Angular position sensing based on magnetically induced beam deformation
View Patent ↗A sensor for sensing an angular position of an instrument relative to a static magnetic field includes a flexible beam, an electromagnetic device, and a measuring device. The beam at one end may be coupled to the instrument, and lies along a sensor axis when the beam is in a non -flexed state. The electromagnetic device is coupled to the beam and is configured for generating a magnetic sensor field aligned with the sensor axis. The measuring device communicates with the beam and is configured for measuring a property of the beam related to an amount of flexure of the beam. The sensor may be utilized to set the instrument at a desired angle prior to operating the instrument, and to determine whether the instrument has deviated from the desired angle during operation. The instrument may include a probe spinning module such as may be utilized in magnetic resonance experiments.
1. A sensor for sensing an angular position of an instrument relative to a static magnetic field, the sensor comprising:
a flexible beam including a proximal end, a distal end, and a length extending from the proximal end to the distal end, wherein the proximal end is configured for coupling to the instrument, and the length lies along a sensor axis when the beam is in a non-flexed state;
an electromagnetic device coupled to the beam and configured for generating a magnetic sensor field aligned with the sensor axis; and
a measuring device communicating with the beam and configured for measuring a property of the beam related to an amount of flexure of the beam.
2. The sensor of claim 1 , wherein the electromagnetic device comprises an electrical conductor wound around the sensor axis.
3. The sensor of claim 1 , wherein the measuring device comprises a strain gauge mounted to the beam.
4. The sensor of claim 1 , wherein the beam includes a piezoelectric material and the measuring device includes two electrical leads respectively connected to opposing sides of the thickness of the beam.
5. A probe spinning instrument comprising:
a probe spinning module; and
a sensor for sensing an angular position of the probe spinning module relative to a static magnetic field, the sensor comprising:
a flexible beam including a proximal end coupled to the probe spinning module, a distal end, and a length extending from the proximal end to the distal end, the length lying along a sensor axis when the beam is in a non-flexed state;
an electromagnetic device coupled to the beam and configured for generating a magnetic sensor field aligned with the sensor axis; and
a measuring device communicating with the beam and configured for measuring a property of the beam related to an amount of flexure of the beam.
6. The probe spinning instrument of claim 5 , wherein the electromagnetic device comprises an electrical conductor wound around the sensor axis.
7. The probe spinning instrument of claim 5 , wherein the measuring device comprises a strain gauge mounted to the beam.
8. The probe spinning instrument of claim 5 , wherein the beam includes a piezoelectric material and the measuring device includes two electrical leads respectively connected to opposing sides of the thickness of the beam.
9. The probe spinning instrument of claim 5 , further comprising a mechanism for adjusting the angular position of the probe spinning module.
10. The probe spinning instrument of claim 5 , further comprising circuitry for processing measurement signals received from the measuring device.
11. The probe spinning instrument of claim 5 , further comprising a device for immersing the probe spinning module and the sensor in the static magnetic field.
12. A method for sensing an angular position of an instrument relative to a static magnetic field in which the instrument is immersed, the method comprising:
generating a magnetic sensor field aligned with a sensor axis of a sensor, the sensor comprising a flexible beam attached to the instrument; and
measuring a degree to which the beam is flexed from a non-flexed state, wherein:
if the sensor field when initially generated is aligned with the static magnetic field, the beam is in a non-flexed state in which the beam lies along the sensor axis; and
if the sensor field when initially generated is unaligned with the static magnetic field, the sensor field is forced to become aligned with the static magnetic field such that the beam is flexed; and
correlating the measurement to the angular position of the instrument.
13. The method of claim 12 , wherein generating the sensor field comprises energizing an electromagnetic device attached to the beam.
14. The method of claim 12 , wherein measuring the degree to which the beam is flexed includes measuring strain induced in the beam in response to flexure of the beam.
15. The method of claim 12 , wherein measuring the degree to which the beam is flexed includes receiving a signal from a strain gauge mounted to the beam.
16. The method of claim 12 , wherein measuring the degree to which the beam is flexed includes measuring stress induced in the beam in response to flexure of the beam.
17. The method of claim 12 , wherein the beam includes a piezoelectric material, and measuring the degree to which the beam is flexed includes receiving a signal from a pair of electrical leads connected to the beam.
18. The method of claim 12 , further comprising adjusting the angular position of the instrument until measuring indicates that the beam is in a non-flexed state.
19. The method of claim 12 , wherein the instrument is a probe spinning module, and further comprising initiating a magnetic resonance experiment by operating the probe spinning module to spin a sample probe loaded therein and generating the static magnetic field.
20. The method of claim 19 further comprising, prior to operating the probe spinning module to spin a sample probe, setting the angular position of the probe spinning module to a desired angle relative to the static field, and adjusting the angular position of the probe spinning module if measuring indicates that the beam is in a non-flexed state.