collector to control holding voltage of the SCR.
1. An electrostatic discharge (ESD) protection circuit comprising:
an SCR including at least a PNP transistor and at least a NPN transistor, said PNP transistor is coupled to an anode and the NPN transistor is coupled to a cathode;
said PNP transistor including a PNP first base, a PNP first emitter and a PNP first collector;
said NPN transistor including a NPN first base, a NPN first emitter and a NPN first collector;
said PNP first emitter is coupled to the anode, the first PNP base is coupled to the NPN first collector, the PNP first collector is coupled to the NPN first base and the NPN first emitter is coupled to the cathode;
said at least one of the PNP transistor and the NPN transistor having at least one second collector; and
at least one control circuit coupled between the anode and the cathode, said at least one control circuit coupled to said at least one second collector to control holding voltage of the SCR.
2. The ESD circuit of claim 1 wherein said second collector is formed in a surface area between the PNP first emitter of the PNP transistor and the NPN first emitter of the NPN transistor.
3. The ESD circuit of claim 2 wherein said at least one control circuit comprises at least a first control circuit and a second control circuit, said first control circuit is coupled to the second collector of the PNP and the second control circuit is coupled to the second collector of the NPN.
4. The ESD protection circuit of claim 1 wherein said control circuit comprises at least one of a diode, a resistor, an inverter, a SCR, a MOS, a bipolar transistor and a capacitor.
5. The ESD protection circuit of claim 1 wherein said control circuit comprises a capacitor, a resistor and a MOS.
6. The ESD protection circuit of claim 1 wherein said control circuit comprises a capacitor, a resistor and a MOS, wherein the resistor is coupled between the anode and the gate of the MOS, the capacitor is coupled between the cathode and the gate of the MOS and the MOS is coupled between the second collector and at least one of the anode and the cathode.
7. The ESD circuit of claim 1 wherein said at least one control circuit comprises at least a first control circuit and a second control circuit, said first control circuit is coupled to said second control circuit.
8. The ESD circuit of claim 1
wherein the PNP first base comprises at least a first N-doped region, the PNP first emitter comprise at least a first P-doped region, the PNP first collector comprises at least a first P-doped region such that the first P-doped region of the PNP first emitter is formed in the first N-doped region of the PNP first base;
wherein the NPN first base comprises at least a first P-doped region, the NPN first emitter comprise at least a first N-doped region, the NPN first collector comprises at least a first N-doped region such that the first N-doped region of the NPN first emitter is formed in the first P-doped region of the NPN first base; and
wherein said at least one second collector comprise at least a first doped region.
9. The ESD circuit of claim 8 wherein said first doped region of the at least one second collector is disposed substantially parallel to at least one of said first P-doped region of the PNP first emitter and said first N-doped region of the NPN first emitter.
10. The ESD circuit of claim 8 wherein the at least first doped region of the at least one second collector is interleaved with at least one of the at least one P-doped region of the at least one emitter of the PNP and the at least one N-doped region of the at least one emitter of the NPN.
11. The ESD circuit of claim 8 wherein said second collector comprises at least multiple doped regions, said multiple doped regions are disposed parallel to at least one of the at least one first P-doped region of the PNP first emitter and of the at least one first N-doped region of the NPN first emitter.
12. The ESD circuit of claim 11 wherein a gate is formed between said multiple doped regions of said second collector.
13. The ESD circuit of claim 8 wherein said first doped region of said second collector is disposed surrounding at least one of the at least one first P-doped region of the PNP first emitter and the at least one first N-doped region of the NPN first emitter.
14. The ESD circuit of claim 8 wherein said first doped region of said second collector is disposed surrounding at least one of the at least one first P-doped region of the PNP first base and the at least one first N-doped region of the NPN first base.
15. The ESD circuit of claim 1 further comprising a trigger device coupled to at least one of the PNP first base of the PNP transistor and the NPN first base of the NPN transistor.
16. The ESD protection circuit of claim 15 wherein said trigger circuit comprises at least one of a diode, a resistor, an inverter, a SCR, a MOS, a bipolar transistor, a capacitor and a resistor.
17. The ESD circuit of claim 1 further comprising a first power supply coupled to the control circuit and a diode coupled between the anode and the first power supply.
18. The ESD circuit of claim 1 wherein said control circuit comprises at least one diode coupled between the second collector and at least one of the PNP first base of the PNP transistor and the NPN first base of the NPN transistor.
19. The ESD circuit of claim 1 wherein said anode is coupled to the PNP first emitter and said cathode is coupled to the NPN first emitter and said second collector is coupled to at least one of the first and second voltage potential.
20. The ESD circuit of claim 19 wherein said anode is coupled to the PNP first emitter by at least one of a diode, resistor, MOS, bipolar transistor and a SCR.
21. The ESD circuit of claim 19 wherein said cathode is coupled to the NPN first emitter by at least one of a diode, resistor, MOS, bipolar transistor and a SCR.
22. The ESD circuit of claim 1 wherein said first PNP transistor comprises the second collector and said first NPN transistor further comprises the second collector.
23. The ESD circuit of claim 22 wherein said PNP second collector is coupled directly to the NPN second collector.
24. The ESD circuit of claim 22 wherein said PNP second collector is coupled to the NPN second collector by a control circuit comprising at least one of a diode, a resistor, a bipolar transistor, and a MOS.